Aberration correction using off-axis holography II. beyond the scherzer limit

Restoration of singularities in reconstructed phase of crystal image in electron holography

Off-axis electron holography can be used to measure the inner potential of a specimen from its reconstructed phase image and is thus a powerful technique for materials scientists. However, abrupt reversals of contrast from white to black may sometimes occur in a digitally reconstructed phase image, which results in inaccurate information. Such phase distortion is mainly due to the digital reconstruction process and weak electron wave amplitude in some areas of the specimen. Therefore, digital image processing can be applied to the reconstruction and restoration of phase images. In this paper, fringe reconnection processing is applied to phase image restoration of a crystal structure image. The disconnection and wrong connection of interference fringes in the hologram that directly cause a 2π phase jump imperfection are correctly reconnected. Experimental results show that the phase distortion is significantly reduced after the processing. The quality of the reconstructed phase image was improved by the removal of imperfections in the final phase.

An introduction to off-axis electron holography

The technique of off-axis electron holography is introduced and reviewed. The history of the topic is discussed briefly looking at the origin of electron holography and the reasons for its growth in recent years around the world. The formation and numerical reconstruction of the hologram is discussed in detail on a theoretical and practical level. The spread of holography is illustrated through a number of applications ranging from ultra high resolution studies of crystal structures, the imaging of magnetic and electric fields, the determination of sample composition and morphology and the use of holography for imaging biological specimens.