3D surface reconstruction of small height object based on thin structured light scanning

A Study on Refraction Error Compensation Method for Underwater Spinning Laser Scanning Three-Dimensional Imaging

Laser scanning 3D imaging technology, because it can obtain accurate three-dimensional surface data, has been widely used in the search for wrecks and rescue operations, underwater resource development, and other fields. At present, the conventional underwater spinning laser scanning imaging system maintains a relatively fixed light window. However, in low-light situations underwater, the rotation of the scanning device causes some degree of water fluctuation, which warps the light strip data that the system sensor receives about the object's surface. To solve this problem, this research studies an underwater 3D scanning and imaging system that makes use of a fixed light window and a spinning laser (FWLS). A refraction error compensation algorithm is investigated that is based on the fundamentals of linear laser scanning imaging, and a dynamic refraction mathematical model is established based on the motion of the imaging device. The results of the experiment on error analysis in an optimal underwater environment indicate that the error in reconstructing the radius is decreased by 60% (from 2.5 mm to around 1 mm) when compensating for the measurement data of a standard sphere with a radius of 20 mm. Moreover, the compensated point cloud data exhibit a higher degree of correspondence with the model of the standard spherical point cloud. Furthermore, we examine the impact of physical noise, measurement distance, and partial occlusion of the object on the imaging system inside an authentic underwater setting. This study is a good starting point for looking at the refractive error of an underwater laser scanning imaging system. It also provides to us some ideas for future research on the refractive error of other scanning imaging methods.

An Intelligent Analysis Method for 3D Wheat Grain and Ventral Sulcus Traits Based on Structured Light Imaging

The wheat grain three-dimensional (3D) phenotypic characters are of great significance for final yield and variety breeding, and the ventral sulcus traits are the important factors to the wheat flour yield. The wheat grain trait measurements are necessary; however, the traditional measurement method is still manual, which is inefficient, subjective, and labor intensive; moreover, the ventral sulcus traits can only be obtained by destructive measurement. In this paper, an intelligent analysis method based on the structured light imaging has been proposed to extract the 3D wheat grain phenotypes and ventral sulcus traits. First, the 3D point cloud data of wheat grain were obtained by the structured light scanner, and then, the specified point cloud processing algorithms including single grain segmentation and ventral sulcus location have been designed; finally, 28 wheat grain 3D phenotypic characters and 4 ventral sulcus traits have been extracted. To evaluate the best experimental conditions, three-level orthogonal experiments, which include rotation angle, scanning angle, and stage color factors, were carried out on 125 grains of 5 wheat varieties, and the results demonstrated that optimum conditions of rotation angle, scanning angle, and stage color were 30°, 37°, black color individually. Additionally, the results also proved that the mean absolute percentage errors (MAPEs) of wheat grain length, width, thickness, and ventral sulcus depth were 1.83, 1.86, 2.19, and 4.81%. Moreover, the 500 wheat grains of five varieties were used to construct and validate the wheat grain weight model by 32 phenotypic traits, and the cross-validation results showed that the R 2 of the models ranged from 0.77 to 0.83. Finally, the wheat grain phenotype extraction and grain weight prediction were integrated into the specialized software. Therefore, this method was demonstrated to be an efficient and effective way for wheat breeding research.

Surface Reconstruction of Microscale Objects Based on Grid-Patterned Structured-Light Measurements

A structured-light projection system was designed for microscale objects with surface heights that ranged from tens to hundreds of microns. The system was composed of a universal projector and microscope system that supported editing the attributes of structured-light patterns in real-time and was capable of projecting microscale patterns. On this basis, reconstructing the metal surfaces of microscale objects based on grid patterns of structured light was investigated, the internal and external parameters of microscope vision and projection systems were calibrated, and an image algorithm for grid-node detection was designed. The results indicated that the proposed method successfully reconstructed the three-dimensional (3D) surface of microscale objects, and the reconstruction results were consistent with the original surfaces. With 95% confidence, the reconstruction precision in the X- and Y-directions was approximately ±4.0 μm and in the Z-direction was approximately ±7.5 μm. The designed system and the proposed method were suitable for 3D-shape measurement of microstructures in microscopic fields and can be adapted to meet a broader range of applications, as compared to current methods.

Design of thin-structured-light projection system for small-height measurement

A thin-structured light projection system with simple setup is proposed and applied to small-height measurement. In this system, the design of structured light pattern is carried out on the computer. The structure, color, geometric dimension, motion mode, projection brightness, contrast, and other attributes of the pattern can be edited easily. The optical system with zoom function is designed, which can output thin-structured-light fringe with a minimum width of 10 μm. The camera and microscope are used to construct a vision system, which is used to capture the pattern of structured light. The three-dimensional (3D) shape reconstruction is realized by analyzing the pattern of structured light. The results show that this system can project a small width of thin-structured light pattern, which is very suitable for 3D shape reconstruction of microscopic objects with the small-height of tens of microns to hundreds of microns.