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Fleisher AJ, Ahmed Z, Herman T, Hartings MR. Dual electro-optic frequency comb photonic thermometry. OPTICS LETTERS 2023; 48:2210-2213. [PMID: 37126236 DOI: 10.1364/ol.482838] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/03/2023]
Abstract
We report a precision realization of photonic thermometry using dual-comb spectroscopy to interrogate a π-phase-shifted fiber Bragg grating. We achieve readout stability of 7.5 mK at 1 s and resolve temperature changes of similar magnitude-sufficient for most industrial applications. Our dual-comb approach enables rapid sensing of dynamic temperature, and our scalable and reconfigurable electro-optic generation scheme enables a broad sensing range without laser tuning. Reproducibility on the International Temperature Scale of 1990 is tested, and ultimately limited by the frequency reference and check-thermometer stability. Our demonstration opens the door for a universal interrogator deployable to multiple photonic devices in parallel to potentially unravel complex multi-physical quantity measurements.
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Zeng Y, Chen G, Wu C, Pan X, Lin F, Xu L, Zhao F, He Y, He G, Chen Q, Sun D, Hai Z. Thin-Film Platinum Resistance Temperature Detector with a SiCN/Yttria-Stabilized Zirconia Protective Layer by Direct Ink Writing for High-Temperature Applications. ACS APPLIED MATERIALS & INTERFACES 2023; 15:2172-2182. [PMID: 36573702 DOI: 10.1021/acsami.2c18611] [Citation(s) in RCA: 4] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/17/2023]
Abstract
In situ temperature monitoring of curved high-temperature components in extreme environments is challenging for a variety of applications in fields such as aero engines and gas turbines. Recently, extrusion-based direct ink writing (DIW) has been utilized to fabricate platinum (Pt) resistance temperature detectors (RTDs). However, the current Pt RTD prepared by DIW technology suffers from a limited temperature range and poor high-temperature stability. Here, DIW technology and yttria-stabilized zirconia (YSZ)-modified precursor ceramic film packaging have been used to build a Pt RTD with high-temperature resistance, small disturbance, and high stability. The results indicate that the protective layer formed by the liquid phase anchors the Pt particles and reduces the agglomeration and volatilization of the Pt sensitive layer at high temperature. Attributed to the SiCN/YSZ protective layer, the temperature resistance curve of the Pt RTD in the range of 50-800 °C has little deviation from the fitting curve, and the fitting correlation coefficient is above 0.9999. Interestingly, the Pt RTD also has high repeatability and stability. The high temperature resistance drift rate is only 0.05%/h after 100 h of long-term testing at 800 °C and can withstand butane flame up to ∼1300 °C without damage. Moreover, the Pt RTD can be conformally deposited on the outer ring of aerospace bearings by DIW technology and then realize on-site, nondestructive, and real-time monitoring of bearing temperature. The fabricated Pt RTD shows great potential for high-temperature applications, and the novel technology proposed provides a feasible pathway for temperature monitoring of aeroengine internal curved hot-end components.
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Affiliation(s)
- Yingjun Zeng
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Guochun Chen
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Chao Wu
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Xiaochuan Pan
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Fan Lin
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Lida Xu
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Fuxin Zhao
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Yingping He
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Gonghan He
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Qinnan Chen
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Daoheng Sun
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
| | - Zhenyin Hai
- Department of Mechanical & Electrical Engineering, Xiamen University, Xiamen361005, P. R. China
- Fujian Micro/Nano Manufacturing Engineering Technology Research Center, Xiamen University, Xiamen361102, P. R. China
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