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Citation(s) in
RCA
11
(from Reference Citation Analysis)
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For:
Glaisher R
, Spargo A, Smith DJ.
A systematic analysis of HREM imaging of sphalerite semiconductors.
Ultramicroscopy
1989;
27
:131-50. [DOI:
10.1016/0304-3991(89)90082-x
]
[
Citation(s) in
RCA
: 35
]
[
Impact Index Per Article: 1.0
]
[
Reference Citation Analysis
]
[
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[Indexed: 11/20/2022]
Number
Cited by Other Article(s)
1
Smith DJ
, Aoki T, Mardinly J, Zhou L, McCartney MR. Exploring aberration-corrected electron microscopy for compound semiconductors.
Microscopy (Oxf)
2013;
62 Suppl 1
:S65-73. [DOI:
10.1093/jmicro/dft011
]
[
Citation(s) in
RCA
: 12
]
[
Impact Index Per Article: 1.1
]
[
Reference Citation Analysis
]
[
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]
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[Indexed: 11/14/2022]
Open
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2
Mader W
, Rečnik A. Determination of Crystal Polarity by Electron Diffraction from Thin Crystals.
ACTA ACUST UNITED AC
1998. [DOI:
10.1002/(sici)1521-396x(199803)166:1<381::aid-pssa381>3.0.co;2-r
]
[
Citation(s) in
RCA
: 30
]
[
Impact Index Per Article: 1.2
]
[
Reference Citation Analysis
]
[
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[Indexed: 11/09/2022]
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3
Maurice JL
, Schwander P, Baumann F, Ourmazd A. Real-space analysis of lattice images and its link to conventional theory.
Ultramicroscopy
1997. [DOI:
10.1016/s0304-3991(97)00014-4
]
[
Citation(s) in
RCA
: 16
]
[
Impact Index Per Article: 0.6
]
[
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[Indexed: 11/28/2022]
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4
Kisielowski C
, Schwander P, Baumann F, Seibt M, Kim Y, Ourmazd A. An approach to quantitative high-resolution transmission electron microscopy of crystalline materials.
Ultramicroscopy
1995. [DOI:
10.1016/0304-3991(94)00202-x
]
[
Citation(s) in
RCA
: 68
]
[
Impact Index Per Article: 2.3
]
[
Reference Citation Analysis
]
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[Indexed: 10/17/2022]
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5
Thoma S
, Cerva H. Comparison of the information content in 〈110〉 - and 〈100〉 -projected high-resolution transmission electron microscope images for the quantitative analysis of AlAs/GaAs interfaces.
Ultramicroscopy
1994. [DOI:
10.1016/0304-3991(94)90103-1
]
[
Citation(s) in
RCA
: 6
]
[
Impact Index Per Article: 0.2
]
[
Reference Citation Analysis
]
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[Indexed: 10/27/2022]
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6
Muto S
, Takeda S, Hirata M, Fujii K, Ibe K. Structure of planar aggregates of si in heavily si-doped gaas.
ACTA ACUST UNITED AC
1992. [DOI:
10.1080/01418619208201555
]
[
Citation(s) in
RCA
: 15
]
[
Impact Index Per Article: 0.5
]
[
Reference Citation Analysis
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[Indexed: 10/23/2022]
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7
Rez P
. Chemical lattice imaging: a pedantic note.
Ultramicroscopy
1992. [DOI:
10.1016/0304-3991(92)90101-o
]
[
Citation(s) in
RCA
: 6
]
[
Impact Index Per Article: 0.2
]
[
Reference Citation Analysis
]
[
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]
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[Indexed: 11/26/2022]
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8
Glaisher R
, Spargo A, Self P. Tuned voltage in zone-axis diffraction.
Ultramicroscopy
1990. [DOI:
10.1016/0304-3991(90)90075-w
]
[
Citation(s) in
RCA
: 4
]
[
Impact Index Per Article: 0.1
]
[
Reference Citation Analysis
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[Indexed: 11/29/2022]
Abstract
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9
Glaisher R
, Spargo A, Smith DJ. A systematic analysis of HREM imaging of Wurtzite semiconductors.
Ultramicroscopy
1989. [DOI:
10.1016/0304-3991(89)90081-8
]
[
Citation(s) in
RCA
: 19
]
[
Impact Index Per Article: 0.5
]
[
Reference Citation Analysis
]
[
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[Indexed: 11/28/2022]
Abstract
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10
Glaisher R
, Spargo A, Smith DJ. A theoretical analysis of HREM imaging for 〈110〉 tetrahedral semiconductors.
Ultramicroscopy
1989. [DOI:
10.1016/0304-3991(89)90198-8
]
[
Citation(s) in
RCA
: 33
]
[
Impact Index Per Article: 0.9
]
[
Reference Citation Analysis
]
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[Indexed: 11/15/2022]
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11
Glaisher RW
, Spargo A, Smith DJ. A systematic analysis of HREM imaging of elemental semiconductors.
Ultramicroscopy
1989. [DOI:
10.1016/0304-3991(89)90199-x
]
[
Citation(s) in
RCA
: 23
]
[
Impact Index Per Article: 0.7
]
[
Reference Citation Analysis
]
[
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]
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[Indexed: 11/16/2022]
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