Yamamoto T, Izumi R, Miki K, Yamasaki T, Sugawara Y, Li YJ. Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy.
BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2020;
11:1750-1756. [PMID:
33282622 PMCID:
PMC7684860 DOI:
10.3762/bjnano.11.157]
[Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/26/2020] [Accepted: 11/04/2020] [Indexed: 05/29/2023]
Abstract
The atomic arrangement of the Si(110)-(16×2) reconstruction was directly observed using noncontact atomic force microscopy (NC-AFM) at 78 K. The pentagonal structure, which is the most important building block of the reconstruction, was concluded to consist of five atoms, while only four or five spots (depending on tip bias) have been reported with scanning tunneling microscopy (STM). Single atoms were determined to exist near step edges between upper and lower terraces, which have not been reported using STM. These findings are key evidence for establishing an atomic model of the Si(110)-(16×2) reconstruction, which indeed has a complex structure.
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