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For: Hohenstein M. Reconstruction of the exit surface wave function from experimental HRTEM micrographs. Ultramicroscopy 1991. [DOI: 10.1016/0304-3991(91)90096-o] [Citation(s) in RCA: 19] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Number Cited by Other Article(s)
1
SAXTON WO. Accurate alignment of sets of images. J Microsc 2011. [DOI: 10.1111/j.1365-2818.1994.tb03449.x] [Citation(s) in RCA: 26] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
2
Yamasaki J, Kawai T, Kondo Y, Tanaka N. A practical solution for eliminating artificial image contrast in aberration-corrected TEM. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2008;14:27-35. [PMID: 18173866 DOI: 10.1017/s1431927608080173] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/17/2007] [Accepted: 08/07/2007] [Indexed: 05/25/2023]
3
DeRosier DJ. Correction of high-resolution data for curvature of the Ewald sphere. Ultramicroscopy 2000;81:83-98. [PMID: 10998793 DOI: 10.1016/s0304-3991(99)00120-5] [Citation(s) in RCA: 76] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
4
He W, Li F, Chen H, Kawasaki K, Oikawa T. Image deconvolution for defected crystals in field-emission high-resolution electron microscopy. Ultramicroscopy 1997. [DOI: 10.1016/s0304-3991(97)00084-3] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/16/2022]
5
Wave function reconstruction in HRTEM: the parabola method. Ultramicroscopy 1996. [DOI: 10.1016/0304-3991(96)00058-7] [Citation(s) in RCA: 115] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]
6
Super-resolution by aperture synthesis: tilt series reconstruction in CTEM. Ultramicroscopy 1995. [DOI: 10.1016/0304-3991(94)00191-o] [Citation(s) in RCA: 101] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
7
Bierwolf R, Hohenstein M. Premise-free reconstruction of the exit-surface wave function in HRTEM. Ultramicroscopy 1994. [DOI: 10.1016/0304-3991(94)90144-9] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/25/2022]
8
Saxton W. What is the focus variation method? Is it new? Is it direct? Ultramicroscopy 1994. [DOI: 10.1016/0304-3991(94)90168-6] [Citation(s) in RCA: 73] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
9
Ishizuka K. Resolution improvement by titled single-sideband holography: preliminary experiments. Ultramicroscopy 1994. [DOI: 10.1016/0304-3991(94)90099-x] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
10
Experimental tests on double-resolution coherent imaging via STEM. Ultramicroscopy 1993. [DOI: 10.1016/0304-3991(93)90105-7] [Citation(s) in RCA: 95] [Impact Index Per Article: 3.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/23/2022]
11
Direct measurement of local lattice distortions in strained layer structures by HREM. Ultramicroscopy 1993. [DOI: 10.1016/0304-3991(93)90234-o] [Citation(s) in RCA: 175] [Impact Index Per Article: 5.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/19/2022]
12
Hohenstein M. Single sideband imaging in high-resolution electron microscopy. ACTA ACUST UNITED AC 1992. [DOI: 10.1007/bf00324325] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
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