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Ritchie NWM, Herzing A, Oleshko VP. Quantification of Unsupported Thin-Film X-ray Spectra Using Bulk Standards. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2023; 29:1921-1930. [PMID: 37950609 PMCID: PMC10904021 DOI: 10.1093/micmic/ozad109] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/22/2023] [Revised: 07/14/2023] [Accepted: 09/19/2023] [Indexed: 11/12/2023]
Abstract
A quantification model which uses standard X-ray spectra collected from bulk materials to determine the composition and mass thickness of single-layer and multilayer unsupported thin films is presented. The multivariate model can be iteratively solved for single layers in which each element produces at least one visible characteristic X-ray line. The model can be extended to multilayer thin films in which each element is associated with only one layer. The model may sometimes be solved when an element is present in multiple layers if additional information is added in the form of independent k-ratios or model assumptions. While the algorithm is suitable for any measured k-ratios, it is particularly well suited to energy-dispersive X-ray spectrometry where the bulk standard spectra can be used to deconvolve peak interferences in the thin-film spectra. The algorithm has been implemented and made available in the Open Source application National Institute of Standards and Technology DTSA-II. We present experimental data and Monte Carlo simulations supporting the quantification model.
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Affiliation(s)
| | - Andrew Herzing
- National Institute of Standards and Technology Gaithersburg, MD 20899
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2
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Zhang Z, Lobato I, De Backer A, Van Aert S, Nellist P. Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions. Ultramicroscopy 2023; 246:113671. [PMID: 36621195 DOI: 10.1016/j.ultramic.2022.113671] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/15/2022] [Revised: 12/21/2022] [Accepted: 12/26/2022] [Indexed: 12/29/2022]
Abstract
Advanced materials often consist of multiple elements which are arranged in a complicated structure. Quantitative scanning transmission electron microscopy is useful to determine the composition and thickness of nanostructures at the atomic scale. However, significant difficulties remain to quantify mixed columns by comparing the resulting atomic resolution images and spectroscopy data with multislice simulations where dynamic scattering needs to be taken into account. The combination of the computationally intensive nature of these simulations and the enormous amount of possible mixed column configurations for a given composition indeed severely hamper the quantification process. To overcome these challenges, we here report the development of an incoherent non-linear method for the fast prediction of ADF-EDX scattering cross-sections of mixed columns under channelling conditions. We first explain the origin of the ADF and EDX incoherence from scattering physics suggesting a linear dependence between those two signals in the case of a high-angle ADF detector. Taking EDX as a perfect incoherent reference mode, we quantitatively examine the ADF longitudinal incoherence under different microscope conditions using multislice simulations. Based on incoherent imaging, the atomic lensing model previously developed for ADF is now expanded to EDX, which yields ADF-EDX scattering cross-section predictions in good agreement with multislice simulations for mixed columns in a core-shell nanoparticle and a high entropy alloy. The fast and accurate prediction of ADF-EDX scattering cross-sections opens up new opportunities to explore the wide range of ordering possibilities of heterogeneous materials with multiple elements.
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Affiliation(s)
- Zezhong Zhang
- Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, United Kingdom.
| | - Ivan Lobato
- Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
| | - Annick De Backer
- Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium
| | - Sandra Van Aert
- Electron Microscopy for Materials Research (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
| | - Peter Nellist
- Department of Materials, University of Oxford, 16 Parks Road, Oxford OX1 3PH, United Kingdom.
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Botifoll M, Pinto-Huguet I, Arbiol J. Machine learning in electron microscopy for advanced nanocharacterization: current developments, available tools and future outlook. NANOSCALE HORIZONS 2022; 7:1427-1477. [PMID: 36239693 DOI: 10.1039/d2nh00377e] [Citation(s) in RCA: 11] [Impact Index Per Article: 5.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/16/2023]
Abstract
In the last few years, electron microscopy has experienced a new methodological paradigm aimed to fix the bottlenecks and overcome the challenges of its analytical workflow. Machine learning and artificial intelligence are answering this call providing powerful resources towards automation, exploration, and development. In this review, we evaluate the state-of-the-art of machine learning applied to electron microscopy (and obliquely, to materials and nano-sciences). We start from the traditional imaging techniques to reach the newest higher-dimensionality ones, also covering the recent advances in spectroscopy and tomography. Additionally, the present review provides a practical guide for microscopists, and in general for material scientists, but not necessarily advanced machine learning practitioners, to straightforwardly apply the offered set of tools to their own research. To conclude, we explore the state-of-the-art of other disciplines with a broader experience in applying artificial intelligence methods to their research (e.g., high-energy physics, astronomy, Earth sciences, and even robotics, videogames, or marketing and finances), in order to narrow down the incoming future of electron microscopy, its challenges and outlook.
