Chromatic Aberration Correction

Third-rank chromatic aberrations of electron lenses

In this paper the third-rank chromatic aberration coefficients of round electron lenses are analytically derived and numerically calculated by Mathematica. Furthermore, the numerical results are cross-checked by the differential algebraic (DA) method, which verifies that all the formulas for the third-rank chromatic aberration coefficients are completely correct. It is hoped that this work would be helpful for further chromatic aberration correction in electron microscopy.

Chromatic aberration-corrected tilt series transmission electron microscopy of nanoparticles in a whole mount macrophage cell

Transmission electron microscopy (TEM) in combination with electron tomography is widely used to obtain nanometer scale three-dimensional (3D) structural information about biological samples. However, studies of whole eukaryotic cells are limited in resolution and/or contrast on account of the effect of chromatic aberration of the TEM objective lens on electrons that have been scattered inelastically in the specimen. As a result, 3D information is usually obtained from sections and not from whole cells. Here, we use chromatic aberration-corrected TEM to record bright-field TEM images of nanoparticles in a whole mount macrophage cell. Tilt series of images are used to generate electron tomograms, which are analyzed to assess the spatial resolution that can be achieved for different vertical positions in the specimen. The uptake of gold nanoparticles coated with low-density lipoprotein (LDL) is studied. The LDL is found to assemble in clusters. The clusters contain nanoparticles taken up on different days, which are joined without mixing their nanoparticle cargo.

Image resolution and sensitivity in an environmental transmission electron microscope

An environmental transmission electron microscope provides unique means for the atomic-scale exploration of nanomaterials during the exposure to a reactive gas environment. Here we examine conditions to obtain such in situ observations in the high-resolution transmission electron microscopy (HRTEM) mode with an image resolution of 0.10nm. This HRTEM image resolution threshold is mapped out under different gas conditions, including gas types and pressures, and under different electron optical settings, including electron beam energies, doses and dose-rates. The 0.10nm resolution is retainable for H(2) at 1-10mbar. Even for N(2), the 0.10nm resolution threshold is reached up to at least 10mbar. The optimal imaging conditions are determined by the electron beam energy and the dose-rate as well as an image signal-to-noise (S/N) ratio that is consistent with Rose's criterion of S/N≥5. A discussion on the electron-gas interactions responsible for gas-induced resolution deterioration is given based on interplay with complementary electron diffraction (ED), scanning transmission electron microscopy (STEM) as well as electron energy loss spectroscopy (EELS) data.