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For: Kim BI, Boehm RD. Force-feedback high-speed atomic force microscope for studying large biological systems. Micron 2012;43:1372-9. [DOI: 10.1016/j.micron.2012.04.005] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/19/2012] [Revised: 04/07/2012] [Accepted: 04/07/2012] [Indexed: 11/20/2022]
Number Cited by Other Article(s)
1
Otieno LO, Alunda BO, Kim J, Lee YJ. Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head. SENSORS 2021;21:s21020362. [PMID: 33430315 PMCID: PMC7825750 DOI: 10.3390/s21020362] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/03/2020] [Revised: 01/01/2021] [Accepted: 01/03/2021] [Indexed: 12/02/2022]
2
Azeredo J, Azevedo NF, Briandet R, Cerca N, Coenye T, Costa AR, Desvaux M, Di Bonaventura G, Hébraud M, Jaglic Z, Kačániová M, Knøchel S, Lourenço A, Mergulhão F, Meyer RL, Nychas G, Simões M, Tresse O, Sternberg C. Critical review on biofilm methods. Crit Rev Microbiol 2016;43:313-351. [PMID: 27868469 DOI: 10.1080/1040841x.2016.1208146] [Citation(s) in RCA: 562] [Impact Index Per Article: 70.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/01/2023]
3
Klapetek P, Valtr M, Picco L, Payton OD, Martinek J, Yacoot A, Miles M. Large area high-speed metrology SPM system. NANOTECHNOLOGY 2015;26:065501. [PMID: 25597347 DOI: 10.1088/0957-4484/26/6/065501] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
4
Kim BI, Boehm RD, Bonander JR. Direct observation of self-assembled chain-like water structures in a nanoscopic water meniscus. J Chem Phys 2013;139:054701. [PMID: 23927275 DOI: 10.1063/1.4816818] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
5
Kim BI, Boehm RD. Mechanical property investigation of soft materials by cantilever-based optical interfacial force microscopy. SCANNING 2013;35:59-67. [PMID: 22766841 DOI: 10.1002/sca.21036] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/04/2012] [Accepted: 06/05/2012] [Indexed: 06/01/2023]
6
Kim BI, Boehm RD. Imaging stability in force-feedback high-speed atomic force microscopy. Ultramicroscopy 2013;125:29-34. [PMID: 23274682 DOI: 10.1016/j.ultramic.2012.09.012] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/27/2012] [Revised: 09/24/2012] [Accepted: 09/25/2012] [Indexed: 10/27/2022]
7
Payton OD, Picco L, Miles MJ, Homer ME, Champneys AR. Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2012;83:083710. [PMID: 22938306 DOI: 10.1063/1.4747455] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
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