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For: Elgat Z, Carter C. Analysis of grain boundaries by HREM. Ultramicroscopy 1985. [DOI: 10.1016/0304-3991(85)90149-4] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Number Cited by Other Article(s)
1
FUNKE C, BEHM T, HELBIG R, SCHMID E, WÜRZNER S. Novel combination of orientation measurements and transmission microscopy for experimental determination of grain boundary miller indices in silicon and other semiconductors. J Microsc 2012;246:70-6. [DOI: 10.1111/j.1365-2818.2011.03588.x] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
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