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Affiliation(s)
- Marc Botifoll
- Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST, Campus UAB, Bellaterra, 08193 Barcelona, Catalonia, Spain.
| | - Ivan Pinto-Huguet
- Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST, Campus UAB, Bellaterra, 08193 Barcelona, Catalonia, Spain.
| | - Jordi Arbiol
- Catalan Institute of Nanoscience and Nanotechnology (ICN2), CSIC and BIST, Campus UAB, Bellaterra, 08193 Barcelona, Catalonia, Spain.
- ICREA, Pg. Lluís Companys 23, 08010 Barcelona, Catalonia, Spain
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De Backer A, Zhang Z, van den Bos KHW, Bladt E, Sánchez-Iglesias A, Liz-Marzán LM, Nellist PD, Bals S, Van Aert S. Element Specific Atom Counting at the Atomic Scale by Combining High Angle Annular Dark Field Scanning Transmission Electron Microscopy and Energy Dispersive X-ray Spectroscopy. SMALL METHODS 2022; 6:e2200875. [PMID: 36180399 DOI: 10.1002/smtd.202200875] [Citation(s) in RCA: 5] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/06/2022] [Revised: 08/29/2022] [Indexed: 06/16/2023]
Abstract
A new methodology is presented to count the number of atoms in multimetallic nanocrystals by combining energy dispersive X-ray spectroscopy (EDX) and high angle annular dark field scanning transmission electron microscopy (HAADF STEM). For this purpose, the existence of a linear relationship between the incoherent HAADF STEM and EDX images is exploited. Next to the number of atoms for each element in the atomic columns, the method also allows quantification of the error in the obtained number of atoms, which is of importance given the noisy nature of the acquired EDX signals. Using experimental images of an Au@Ag core-shell nanorod, it is demonstrated that 3D structural information can be extracted at the atomic scale. Furthermore, simulated data of an Au@Pt core-shell nanorod show the prospect to characterize heterogeneous nanostructures with adjacent atomic numbers.
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Affiliation(s)
- Annick De Backer
- EMAT, University of Antwerp, 2020, Antwerp, Belgium
- NANOlab Center of Excellence, University of Antwerp, 2020, Antwerp, Belgium
| | - Zezhong Zhang
- EMAT, University of Antwerp, 2020, Antwerp, Belgium
- NANOlab Center of Excellence, University of Antwerp, 2020, Antwerp, Belgium
| | - Karel H W van den Bos
- EMAT, University of Antwerp, 2020, Antwerp, Belgium
- NANOlab Center of Excellence, University of Antwerp, 2020, Antwerp, Belgium
| | - Eva Bladt
- EMAT, University of Antwerp, 2020, Antwerp, Belgium
- NANOlab Center of Excellence, University of Antwerp, 2020, Antwerp, Belgium
| | - Ana Sánchez-Iglesias
- CIC biomaGUNE, Basque Research and Technology Alliance (BRTA), 20014, Donostia-San Sebastián, Spain
- Centro de Investigación Biomédica en Red de Bioingeniería, Biomateriales y Nanomedicina (CIBER-BBN), 20014, Donostia-San Sebastián, Spain
| | - Luis M Liz-Marzán
- CIC biomaGUNE, Basque Research and Technology Alliance (BRTA), 20014, Donostia-San Sebastián, Spain
- Centro de Investigación Biomédica en Red de Bioingeniería, Biomateriales y Nanomedicina (CIBER-BBN), 20014, Donostia-San Sebastián, Spain
- Ikerbasque, Basque Foundation for Science, 48009, Bilbao, Spain
| | - Peter D Nellist
- Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK
| | - Sara Bals
- EMAT, University of Antwerp, 2020, Antwerp, Belgium
- NANOlab Center of Excellence, University of Antwerp, 2020, Antwerp, Belgium
| | - Sandra Van Aert
- EMAT, University of Antwerp, 2020, Antwerp, Belgium
- NANOlab Center of Excellence, University of Antwerp, 2020, Antwerp, Belgium
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Basha A, Levi G, Amrani T, Li Y, Ankonina G, Shekhter P, Kornblum L, Goldfarb I, Kohn A. Elastic and inelastic mean free paths for scattering of fast electrons in thin-film oxides. Ultramicroscopy 2022; 240:113570. [PMID: 35700667 DOI: 10.1016/j.ultramic.2022.113570] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/14/2022] [Revised: 05/23/2022] [Accepted: 06/03/2022] [Indexed: 10/18/2022]
