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For: Ma F, Han Y, Song B, Dong S, Miao M, Zheng J, Wu J, Zhu K. Substrate-engineered GGNMOS for low trigger voltage ESD in 65nm CMOS process. Microelectronics Reliability 2011. [DOI: 10.1016/j.microrel.2011.07.028] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/05/2023]

For:	Ma F, Han Y, Song B, Dong S, Miao M, Zheng J, Wu J, Zhu K. Substrate-engineered GGNMOS for low trigger voltage ESD in 65nm CMOS process. Microelectronics Reliability 2011. [DOI: 10.1016/j.microrel.2011.07.028] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/05/2023]

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(The first 100,000 artilces are displayed in RCA.)