Sakurai H, Suzuki K, Ishii S, Hoshi K, Nozawa T, Ozaki H, Haga H, Tanigawa H, Someya Y, Tsuchiya M, Takeuchi H, Tsuji N. Development of non-destructive testing (NDT) technique for HIPed interface by Compton scattering X-ray spectroscopy.
NUCLEAR MATERIALS AND ENERGY 2022. [DOI:
10.1016/j.nme.2022.101171]
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