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Xue C, Guo Z, Liu H, Chen J, Tong Y, Fan J, Jiang H, Liu Z, Zhang X, Tai R. Design and first-round commissioning result of the SASE beamline at the Shanghai Soft X-ray FEL facility. JOURNAL OF SYNCHROTRON RADIATION 2024; 31:177-185. [PMID: 37971956 PMCID: PMC10833434 DOI: 10.1107/s1600577523009438] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/01/2023] [Accepted: 10/27/2023] [Indexed: 11/19/2023]
Abstract
The Shanghai Soft X-ray Free-Electron Laser (SXFEL) is the first X-ray free-electron laser facility in China. The SASE beamline, which consists of a pink-beam branch and a mono-beam branch, is one of the two beamlines in the Phase-I construction. The pink-beam branch opened for users in 2023 after successful first-round beamline commissioning. In this paper, the design of the beamline is presented and the performance of the pink-beam branch is reported. The measured energy-resolving power of the online spectrometer is over 6000 @ 400 eV. The focusing spot size of the pink beam is less than 3 µm in both the horizontal and vertical at the endstation.
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Affiliation(s)
- Chaofan Xue
- Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, People’s Republic of China
- Shanghai Synchrotron Radiation Facility, Shanghai 201204, People’s Republic of China
| | - Zhi Guo
- Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, People’s Republic of China
- Shanghai Synchrotron Radiation Facility, Shanghai 201204, People’s Republic of China
| | - Haigang Liu
- Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, People’s Republic of China
- Shanghai Synchrotron Radiation Facility, Shanghai 201204, People’s Republic of China
| | - Jiahua Chen
- Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, People’s Republic of China
- Shanghai Synchrotron Radiation Facility, Shanghai 201204, People’s Republic of China
| | - Yajun Tong
- ShanghaiTech University, Shanghai 201210, People’s Republic of China
| | - Jiadong Fan
- ShanghaiTech University, Shanghai 201210, People’s Republic of China
| | - Huaidong Jiang
- ShanghaiTech University, Shanghai 201210, People’s Republic of China
| | - Zhi Liu
- ShanghaiTech University, Shanghai 201210, People’s Republic of China
| | - Ximing Zhang
- Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, People’s Republic of China
- Shanghai Synchrotron Radiation Facility, Shanghai 201204, People’s Republic of China
| | - Renzhong Tai
- Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, People’s Republic of China
- Shanghai Synchrotron Radiation Facility, Shanghai 201204, People’s Republic of China
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Zhang X, Guo Z, Meng X, Chen J, Ji Z, Jin Z, Zhang X, Wang Y, Tai R. Design of an online spectrometer for the diagnosis of free-electron lasers. JOURNAL OF SYNCHROTRON RADIATION 2020; 27:870-882. [PMID: 33565995 DOI: 10.1107/s1600577520006554] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/07/2020] [Accepted: 05/15/2020] [Indexed: 06/12/2023]
Abstract
A self-amplified spontaneous emission free-electron laser (FEL) is under construction at the Shanghai Soft X-ray Free-Electron Facility. Therefore, it is necessary to develop a suitable diagnostic tool capable of resolving the natural emission band of each FEL pulse. Thus, an online spectrometer with a plane mirror and plane variable-line-spacing grating at grazing incidence to monitor each single FEL pulse during the propagation of FEL radiation has been designed and is presented in this work. The method of ray tracing is used for monitoring incident radiation in order to understand spectral characteristics, and SHADOW, an X-ray optics simulation tool, and SRW, an X-ray optics wavefront tool, are applied to study the resolving power and focusing properties of the grating. The designed resolving power is ∼3 × 104 at 620 eV. Meanwhile, the effect of the actual slope error of mirrors on the ray-tracing results is also discussed. In order to provide further optimization for the choice of grating, a comparison of resolving powers between 2000 lines mm-1 and 3000 lines mm-1 gratings at different energies is analyzed in detail and radiation damage of mirrors as well as parameters such as the first-order diffraction angle β, the exit-arm length r2, and the tilt angle θ between the focal plane and the diffraction arm are studied and optimized. This work has provided comprehensive designing methods and detailed data for the design of diagnostic spectrometers in soft X-ray FELs and will be favorable to the design of other similar instruments.
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Affiliation(s)
- Ximing Zhang
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 2019 Jialuo Highway, Jiading District, Shanghai 201800, People's Republic of China
| | - Zhi Guo
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 2019 Jialuo Highway, Jiading District, Shanghai 201800, People's Republic of China
| | - Xiangyu Meng
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 2019 Jialuo Highway, Jiading District, Shanghai 201800, People's Republic of China
| | - Jiahua Chen
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 2019 Jialuo Highway, Jiading District, Shanghai 201800, People's Republic of China
| | - Zhan Ji
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 2019 Jialuo Highway, Jiading District, Shanghai 201800, People's Republic of China
| | - Zuanming Jin
- Shanghai University, 99 Shangda Road, Baoshan District, Shanghai 200444, People's Republic of China
| | - Xiangzhi Zhang
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 2019 Jialuo Highway, Jiading District, Shanghai 201800, People's Republic of China
| | - Yong Wang
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 2019 Jialuo Highway, Jiading District, Shanghai 201800, People's Republic of China
| | - Renzhong Tai
- Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 2019 Jialuo Highway, Jiading District, Shanghai 201800, People's Republic of China
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