Onel M, Burnak B, Pistikopoulos EN. Integrated Data-Driven Process Monitoring and Explicit Fault-Tolerant Multiparametric Control.
Ind Eng Chem Res 2020;
59:2291-2306. [PMID:
32549652 DOI:
10.1021/acs.iecr.9b04226]
[Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
Abstract
We propose a novel active fault-tolerant control strategy that combines machine learning based process monitoring and explicit/multiparametric model predictive control (mp-MPC). The strategy features (i) data-driven fault detection and diagnosis models by using the support vector machine (SVM) algorithm, (ii) ranking via a nonlinear, kernel-dependent, SVM-based feature selection algorithm, (iii) data-driven regression models for fault magnitude estimation via the random forest algorithm, and (iv) a parametric optimization and control (PAROC) framework for the design of the explicit/multiparametric model predictive controller. The resulting explicit control strategies correspond to affine functions of the system states and the magnitude of the detected fault. A semibatch process, an example for penicillin production, is presented to demonstrate how the proposed framework ensures smart operation for which rapid switches between a priori computed explicit control action strategies are enabled by continuous process monitoring information.
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