SIMULTANEOUS ATOMIC FORCE—SCANNING ELECTROCHEMICAL MICROSCOPY (AFM-SECM) IMAGING OF COPPER DISSOLUTION

Unveiling Nanoscale Heterogeneities at the Bias-Dependent Gold-Electrolyte Interface

Electrified solid-liquid interfaces (SLIs) are extremely complex and dynamic, affecting both the dynamics and selectivity of reaction pathways at electrochemical interfaces. Enabling access to the structure and arrangement of interfacial water in situ with nanoscale resolution is essential to develop efficient electrocatalysts. Here, we probe the SLI energy of a polycrystalline Au(111) electrode in a neutral aqueous electrolyte through in situ electrochemical atomic force microscopy. We acquire potential-dependent maps of the local interfacial adhesion forces, which we associate with the formation energy of the electric double layer. We observe nanoscale inhomogeneities of interfacial adhesion force across the entire map area, indicating local differences in the ordering of the solvent/ions at the interface. Anion adsorption has a clear influence on the observed interfacial adhesion forces. Strikingly, the adhesion forces exhibit potential-dependent hysteresis, which depends on the local gold grain curvature. Our findings on a model electrode extend the use of scanning probe microscopy to gain insights into the local molecular arrangement of the SLI in situ, which can be extended to other electrocatalysts.

Operando Scanning Electrochemical Probe Microscopy during Electrocatalysis

Scanning electrochemical probe microscopy (SEPM) techniques can disclose the local electrochemical reactivity of interfaces in single-entity and sub-entity studies. Operando SEPM measurements consist of using a SEPM tip to investigate the performance of electrocatalysts, while the reactivity of the interface is simultaneously modulated. This powerful combination can correlate electrochemical activity with changes in surface properties, e.g., topography and structure, as well as provide insight into reaction mechanisms. The focus of this review is to reveal the recent progress in local SEPM measurements of the catalytic activity of a surface toward the reduction and evolution of O₂ and H₂ and electrochemical conversion of CO₂. The capabilities of SEPMs are showcased, and the possibility of coupling other techniques to SEPMs is presented. Emphasis is given to scanning electrochemical microscopy (SECM), scanning ion conductance microscopy (SICM), electrochemical scanning tunneling microscopy (EC-STM), and scanning electrochemical cell microscopy (SECCM).

Application of Electrochemical Atomic Force Microscopy (EC-AFM) in the Corrosion Study of Metallic Materials

Electrochemical atomic force microscopy (EC-AFM), a branch of a scanning probe microscopy (SPM), can image substrate topography with high resolution. Since its inception, it was extended to a wide range of research areas through continuous improvement. The presence of an electrolytic cell and a potentiostat makes it possible to observe the topographical changes of the sample surface in real time. EC-AFM is used in in situ corrosion research because the samples are not required to be electrically conductive. It is widely used in passive film properties, surface dissolution, early-stage corrosion initiation, inhibitor efficiency, and many other branches of corrosion science. This review provides the research progress of EC-AFM and summarizes the extensive applications and investigations using EC-AFM in corrosion science.

(Multi)functional Atomic Force Microscopy Imaging

Incorporating functionality to atomic force microscopy (AFM) to obtain physical and chemical information has always been a strong focus in AFM research. Modifying AFM probes with specific molecules permits accessibility of chemical information via specific reactions and interactions. Fundamental understanding of molecular processes at the solid/liquid interface with high spatial resolution is essential to many emerging research areas. Nanoscale electrochemical imaging has emerged as a complementary technique to advanced AFM techniques, providing information on electrochemical interfacial processes. While this review presents a brief introduction to advanced AFM imaging modes, such as multiparametric AFM and topography recognition imaging, the main focus herein is on electrochemical imaging via hybrid AFM-scanning electrochemical microscopy. Recent applications and the challenges associated with such nanoelectrochemical imaging strategies are presented.