Ferdaus MM, Zhou B, Yoon JW, Low KL, Pan J, Ghosh J, Wu M, Li X, Thean AVY, Senthilnath J. Significance of activation functions in developing an online classifier for semiconductor defect detection.
Knowl Based Syst 2022. [DOI:
10.1016/j.knosys.2022.108818]
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