Laser-produced X-ray sources

Enhanced Gamma-Ray Attenuation-Based Detection System Using an Artificial Neural Network

Scale deposition is the accumulation of various materials in the walls of transmission lines and unwanted parts in the oil and gas production system. It is a leading moot point in all transmission lines, tanks, and petroleum equipment. Scale deposition leads to drastic detrimental problems, reduced permeability, pressure and production losses, and direct financial losses due to the failure of some equipment. The accumulation of oil and gas leads to clogged pores and obstruction of fluid flow. Considering the passage of a two-phase flow, our study determines the thickness of the scale, and the flow regime is detected with the help of two Multilayer Perceptron (MLP) networks. First, the diagnostic system consisting of a dual-energy source, a steel pipe, and a NaI detector was implemented, using the Monte Carlo N Particle Code (MCNP). Subsequently, the received signals were processed, and properties were extracted using the wavelet transform technique. These features were considered as inputs of an Artificial Neural Network (ANN) model used to determine the type of flow regimes and predict the scale thickness. By accurately classifying the flow regimes and determining the scale inside the pipe, our proposed method provides a platform that could enhance many areas of the oil industry.

DATAD: a Python-based X-ray diffraction simulation code for arbitrary texture and arbitrary deformation

DATAD, a Python-based X-ray diffraction simulation code, has been developed for simulating one- and two-dimensional diffraction patterns of a polycrystalline specimen with an arbitrary texture under an arbitrary deformation state and an arbitrary detection geometry. Pixelated planar and cylindrical detectors can be used. The basic principles and key components of the code are presented along with the usage of DATAD. As validation and application cases, X-ray diffraction patterns of single-crystal and polycrystalline specimens with or without texture, or applied strain, on a planar or cylindrical detector are simulated.

Contemporary x-ray wavelength metrology and traceability

We report recent advances in absolute x-ray wavelength metrology in the context of producing modern standard reference data. Primary x-ray wavelength standards are produced today using diffraction spectrometers using crystal optics arranged to be operated in dispersive and non-dispersive geometries, giving natural-line-width limited profiles with high resolution and accuracy. With current developments, measurement results can be made traceable to the Système internationale definition of the meter by using diffraction crystals that have absolute lattice-spacing provenance through x-ray-optical interferometry. Recent advances in goniometry, innovation of electronic x-ray area detectors, and new in situ alignment and measurement methods now permit robust measurement and quantification of previously-elusive systematic uncertainties. This capability supports infrastructures like the NIST Standard Reference Data programs and the International Initiative on X-ray Fundamental Parameters and their contributions to science and industry. Such data projects are further served by employing complementary wavelength-and energy-dispersive spectroscopic techniques. This combination can provide, among other things, new tabulations of less-intense x-ray lines that need to be identified in x-ray fluorescence investigation of uncharacterized analytes. After delineating the traceability chain for primary x-ray wavelength standards, and NIST efforts to produce standard reference data and materials in particular, this paper posits the new opportunities for x-ray reference data tabulation that modern methods now afford.