Adam PM, Royer P, Laddada R, Bijeon JL. Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast.
APPLIED OPTICS 1998;
37:1814-1819. [PMID:
18273093 DOI:
10.1364/ao.37.001814]
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Abstract
We report a hybrid microscope composed of an apertureless scanning near-field optical microscope and a commercial atomic force microscope. We discuss the optical origin of the near-field images of a test sample. We show that the optical images have a sharp contrast that depends on the illumination parameters: the state of polarization and the angle of incidence of the incident light.
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