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For: Li H, Ye S, Zhao J, Jin C, Wang Y. Imaging the atomic-scale electronic states induced by a pair of hole dopants in Ca2CuO2Cl2 Mott insulator. Sci Bull (Beijing) 2021;66:1395-1400. [PMID: 36654365 DOI: 10.1016/j.scib.2021.04.018] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/23/2021] [Revised: 03/23/2021] [Accepted: 03/29/2021] [Indexed: 01/20/2023]
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