Abstract
Quantitative transmission electron microscopy (TEM) often requires accurate knowledge of sample thickness for determining defect density, structure factors, sample dimensions, electron beam and X-ray photons signal broadening. The most common thickness measurement is by Electron Energy Loss Spectroscopy which can be applied effectively to crystalline and amorphous materials. The drawback is that sample thickness is measured in units of Inelastic Mean Free Path (MFP) which depends on the material, the electron energy and the collection angle of the spectrometer. Furthermore, the Elastic MFP is an essential parameter for selecting optimal sample thickness to reduce dynamical scatterings, such as for short-range-order characterization of amorphous materials. Finally, the Inelastic to Elastic MFP ratio can predict the dominant mechanism for radiation damage due to the electron beam. We implement a fast and precise method for the extraction of inelastic and elastic MFP values in technologically important oxide thin films. The method relies on the crystalline Si substrate for calibration. The Inelastic MFP of Si was measured as a function of collection semi-angle (β) by combining Energy-Filtered TEM thickness maps followed by perpendicular cross-sectioning of the sample by Focused-Ion-Beam. For example, we measured a total Inelastic MFP (β∼157 mrad) in Si of 145 ± 10 nm for 200 keV electrons. The MFP of the thin oxide films is determined by their ratio at their interface with Si or SiO2. The validity of this method was verified by direct TEM observation of cross-to-cross sectioning of TEM samples. The high precision of this method was enabled mainly by implementing a wedge preparation technique, which provides large sampling areas with uniform thickness. We measured the Elastic and Inelastic Mean Free Paths for 200 keV and 80 keV electrons as a function of collection angle for: SiO2 (Thermal, CVD), low-κ SiOCH, Al2O3, TiO2, ZnO, Ta2O5 and HfO2. The measured MFP values were compared to calculations based on models of Wenzel, Malis and Iakoubovskii. These models deviate from measurements by up to 30%, especially for 80 keV electrons. Hence, we propose functional relations for the Elastic MFP and Inelastic MFP in oxides with respect to the mass density and effective atomic number, which reduce deviations by a factor of 2-3. In addition, the effects of sample cooling on the measurements and sample stability are examined.
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Affiliation(s)
- Adham Basha
- Department of Materials Science and Engineering, The Iby and Aladar Fleischman Faculty of Engineering, Tel Aviv University, Ramat Aviv, Tel Aviv 6997801, Israel
| | - George Levi
- Department of Materials Science and Engineering, The Iby and Aladar Fleischman Faculty of Engineering, Tel Aviv University, Ramat Aviv, Tel Aviv 6997801, Israel
| | - Tamir Amrani
- Department of Materials Science and Engineering, The Iby and Aladar Fleischman Faculty of Engineering, Tel Aviv University, Ramat Aviv, Tel Aviv 6997801, Israel
| | - Yang Li
- Andrew and Erna Viterbi Faculty of Electrical and Computer Engineering, Technion - Israel Institute of Technology, Haifa 3200003, Israel
| | - Guy Ankonina
- Andrew and Erna Viterbi Faculty of Electrical and Computer Engineering, Technion - Israel Institute of Technology, Haifa 3200003, Israel
| | - Pini Shekhter
- Tel Aviv University Center for Nanoscience and Nanotechnology, Tel Aviv University, Ramat Aviv, Tel Aviv 6997801, Israel
| | - Lior Kornblum
- Andrew and Erna Viterbi Faculty of Electrical and Computer Engineering, Technion - Israel Institute of Technology, Haifa 3200003, Israel
| | - Ilan Goldfarb
- Department of Materials Science and Engineering, The Iby and Aladar Fleischman Faculty of Engineering, Tel Aviv University, Ramat Aviv, Tel Aviv 6997801, Israel
| | - Amit Kohn
- Department of Materials Science and Engineering, The Iby and Aladar Fleischman Faculty of Engineering, Tel Aviv University, Ramat Aviv, Tel Aviv 6997801, Israel.
