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Lim B, Lee YM, Yoo CS, Kim M, Kim SJ, Kim S, Yang JJ, Lee HS. High-Reliability and Self-Rectifying Alkali Ion Memristor through Bottom Electrode Design and Dopant Incorporation. ACS NANO 2024; 18:6373-6386. [PMID: 38349619 PMCID: PMC10906085 DOI: 10.1021/acsnano.3c11325] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/14/2023] [Revised: 02/06/2024] [Accepted: 02/08/2024] [Indexed: 02/28/2024]
Abstract
Ionic memristor devices are crucial for efficient artificial neural network computations in neuromorphic hardware. They excel in multi-bit implementation but face challenges like device reliability and sneak currents in crossbar array architecture (CAA). Interface-type ionic memristors offer low variation, self-rectification, and no forming process, making them suitable for CAA. However, they suffer from slow weight updates and poor retention and endurance. To address these issues, the study demonstrated an alkali ion self-rectifying memristor with an alkali metal reservoir formed by a bottom electrode design. By adopting Li metal as the adhesion layer of the bottom electrode, an alkali ion reservoir was formed at the bottom of the memristor layer by diffusion occurring during the atomic layer deposition process for the Na:TiO2 memristor layer. In addition, Al dopant was used to improve the retention characteristics by suppressing the diffusion of alkali cations. In the memristor device with optimized Al doping, retention characteristics of more than 20 h at 125 °C, endurance characteristics of more than 5.5 × 105, and high linearity/symmetry of weight update characteristics were achieved. In reliability tests on 100 randomly selected devices from a 32 × 32 CAA device, device-to-device and cycle-to-cycle variations showed low variation values within 81% and 8%, respectively.
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Affiliation(s)
- Byeong
Min Lim
- Department
of Advanced Materials Engineering for Information and Electronics, Kyung Hee University, Yongin 17104, Republic of Korea
- Integrated
Education Institute for Frontier Science & Technology (BK21 Four), Kyung Hee University, Yongin 17104, Republic of Korea
| | - Yu Min Lee
- Department
of Advanced Materials Engineering for Information and Electronics, Kyung Hee University, Yongin 17104, Republic of Korea
- Integrated
Education Institute for Frontier Science & Technology (BK21 Four), Kyung Hee University, Yongin 17104, Republic of Korea
| | - Chan Sik Yoo
- Department
of Advanced Materials Engineering for Information and Electronics, Kyung Hee University, Yongin 17104, Republic of Korea
- Integrated
Education Institute for Frontier Science & Technology (BK21 Four), Kyung Hee University, Yongin 17104, Republic of Korea
| | - Minjae Kim
- Department
of Electrical and Computer Engineering, University of Southern California, Los Angeles, California 90089, United States
| | - Seung Ju Kim
- Department
of Electrical and Computer Engineering, University of Southern California, Los Angeles, California 90089, United States
| | - Sungkyu Kim
- HMC,
Department of Nanotechnology and Advanced Materials Engineering, Sejong University, Seoul 05006, Republic of Korea
| | - J. Joshua Yang
- Department
of Electrical and Computer Engineering, University of Southern California, Los Angeles, California 90089, United States
| | - Hong-Sub Lee
- Department
of Advanced Materials Engineering for Information and Electronics, Kyung Hee University, Yongin 17104, Republic of Korea
- Integrated
Education Institute for Frontier Science & Technology (BK21 Four), Kyung Hee University, Yongin 17104, Republic of Korea
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2
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Yuwono JA, Burr P, Galvin C, Lennon A. Atomistic Insights into Lithium Storage Mechanisms in Anatase, Rutile, and Amorphous TiO 2 Electrodes. ACS APPLIED MATERIALS & INTERFACES 2021; 13:1791-1806. [PMID: 33393758 DOI: 10.1021/acsami.0c17097] [Citation(s) in RCA: 11] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Density functional theory calculations were used to investigate the phase transformations of LixTiO2 (at 0 ≤ x ≤ 1), solid-state Li+ diffusion, and interfacial charge-transfer reactions in both crystalline and amorphous forms of TiO2. It is shown that in contrast to crystalline TiO2 polymorphs, the energy barrier to Li+ diffusion in amorphous TiO2 decreases with increasing mole fraction of Li+ due to the changes of chemical species pair interactions following the progressive filling of low-energy Li+ trapping sites. Sites with longer Li-Ti and Li-O interactions exhibit lower Li+ insertion energies and higher migration energy barriers. Due to its disordered atomic arrangement and increasing Li+ diffusivity at higher mole fractions, amorphous TiO2 exhibits both surface and bulk storage mechanisms. The results suggest that nanostructuring of crystalline TiO2 can increase both the rate and capacity because the capacity dependence on the bulk storage mechanism is minimized and replaced with the surface storage mechanism. These insights into Li+ storage mechanisms in different forms of TiO2 can guide the fabrication of TiO2 electrodes to maximize the capacity and rate performance in the future.
