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For: Bačovský J. Aberration correction for low voltage optimized transmission electron microscopy. MethodsX 2018;5:1033-1047. [PMID: 30225204 PMCID: PMC6138797 DOI: 10.1016/j.mex.2018.08.009] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/16/2017] [Accepted: 08/17/2018] [Indexed: 11/25/2022]  Open
Number Cited by Other Article(s)
1
Bačovský J, Kolařík V. Hexapole corrector for LVEM. Ultramicroscopy 2020;212:112974. [DOI: 10.1016/j.ultramic.2020.112974] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/11/2019] [Revised: 02/28/2020] [Accepted: 03/05/2020] [Indexed: 11/30/2022]
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