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Analysis of Local Charges at Hetero-interfaces by Electron Holography - A Comparative Study of Different Techniques. Ultramicroscopy 2021; 231:113236. [PMID: 33676771 DOI: 10.1016/j.ultramic.2021.113236] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/23/2020] [Revised: 02/10/2021] [Accepted: 02/20/2021] [Indexed: 11/21/2022]
Abstract
Interface charges confined within a few nanometers of hetero-interface can be characterized by measuring the phase shift of the transmitted beam using different electron holography techniques. However, reliable measurement of the electrostatic potential arising from the interface charges is challenging as the mean inner potential difference (ΔV0) between two adjoining materials as well as local variation of the sample thickness affect the phase shift. In the present study, we show how electron holography can be used to characterize the confined charges at an oxide hetero-interface and evaluate the applicability of different techniques for this purpose. The model system chosen for this study is a LaAlO3/SrTiO3 (LAO/STO) (111) hetero-interface featuring a two-dimensional electron gas (2DEG), where the ΔV0 between LAO and STO is about 2 eV, which is unignorably large and dominates the net potential variation across the interface. For transmission electron microscopy specimens prepared by focused ion beam we applied three different variants of electron holography techniques: off-axis, inline and hybrid electron holography; and compare the results obtained by these approaches in terms of the information transfer in the spatial frequency domain, and the signal-to-noise ratio of the electric field and charge density maps. To correctly assess the information pertinent to the interface-confined charges, we calculate the electrostatic potential and electric field distribution based on a charge model with taking account of the ΔV0 between LAO and STO and compared the calculated profiles with the experimental results after calibrating the local thickness variation across the LAO/STO interface. The results show that hybrid electron holography recovers the information across a wide range of spatial frequencies, and as a result, delivers the most reliable charge density information, albeit convoluted with the unavoidable effects arising from ΔV0.
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7
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Ellaby T, Varambhia A, Luo X, Briquet L, Sarwar M, Ozkaya D, Thompsett D, Nellist PD, Skylaris CK. Strain effects in core-shell PtCo nanoparticles: a comparison of experimental observations and computational modelling. Phys Chem Chem Phys 2020; 22:24784-24795. [PMID: 33107513 DOI: 10.1039/d0cp04318d] [Citation(s) in RCA: 12] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Strain in Pt nanoalloys induced by the secondary metal has long been suggested as a major contributor to the modification of catalytic properties. Here, we investigate strain in PtCo nanoparticles using a combination of computational modelling and microscopy experiments. We have used a combination of molecular dynamics (MD) and large-scale density functional theory (DFT) for our models, alongside experimental work using annular dark field scanning transmission electron microscopy (ADF-STEM). We have performed extensive validation of the interatomic potential against DFT using a Pt568Co18 nanoparticle. Modelling gives access to 3 dimensional structures that can be compared to the 2D ADF-STEM images, which we use to build an understanding of nanoparticle structure and composition. Strain has been measured for PtCo and pure Pt nanoparticles, with MD annealed models compared to ADF-STEM images. Our analysis was performed on a layer by layer basis, where distinct trends between the Pt and PtCo alloy nanoparticles are observed. To our knowledge, we show for the first time a way in which detailed atomistic simulations can be used to augment and help interpret the results of ADF-STEM strain mapping experiments, which will enhance their use in characterisation towards the development of improved catalysts.
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Affiliation(s)
- Tom Ellaby
- Department of Chemistry, University of Southampton, Southampton, UK.
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8
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Yesibolati MN, Laganá S, Kadkhodazadeh S, Mikkelsen EK, Sun H, Kasama T, Hansen O, Zaluzec NJ, Mølhave K. Electron inelastic mean free path in water. NANOSCALE 2020; 12:20649-20657. [PMID: 32614016 DOI: 10.1039/d0nr04352d] [Citation(s) in RCA: 16] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Liquid phase transmission electron microscopy (LPTEM) is rapidly developing as a powerful tool for probing processes in liquid environments with close to atomic resolution. Knowledge of the water thickness is needed for reliable interpretation and modelling of analytical studies in LPTEM, and is particularly essential when using thin liquid layers, required for achieving the highest spatial resolutions. The log-ratio method in electron energy-loss spectroscopy (EELS) is often applied in TEM to quantify the sample thickness, which is measured relative to the inelastic mean free path (λIMFP). However, λIMFP itself is dependent on sample material, the electron energy, and the convergence and divergence angles of the microscope electronoptics. Here, we present a detailed quantitative analysis of the λIMFP of water as functions of the EELS collection angle (β) at 120 keV and 300 keV in a novel nanochannel liquid cell. We observe good agreement with earlier studies conducted on ice, but find that the most widely used theoretical models significantly underestimate λIMFP of water. We determine an adjusted average energy-loss term Em, water, and characteristic scattering angle θE, water that improve the accuracy. The results provide a comprehensive knowledge of the λIMFP of water (or ice) for reliable interpretation and quantification of observations in LPTEM and cryo-TEM studies.
