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Brajković M, Barac M, Bogdanović Radović I, Siketić Z. Dependence of Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Secondary Molecular Ion Yield from Phthalocyanine Blue on Primary Ion Stopping Power. JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY 2020; 31:1518-1524. [PMID: 32453593 DOI: 10.1021/jasms.0c00080] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Time-of-flight secondary ion mass spectrometry (TOF SIMS) is a well-established mass spectrometry technique used for the chemical analysis of both organic and inorganic materials. In the last ten years, many advances have been made to improve the yield of secondary molecular ions, especially those desorbed from the surfaces of organic samples. For this reason, cluster ion beams with kiloelectron volt energies for the excitation were mostly used. Alternatively, single-ion beams with megaelectron volt energies can be applied, as was done in the present work. It is well-known that a secondary molecule/ion yield depends strongly on the primary ion stopping power, but the nature of this dependence is not completely clear. Therefore, in the present work, the secondary ion yield from the phthalocyanine blue (C32H16CuN8, organic pigment) was measured for the various combinations of ion masses, energies, and charge states. Measured values were compared with the existing models for ion sputtering. An increase in the secondary yield with the primary ion energy, electronic stopping, velocity, and charge state was found for different types of primary ions. Although this general behavior is valid for all primary ions, there is no single parameter that can describe the measured results for all primary ions at once.
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Affiliation(s)
- Marko Brajković
- Ruđer Bošković Institute, Bijenička c. 54, HR-10000 Zagreb, Croatia
| | - Marko Barac
- Ruđer Bošković Institute, Bijenička c. 54, HR-10000 Zagreb, Croatia
| | | | - Zdravko Siketić
- Ruđer Bošković Institute, Bijenička c. 54, HR-10000 Zagreb, Croatia
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Jenčič B, Vavpetič P, Kelemen M, Pelicon P. Secondary Ion Yield and Fragmentation of Biological Molecules by Employing 35Cl Primary Ions within the MeV Energy Domain. JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY 2020; 31:117-123. [PMID: 32881522 DOI: 10.1021/jasms.9b00019] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
MeV-SIMS is an emerging mass spectrometry imaging method that employs fast, heavy ions to desorb secondary molecules from the analyzed sample. High yields and low fragmentation rates of large molecules, associated with the dominating electronic sputtering process, make it particularly useful in biomedical research, where insight into the distribution of organic molecules is vital. Both yield and fragmentation of desorbed molecules in MeV-SIMS rely on characteristics of the primary ion but may also be impaired by poor instrumental settings. After utilizing secondary ion optics in the linear mass spectrometer at the micro-analytical center of the Jožef Stefan Institute, we demonstrate very efficient detection of secondary ions. As a result, the secondary ion yield, using such settings, solely depends on the species and the characteristics of the primary ion. In order to analyze the yield dependence on the primary ion energy, and the corresponding stopping power within the electronic excitation regime, we used a continuous electron multiplier detector to measure the primary ion current during each measurement of the mass spectra. Secondary ion yield as a function of the primary ion energy and charge is presented as well as fragmentation rates of organic molecules arginine and leu-enkephalin. Other influential instrumental drawbacks are also studied, and their effect on the results is discussed.
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Affiliation(s)
- Boštjan Jenčič
- Jožef Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia
| | - Primož Vavpetič
- Jožef Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia
| | - Mitja Kelemen
- Jožef Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia
| | - Primož Pelicon
- Jožef Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia
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Papaléo RM, Demirev P, Eriksson J, Håkansson P, Sundqvist BU. Low-mass secondary-ion ejection from molecular solids by MeV heavy ions: Radial velocity distributions. PHYSICAL REVIEW. B, CONDENSED MATTER 1996; 54:3173-3183. [PMID: 9986217 DOI: 10.1103/physrevb.54.3173] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Dutkiewicz L, Pedrys R, Schou J, Kremer K. Transition from linear to nonlinear sputtering of solid xenon. PHYSICAL REVIEW LETTERS 1995; 75:1407-1410. [PMID: 10060285 DOI: 10.1103/physrevlett.75.1407] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Matsuo T, Tonuma T, Kumagai H, Shibata H, Tawara H. Secondary ions produced from gaseous and frozen H2O under energetic (MeV/amu) Ar ion impact. J Chem Phys 1994. [DOI: 10.1063/1.467388] [Citation(s) in RCA: 19] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
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Urbassek HM, Kafemann H, Johnson RE. Atom ejection from a fast-ion track: A molecular-dynamics study. PHYSICAL REVIEW. B, CONDENSED MATTER 1994; 49:786-795. [PMID: 10010379 DOI: 10.1103/physrevb.49.786] [Citation(s) in RCA: 35] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Weaver RV, Zeiri Y, Uzer T. Competition between adsorbate fragmentation and desorption on laser‐heated surfaces. J Chem Phys 1993. [DOI: 10.1063/1.464960] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