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Affiliation(s)
- Jodie A Yuwono
- School of Photovoltaic and Renewable Energy Engineering, UNSW Sydney, Kensington, Sydney, New South Wales 2052, Australia
| | - Patrick Burr
- School of Mechanical and Manufacturing Engineering, UNSW Sydney, Kensington, Sydney, New South Wales 2052, Australia
| | - Conor Galvin
- School of Mechanical and Manufacturing Engineering, UNSW Sydney, Kensington, Sydney, New South Wales 2052, Australia
| | - Alison Lennon
- School of Photovoltaic and Renewable Energy Engineering, UNSW Sydney, Kensington, Sydney, New South Wales 2052, Australia
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5
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Chatzichristos A, McFadden RML, Dehn MH, Dunsiger SR, Fujimoto D, Karner VL, McKenzie I, Morris GD, Pearson MR, Stachura M, Sugiyama J, Ticknor JO, MacFarlane WA, Kiefl RF. Bi-Arrhenius Diffusion and Surface Trapping of ^{8}Li^{+} in Rutile TiO_{2}. PHYSICAL REVIEW LETTERS 2019; 123:095901. [PMID: 31524467 DOI: 10.1103/physrevlett.123.095901] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/04/2019] [Indexed: 06/10/2023]
Abstract
We report measurements of the diffusion rate of isolated ion-implanted ^{8}Li^{+} within ∼120 nm of the surface of oriented single-crystal rutile TiO_{2} using a radiotracer technique. The α particles from the ^{8}Li decay provide a sensitive monitor of the distance from the surface and how the depth profile of ^{8}Li evolves with time. The main findings are that the implanted Li^{+} diffuses and traps at the (001) surface. The T dependence of the diffusivity is described by a bi-Arrhenius expression with activation energies of 0.3341(21) eV above 200 K, whereas at lower temperatures it has a much smaller barrier of 0.0313(15) eV. We consider possible origins for the surface trapping, as well the nature of the low-T barrier.
