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For: Formanek P, Bugiel E. On specimen tilt for electron holography of semiconductor devices. Ultramicroscopy 2006;106:292-300. [PMID: 16330148 DOI: 10.1016/j.ultramic.2005.09.003] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/04/2005] [Revised: 08/27/2005] [Accepted: 09/22/2005] [Indexed: 10/25/2022]
Number Cited by Other Article(s)
1
Eom K, Paik H, Seo J, Campbell N, Tsymbal EY, Oh SH, Rzchowski MS, Schlom DG, Eom C. Oxide Two-Dimensional Electron Gas with High Mobility at Room-Temperature. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2022;9:e2105652. [PMID: 35187807 PMCID: PMC9036036 DOI: 10.1002/advs.202105652] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 12/26/2021] [Indexed: 06/14/2023]
2
Analysis of Local Charges at Hetero-interfaces by Electron Holography - A Comparative Study of Different Techniques. Ultramicroscopy 2021;231:113236. [PMID: 33676771 DOI: 10.1016/j.ultramic.2021.113236] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/23/2020] [Revised: 02/10/2021] [Accepted: 02/20/2021] [Indexed: 11/21/2022]
3
Blackburn AM, McLeod RA. Practical implementation of high-resolution electron ptychography and comparison with off-axis electron holography. Microscopy (Oxf) 2020;70:131-147. [PMID: 32986121 DOI: 10.1093/jmicro/dfaa055] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/16/2020] [Revised: 09/04/2020] [Accepted: 09/14/2020] [Indexed: 11/13/2022]  Open
4
McCartney MR, Dunin-Borkowski RE, Smith DJ. Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunities. Ultramicroscopy 2019;203:105-118. [PMID: 30772077 DOI: 10.1016/j.ultramic.2019.01.008] [Citation(s) in RCA: 16] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/30/2018] [Revised: 12/27/2018] [Accepted: 01/21/2019] [Indexed: 12/01/2022]
5
Krehl J, Lubk A. Prospects of linear reconstruction in atomic resolution electron holographic tomography. Ultramicroscopy 2014;150:65-70. [PMID: 25528454 DOI: 10.1016/j.ultramic.2014.11.026] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/29/2014] [Revised: 11/03/2014] [Accepted: 11/29/2014] [Indexed: 11/18/2022]
6
Lichte H, Börrnert F, Lenk A, Lubk A, Röder F, Sickmann J, Sturm S, Vogel K, Wolf D. Electron holography for fields in solids: problems and progress. Ultramicroscopy 2013;134:126-34. [PMID: 23831133 DOI: 10.1016/j.ultramic.2013.05.014] [Citation(s) in RCA: 33] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/09/2013] [Revised: 05/13/2013] [Accepted: 05/14/2013] [Indexed: 11/18/2022]
7
Precise Comparison of Two-dimensional Dopant Profiles Measured by Low-voltage Scanning Electron Microscopy and Electron Holography Techniques. Appl Microsc 2012. [DOI: 10.9729/am.2012.42.3.158] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]  Open
8
McCartney MR, Agarwal N, Chung S, Cullen DA, Han MG, He K, Li L, Wang H, Zhou L, Smith DJ. Quantitative phase imaging of nanoscale electrostatic and magnetic fields using off-axis electron holography. Ultramicroscopy 2010. [DOI: 10.1016/j.ultramic.2010.01.001] [Citation(s) in RCA: 31] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/19/2022]
9
The effect of dynamical scattering in off-axis holographic mean inner potential and inelastic mean free path measurements. Ultramicroscopy 2010. [DOI: 10.1016/j.ultramic.2009.09.009] [Citation(s) in RCA: 37] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/19/2022]
10
Dunin–Borkowski R, Kasama T, Harrison R. Electron Holography of Nanostructured Materials. NANOCHARACTERISATION 2007. [DOI: 10.1039/9781847557926-00138] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/28/2023]
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