Novel Z
eff imaging method for deep internal areas using back-scattered X-rays.
Sci Rep 2019;
9:18831. [PMID:
31827112 PMCID:
PMC6906522 DOI:
10.1038/s41598-019-54907-3]
[Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/08/2019] [Accepted: 11/19/2019] [Indexed: 11/08/2022] Open
Abstract
Elemental kinds, composition ratios, effective atomic number (Zeff), and spatial distributions are the most basic information on materials and determine the physical and chemical properties of materials. X-ray fluorescence analysis have conventionally been used for elemental mapping, however maps on deep internal areas cannot be obtained because the escape depth of fluorescence X-rays is limited to a few mm from the surface of samples. Herein, we present a novel Zeff imaging method that uses back-scattered X-rays. The intensity ratio of elastic and inelastic back-scattered X-rays depends on the atomic number (Z) of a single-element sample (Zeff for a plural-element sample), and so Zeff maps in deep areas can be obtained by spectrum analysis of the scattered high-energy incident X-rays. We demonstrated the feasibility of observing a phantom covered by an aluminum plate by using synchrotron radiation X-ray. A fine Zeff map that can be used to identify materials was obtained from only front-side observation. The novel method opens up a new way for Zeff mapping of deep areas of thick samples from front-side observation.
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