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Affiliation(s)
- Murat Nulati Yesibolati
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Building 307, 2800 Kgs. Lyngby, Denmark.
| | - Simone Laganá
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Building 307, 2800 Kgs. Lyngby, Denmark.
| | - Shima Kadkhodazadeh
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Building 307, 2800 Kgs. Lyngby, Denmark.
| | - Esben Kirk Mikkelsen
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Building 307, 2800 Kgs. Lyngby, Denmark.
| | - Hongyu Sun
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Building 307, 2800 Kgs. Lyngby, Denmark.
| | - Takeshi Kasama
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Building 307, 2800 Kgs. Lyngby, Denmark.
| | - Ole Hansen
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Building 307, 2800 Kgs. Lyngby, Denmark.
| | - Nestor J Zaluzec
- Argonne National Laboratory, Photon Sciences Division, 9700 S. Cass Avenue, Argonne, IL 60439, USA
| | - Kristian Mølhave
- DTU Nanolab, National Centre for Nano Fabrication and Characterization, Technical University of Denmark, Building 307, 2800 Kgs. Lyngby, Denmark.
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9
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Yu W, Batchelor-McAuley C, Wang YC, Shao S, Fairclough SM, Haigh SJ, Young NP, Compton RG. Characterising porosity in platinum nanoparticles. NANOSCALE 2019; 11:17791-17799. [PMID: 31552997 DOI: 10.1039/c9nr06071e] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/16/2023]
Abstract
Accurately determining the morphology and hence the true surface areas of catalytic nanoparticles remains challenging. For many chemically synthesised nanoparticle suspensions conventional BET surface area measurements are often not feasible due to the large quantities of material required. For platinum, a paradigmatic catalyst, this issue is further complicated by the propensity of this metal to form porous aggregate structures comprised of smaller (ca. 2-5 nm) crystallites as opposed to continuous solid structures. This dendritic/porous particulate morphology leads to a large but poorly defined 'active' surface which is difficult to measure accurately. Here we compare, single nanoparticle electrochemistry with three dimensional (3D) electron tomography and quantitative 2D high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) analysis to yield insights into the porosity and chemically accessible surface area of a 30 nm diameter commercial Pt nanoparticle catalyst. Good quantitative agreement is found between 2D and 3D STEM-based measurements of the particle morphology, density and size distribution. Both 3D STEM tomography and single nanoparticle electrochemical measurements allow quantification of the surface area but the electrocatalytic surface area is found to be 2.8× larger than is measured in STEM; indicating the importance of the atomic scale roughness and structure (<2 nm) in contributing to the total catalytic surface area of the nanomaterial.
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Affiliation(s)
- Wenmiao Yu
- Physical and Theoretical Chemistry Laboratory, Department of Chemistry, University of Oxford, South Parks Road, Oxford OX1 3QZ, UK.
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Liu J, Lozano-Perez S, Wilkinson AJ, Grovenor CRM. On the depth resolution of transmission Kikuchi diffraction (TKD) analysis. Ultramicroscopy 2019; 205:5-12. [PMID: 31234103 DOI: 10.1016/j.ultramic.2019.06.003] [Citation(s) in RCA: 16] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/25/2019] [Revised: 05/26/2019] [Accepted: 06/09/2019] [Indexed: 10/26/2022]
Abstract
In this paper, we have analyzed the depth resolution that can be achieved by on-axis transmission Kikuchi diffraction (TKD) using a Zr-Nb alloy. The results indicate that the signals contributing to detectable Kikuchi bands originate from a depth of approximately the mean free path of thermal diffuse scattering (λTDS) from the bottom surface of a thin foil sample. This existing surface sensitivity can thus lead to the observation of different grain structures when opposite sides of a nano-crystalline foil are facing the incident electron beam. These results also provide a guideline for the ideal sample thickness for TKD analysis of ≤ 6λTDS, or 21 times the elastic scattering mean free path (λMFP) for samples of high crystal symmetry. For samples of lower symmetry, a smaller thickness ≤ 3λTDS, or ≤ 10λMFP is suggested.
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Affiliation(s)
- Junliang Liu
- Department of Materials, University of Oxford, Parks Road, OX1 3PH, United Kingdom.
| | - Sergio Lozano-Perez
- Department of Materials, University of Oxford, Parks Road, OX1 3PH, United Kingdom
| | - Angus J Wilkinson
- Department of Materials, University of Oxford, Parks Road, OX1 3PH, United Kingdom
| | - Chris R M Grovenor
- Department of Materials, University of Oxford, Parks Road, OX1 3PH, United Kingdom
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11
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Performing EELS at higher energy losses at both 80 and 200 kV. ADVANCES IN IMAGING AND ELECTRON PHYSICS 2019. [DOI: 10.1016/bs.aiep.2019.02.001] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/24/2022]
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