The effects of atomic force microscopy upon nominated living cells

A new approach for repeated tip-sample relocation for AFM imaging of nano and micro sized particles and cells in liquid environment

The ability to repeatedly find exact the same nano region-of-interest (nROI) is essential for atomic force microscopy (AFM) studies of heterogeneous environmental samples. The large variety of methods makes it difficult to find the most suitable one for a specific research question. We thus conducted a literature research for nROI relocation methods and organized the found references in order to give an overview over relocation methods including the advantages, limitations and documented applications. This survey of nROI relocation methods and their key information facilitates the selection of appropriate methods with respect to a specific research question. Based on this survey, we developed a new AFM relocation approach urgently needed for the study of nano and micro sized particles and cells in air and aqueous environment. This approach uses commercially available TEM grids fully embedded in a semitransparent resin as a glue body on top of which particles and cells are fixed. Relocation of nROI within one grid is based on easily recognizable sample features in micro and nanometer scale. The stable sticking of the studied mineral particles and bacterial cells allows repeated measurements of the same nROI with differently functionalized tips in air as well as in water. Our simple, fast, and cost-effective method allows relocation with an accuracy of 10-40 nm and enables the implementation of AFM/ESEM correlative microscopy.

Verification of cell viability at progressively higher scanning forces using a hybrid atomic force and fluorescence microscope

The prudent use of the atomic force microscope as a supra-vital live cell imaging tool requires that cell viability must be determined before and after scanning. Complementary optical techniques in conjunction with the fluorescent dyes rhodamine-123 and ethidium homodimer have been used within this study to determine cell viability after increasing loads are applied in contact mode. Guideline force ranges for five commonly cultured cell lines, human squamous carcinoma (A431), fibroblast, HeLa, Potorous tridactylis (PtK2) and rat intestinal epithelial (RIE) cells are given.

Focused ion beam manipulation and ultramicroscopy of unprepared cells

The focused ion beam (FIB) technique of nanomachining combined with simultaneous scanning electron microscopy (SEM) was used for submicron manipulation and imaging of unprepared (fresh) cells to demonstrate the potentiality of the FIB/SEM technique for ultramicroscopic studies. Sectioning at the nanoscale level was successfully performed by means of ion beam-driven milling operations that reveal the ultrastructure of fresh yeast cells. The FIB/SEM has many advantages over other ultramicroscopy techniques already applied for unprepared/fresh biological samples.

Phase contrast and DIC illumination for AFM hybrids

High-resolution optical microscopy is an essential pre-requisite for life science force microscopy, particularly for applications in cell biology and medicine. Identification and validation of cells is typically established with techniques like phase contrast microscopy or differential interference contrast microscopy. The option to select or monitor individual cells online with such light microscopy techniques while performing atomic force microscopy (AFM) measurements is therefore extremely beneficial. Here, we report two conceptually different strategies to implement these light microscopy techniques in a fully functional AFM head at the ultimate resolution of the Abbe diffraction limit.