Thickness-dependent crystal orientation in poly(trimethylene 2,6-naphthalate) films studied with GIWAXD and RA-FTIR methods

Anisotropic material depletion in epitaxial polymer crystallization

The physical properties of a semicrystalline polymer thin film are intimately related to the morphology of its crystalline domains. While the mechanisms underlying crystallization of flat-on oriented polymer crystals are well known, similar mechanisms remain elusive for edge-on oriented thin films due to the propensity of substantially thin films to adopt flat-on orientations. Here, we employ an epitaxial polymer-substrate relationship to enforce edge-on crystallization in thin films. Using matrix-assisted pulsed laser evaporation (MAPLE), we deposit films in which crystal nucleation is spatially separated from subsequent epitaxial crystallization. These experiments, together with phase-field simulations, demonstrate a highly anisotropic and localized material depletion during edge-on crystallization. These results provide deeper insight into the physics of polymer crystallization under confinement and introduce a processing motif in the crystallization of ultrathin structured films.

Local orientation of chains at crystal/amorphous interfaces buried in isotactic polypropylene thin films

A better understanding of the aggregation states of polymer chains in thin films is of pivotal importance for developing thin film polymer devices in addition to its inherent scientific interest. Here we report the preferential orientation of the crystalline lamellae for isotactic polypropylene (iPP) in spin-coated films by grazing incidence of wide-angle X-ray diffraction in conjunction with sum frequency generation vibrational spectroscopy, which provides information on the local conformation of chains at crystal/amorphous interfaces buried in a thin film. The crystalline orientation of iPP, which formed cross-hatched lamellae induced by lamellar branching, altered from a mixture of edge-on and face-on mother lamellae to preferential face-on mother lamellae with decreasing thickness. The orientation of methyl groups at the crystal/amorphous interfaces in the interior region of the iPP films changed, accompanied by a change in the lamellar orientation.

Detection of Additives and Chemical Contaminants in Turmeric Powder Using FT-IR Spectroscopy

Yellow turmeric (Curcuma longa) is widely used for culinary and medicinal purposes, and as a dietary supplement. Due to the commercial popularity of C. longa, economic adulteration and contamination with botanical additives and chemical substances has increased. This study used FT-IR spectroscopy for identifying and estimating white turmeric (Curcuma zedoaria), and Sudan Red G dye mixed with yellow turmeric powder. Fifty replicates of yellow turmeric-Sudan Red mixed samples (1%, 5%, 10%, 15%, 20%, 25% Sudan Red, w/w) and fifty replicates of yellow turmeric-white turmeric mixed samples (10%, 20%, 30%, 40%, 50% white turmeric, w/w) were prepared. The IR spectra of the pure compounds and mixtures were analyzed. The 748 cm^-1 Sudan Red peak and the 1078 cm^-1 white turmeric peak were used as spectral fingerprints. A partial least square regression (PLSR) model was developed for each mixture type to estimate adulteration concentrations. The coefficient of determination (R²_v) for the Sudan Red mixture model was 0.97 with a root mean square error of prediction (RMSEP) equal to 1.3%. R²_v and RMSEP for the white turmeric model were 0.95 and 3.0%, respectively. Our results indicate that the method developed in this study can be used to identify and quantify yellow turmeric powder adulteration.

Flat-on lamellae in spin-coated, stable films of poly(propylene azelate)

Thin films (5-500 nm thick) of the linear aliphatic polyester (3,7) poly(propylene azelate) (PPAz) were prepared by spin-coating of CHCl(3) polymer solutions with different polymer concentrations. The morphology and structure of the spin-coated thin films were investigated by atomic force microscopy (AFM) and by grazing incidence wide-angle X-ray scattering (GIWAXS) techniques. AFM revealed the continuous nature of the flat, spherulitic films which are stable against dewetting even for polymer coatings as thin as 15 nm. GIWAXS patterns revealed a high crystal orientation of the films. A sharp reflection on the meridian whose spacing is related to the polymer chain unit length (c-axis) supports the presence of flat-on lamellae morphology in the whole range of film thicknesses investigated. The flat-on lamellae morphology is also supported by AFM images. A triclinic unit cell with the c*-axis perpendicular to the substrate is proposed for PPAz. The repulsion of the long aliphatic spacer by the Si-substrate is invoked as the main reason for the flat-on morphology observed.