Lattice imaging of poly-4-methyl-pentene-1 single crystals; use and misuse of fourier averaging techniques

Atomic-Resolution Imaging of Small Organic Molecules on Graphene

Here, we demonstrate atomic-resolution scanning transmission electron microscopy (STEM) imaging of light elements in small organic molecules on graphene. We use low-dose, room-temperature, aberration-corrected STEM to image 2D monolayer and bilayer molecular crystals, followed by advanced image processing methods to create high-quality composite images from ∼10²-10⁴ individual molecules. In metalated porphyrin and phthalocyanine derivatives, these images contain an elementally sensitive contrast with up to 1.3 Å resolution─sufficient to distinguish individual carbon and nitrogen atoms. Importantly, our methods can be applied to molecules with low masses (∼0.6 kDa) and nanocrystalline domains containing just a few hundred molecules, making it possible to study systems for which large crystals cannot easily be grown. Our approach is enabled by low-background graphene substrates, which we show increase the molecules' critical dose by 2-7×. These results indicate a new route for low-dose, atomic-resolution electron microscopy imaging to solve the structures of small organic molecules.

Study of structures at the boundary and defects in organic thin films of perchlorocoronene by high-resolution and analytical transmission electron microscopy

Both the periodic and non-periodic structures of perchlorocoronene (C(24)Cl(12)) crystals were characterized by high-resolution transmission electron microscopy (HRTEM), electron diffraction (ED), electron energy-loss spectroscopy (EELS), and energy-filtered transmission electron microscopy (EFTEM). The HRTEM images at the boundary of the C(24)Cl(12) crystals exhibit the flexibility of defect structures, where molecules align to compensate for the discontinuity between two different domains. Emphasized by the filtered images, it was found that the non-periodic regions are created everywhere with a small electron beam irradiation (∼ 10(6)electrons nm(-2)) and then spread over the entire regions to completely destroy the periodic structures after a higher electron dose (∼ 2 × 10(6)electrons nm(-2)). The effect of the electron beam irradiation was monitored by ED, EELS, and EFTEM, where periodic structures and content elements are well preserved up to 10(6)electrons nm(-2), but chlorine atoms decreased with a much higher electron dose. This is explained by the breakage of the C-Cl bond to detach chlorine atoms, confirmed by energy-loss near the edge structures (ELNES) of carbon π * peaks and chlorine loss at the edge of the specimen, as well as by theoretical simulation. The detachment of chlorine is localized at the peripheral edge around a hole confirmed by core-loss EFTEM imaging.

Single Crystals of V-Amylose Complexed with α-Naphthol

Lamellar square single crystals of V-amylose were obtained by adding alpha-naphthol to metastable dilute aqueous solutions of synthetic amylose chains with an average degree of polymerization of 100. The morphology and structure of the crystals were studied using low-dose transmission electron microscopy including high-resolution imaging, as well as electron and X-ray diffraction. The crystals are crystallized in a tetragonal P4(1)2(1)2 or P4(3)2(1)2 space group with unit cell parameters, calculated from X-ray diffraction data, a = b = 2.2844 nm (+/-0.0005) and c = 0.7806 nm (+/-0.001), implying the presence of two amylose chains per unit cell. High-resolution lattice images of the crystals confirmed that the amylose chains were crystallized as 8-fold helices corresponding to the repeat of four maltosyl units.

Measurements of electron beam damage for organic crystals in a high voltage electron microscope with image plates

The critical dose for extinction of the diffraction pattern from behenic acid monolayer crystals increased with increasing accelerating voltages. The mean values at 114, 500 and 1000kV were 0.6, 1.8 and 2.2 electrons/A(2), respectively. The critical dose at 500-1000kV is three or more times as large as that at 114kV. Considering this with the recent measured value of the detective quantum efficiency of the image plate, 0.5 at 500kV and 0.4 at 1000kV, 1.5 times as much information can be collected from a crystal at 500-1000kV as at 114kV. Therefore, the combined use of high voltage electron microscopy and image plate detectors offers a significant improvement over conventional electron microscopy approaches for the study of radiation sensitive organic molecule crystals.