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For: Eades J. Microdiffraction's contribution to microcharacterization. Ultramicroscopy 1988. [DOI: 10.1016/0304-3991(88)90307-5] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
Number Cited by Other Article(s)
1
Steeds J. Convergent beam electron diffraction. ADVANCES IN IMAGING AND ELECTRON PHYSICS 2002. [DOI: 10.1016/s1076-5670(02)80061-1] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/24/2023]
2
Xu P, Loane RF, Silcox J. Energy-filtered convergent-beam electron diffraction in STEM. Ultramicroscopy 1991. [DOI: 10.1016/0304-3991(91)90113-k] [Citation(s) in RCA: 38] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
3
Sung CM, Williams DB. Principle and applications of convergent beam electron diffraction: a bibliography (1938-1990). JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE 1991;17:95-118. [PMID: 1993941 DOI: 10.1002/jemt.1060170110] [Citation(s) in RCA: 12] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/29/2022]
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