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Affiliation(s)
- A Chatzichristos
- Department of Physics and Astronomy, University of British Columbia, Vancouver, BC V6T 1Z1, Canada
- Stewart Blusson Quantum Matter Institute, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
| | - R M L McFadden
- Stewart Blusson Quantum Matter Institute, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
- Department of Chemistry, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
| | - M H Dehn
- Department of Physics and Astronomy, University of British Columbia, Vancouver, BC V6T 1Z1, Canada
- Stewart Blusson Quantum Matter Institute, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
| | - S R Dunsiger
- Department of Physics, Simon Fraser University, Burnaby, BC V5A 1S6, Canada
| | - D Fujimoto
- Department of Physics and Astronomy, University of British Columbia, Vancouver, BC V6T 1Z1, Canada
- Stewart Blusson Quantum Matter Institute, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
| | - V L Karner
- Stewart Blusson Quantum Matter Institute, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
- Department of Chemistry, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
| | - I McKenzie
- TRIUMF, 4004 Wesbrook Mall, Vancouver, BC V6T 2A3, Canada
- Department of Chemistry, Simon Fraser University, Burnaby, BC V5A 1S6, Canada
| | - G D Morris
- TRIUMF, 4004 Wesbrook Mall, Vancouver, BC V6T 2A3, Canada
| | - M R Pearson
- TRIUMF, 4004 Wesbrook Mall, Vancouver, BC V6T 2A3, Canada
| | - M Stachura
- TRIUMF, 4004 Wesbrook Mall, Vancouver, BC V6T 2A3, Canada
| | - J Sugiyama
- Toyota Central Research and Development Laboratories, Inc., Nagakute, Aichi 480-1192, Japan
- Advanced Science Research Center, Japan Atomic Energy Agency, Tokai, Ibaraki 319-1195, Japan
- CROSS Neutron Science and Technology Center, 162-1 Shirakata, Tokai, Naka, Ibaraki 319-1106, Japan
| | - J O Ticknor
- Stewart Blusson Quantum Matter Institute, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
- Department of Chemistry, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
| | - W A MacFarlane
- Stewart Blusson Quantum Matter Institute, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
- Department of Chemistry, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
- TRIUMF, 4004 Wesbrook Mall, Vancouver, BC V6T 2A3, Canada
| | - R F Kiefl
- Department of Physics and Astronomy, University of British Columbia, Vancouver, BC V6T 1Z1, Canada
- Stewart Blusson Quantum Matter Institute, University of British Columbia, Vancouver, BC V6T 1Z4, Canada
- TRIUMF, 4004 Wesbrook Mall, Vancouver, BC V6T 2A3, Canada
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6
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Zhang Y, Malyi OI, Tang Y, Wei J, Zhu Z, Xia H, Li W, Guo J, Zhou X, Chen Z, Persson C, Chen X. Reducing the Charge Carrier Transport Barrier in Functionally Layer-Graded Electrodes. Angew Chem Int Ed Engl 2017. [DOI: 10.1002/ange.201707883] [Citation(s) in RCA: 16] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/11/2023]
Affiliation(s)
- Yanyan Zhang
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Oleksandr I. Malyi
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Yuxin Tang
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Jiaqi Wei
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Zhiqiang Zhu
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Huarong Xia
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Wenlong Li
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Jia Guo
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Xinran Zhou
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Zhong Chen
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Clas Persson
- Centre for Materials Science and Nanotechnology; Department of Physics; University of Oslo; P.O. Box 1048 Blindern NO-0316 Oslo Norway
| | - Xiaodong Chen
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
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7
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Zhang Y, Malyi OI, Tang Y, Wei J, Zhu Z, Xia H, Li W, Guo J, Zhou X, Chen Z, Persson C, Chen X. Reducing the Charge Carrier Transport Barrier in Functionally Layer-Graded Electrodes. Angew Chem Int Ed Engl 2017; 56:14847-14852. [DOI: 10.1002/anie.201707883] [Citation(s) in RCA: 77] [Impact Index Per Article: 11.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/01/2017] [Revised: 09/26/2017] [Indexed: 11/07/2022]
Affiliation(s)
- Yanyan Zhang
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Oleksandr I. Malyi
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Yuxin Tang
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Jiaqi Wei
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Zhiqiang Zhu
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Huarong Xia
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Wenlong Li
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Jia Guo
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Xinran Zhou
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Zhong Chen
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
| | - Clas Persson
- Centre for Materials Science and Nanotechnology; Department of Physics; University of Oslo; P.O. Box 1048 Blindern NO-0316 Oslo Norway
| | - Xiaodong Chen
- Innovative Centre for Flexible Devices (iFLEX); School of Materials Science and Engineering; Nanyang Technological University; 50 Nanyang Avenue, Singapore 639798 Singapore
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