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Fenyö D, Johnson RE. Computer experiments on molecular ejection from an amorphous solid: Comparison to an analytic continuum mechanical model. PHYSICAL REVIEW. B, CONDENSED MATTER 1992; 46:5090-5099. [PMID: 10004283 DOI: 10.1103/physrevb.46.5090] [Citation(s) in RCA: 41] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Jeronymo JM, Pinho RR, Baptista GB, Schweikert EA, Park MA. Secondary-ion emission from phenylalanine induced by atomic and molecular MeV ion beams. PHYSICAL REVIEW. B, CONDENSED MATTER 1992; 45:12218-12221. [PMID: 10001256 DOI: 10.1103/physrevb.45.12218] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Demirev P, Brinkmalm G, Fenyö D, H»kansson P, Sundqvist B. Radial velocities of ejected ions: implications for the mechanisms of molecular ion formation in plasma desorption mass spectrometry of biomolecules. ACTA ACUST UNITED AC 1991. [DOI: 10.1016/0168-1176(91)85047-p] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
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Kinsel GR, Lindner J, Grotemeyer J. Matrix-assisted laser desorption of neutral organic molecules. ACTA ACUST UNITED AC 1991. [DOI: 10.1002/oms.1210261204] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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Johnson RE, Pospieszalska M, Brown WL. Linear-to-quadratic transition in electronically stimulated sputtering of solid N2 and O2. PHYSICAL REVIEW. B, CONDENSED MATTER 1991; 44:7263-7272. [PMID: 9998636 DOI: 10.1103/physrevb.44.7263] [Citation(s) in RCA: 29] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Urbassek HM, Waldeer KT. Spikes in condensed rare gases induced by keV-atom bombardment. PHYSICAL REVIEW LETTERS 1991; 67:105-108. [PMID: 10044063 DOI: 10.1103/physrevlett.67.105] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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Banerjee S, Johnson RE, Cui S, Cummings PT. Molecular-dynamics simulation of prompt sputtering of a molecular solid at high excitation densities. PHYSICAL REVIEW. B, CONDENSED MATTER 1991; 43:12707-12714. [PMID: 9997083 DOI: 10.1103/physrevb.43.12707] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Chan TWD, Colburn AW, Derrick PJ. Matrix-assisted UV laser desorption. Suppression of the matrix peaks. ACTA ACUST UNITED AC 1991. [DOI: 10.1002/oms.1210260428] [Citation(s) in RCA: 35] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
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Brandl D, Schoppmann C, Schmidt R, Nees B, Ostrowski A, Voit H. Dependence of the heavy-ion-induced desorption yield on the primary-ion energy loss. PHYSICAL REVIEW. B, CONDENSED MATTER 1991; 43:5253-5260. [PMID: 9997917 DOI: 10.1103/physrevb.43.5253] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Radial velocity distributions of secondary ions ejected in electronic sputtering of organic solids. ACTA ACUST UNITED AC 1990. [DOI: 10.1016/0168-1176(90)85068-d] [Citation(s) in RCA: 24] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/22/2022]
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Fenyö D, Sundqvist BU, Karlsson BR, Johnson RE. Molecular-dynamics study of electronic sputtering of large organic molecules. PHYSICAL REVIEW. B, CONDENSED MATTER 1990; 42:1895-1902. [PMID: 9995630 DOI: 10.1103/physrevb.42.1895] [Citation(s) in RCA: 45] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Van Vaeck L, Bennett J, van Espen P, Schweikert E, Gijbels R, Adams F, Lauwers W. Structural characterization of organic molecules by negative ions in laser microprobe mass spectrometry. Part 2—Salts. ACTA ACUST UNITED AC 1989. [DOI: 10.1002/oms.1210240913] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
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Johnson RE, Sundqvist BU, Hedin A, Fenyö D. Sputtering by fast ions based on a sum of impulses. PHYSICAL REVIEW. B, CONDENSED MATTER 1989; 40:49-53. [PMID: 9990881 DOI: 10.1103/physrevb.40.49] [Citation(s) in RCA: 115] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Desorption of secondary negative ions induced by impact of heavy ions near the bohr velocity. ACTA ACUST UNITED AC 1989. [DOI: 10.1016/0168-1176(89)85017-7] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
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Ens W, Sundqvist BU, Hkansson P, Hedin A, Jonsson G. Directional correlation between the primary particle and ejected molecular ions in electronic sputtering of large organic molecules. PHYSICAL REVIEW. B, CONDENSED MATTER 1989; 39:763-766. [PMID: 9947226 DOI: 10.1103/physrevb.39.763] [Citation(s) in RCA: 41] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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Gibbs KM, Brown WL, Johnson RE. Electronic sputtering of condensed O2. PHYSICAL REVIEW. B, CONDENSED MATTER 1988; 38:11001-11007. [PMID: 9945973 DOI: 10.1103/physrevb.38.11001] [Citation(s) in RCA: 27] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/11/2023]
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Torrisi L, Coffa S, Foti G, Johnson RE, Chrisey DB, Boring JW. Threshold dependence in the electronic sputtering of condensed sulfur. PHYSICAL REVIEW. B, CONDENSED MATTER 1988; 38:1516-1519. [PMID: 9946416 DOI: 10.1103/physrevb.38.1516] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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