Detection of einkorn flour adulteration in flour and bread samples using Computer-Based Image Analysis and Near-Infrared Spectroscopy

Prediction of maize flour adulteration in chickpea flour (besan) using near infrared spectroscopy

The present study was performed to develop Near-infrared spectroscopy based prediction method for the quantification of the maize flour adulteration in chickpea flour. Adulterated samples of Chickpea flour (besan) were prepared by spiking different concentrations of maize flour with pure Chickpea flour in the range of 1–90% (w/w). The spectra of pure Chickpea flour, pure maize flour, and adulterated samples of Chickpea flour with maize flour were acquired as the logarithm of reciprocal of reflectance (log 1/R) in the entire Visible-NIR wavelength range of 400–2498 nm. The acquired spectra were pre-processed by Ist derivative, standard normal variate, and detrending. The calibration models were developed using modified partial least square regression (MPLSR), partial least square regression and principal component regression. The optimal model was selected on the basis of highest values of the coefficient of determination (RSQ), one minus variance ratio (1-VR) and lowest values of standard errors of calibration (SEC), and standard error of cross-validation (SECV). MPLSR model having RSQ and 1-VR value of 0.999 and 0.996 having SEC and SECV value of 1.092 and 2.042 was developed for quantification of maize flour adulteration in chickpea flour. Cross validation and external validation of the developed models resulted in RSQ of 0.999, 0.997 and standard error of prediction of 1.117, and 2.075, respectively.

Application of near-infrared spectroscopy for the nondestructive analysis of wheat flour: A review

The quality and safety of wheat flour are of public concern since they are related to the quality of flour products and human health. Therefore, efficient and convenient analytical techniques are needed for the quality and safety controls of wheat flour. Near-infrared (NIR) spectroscopy has become an ideal technique for assessing the quality and safety of wheat flour, as it is a rapid, efficient and nondestructive method. The application of NIR spectroscopy in the quality and safety analysis of wheat flour is addressed in this review. First, we briefly summarize the basic knowledge of NIR spectroscopy and chemometrics. Then, recent advances in the application of NIR spectroscopy for chemical composition, technological parameters, and safety analysis are presented. Finally, the potential of NIR spectroscopy is discussed. Combined with chemometric methods, NIR spectroscopy has been used to detect chemical composition, technological parameters, deoxynivalenol, adulterants and additives of wheat flour. Furthermore, NIR spectroscopy has shown great potential for the rapid and online analysis of the quality and safety of wheat flour. It is anticipated that the current review will serve as a reference for the future analysis of wheat flour by NIR spectroscopy to ensure the quality and safety of flour products.

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NIR spectroscopy is an ideal technique for analysis of wheat flour due to its rapid and nondestructive nature.

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Use of NIR spectroscopy for chemical composition, technological parameters, and safety analysis.

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Online and handheld NIR spectrometers for wheat flour detection are the future trends.