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For: Grillo V, Carlino E. A novel method for focus assessment in atomic resolution STEM HAADF experiments. Ultramicroscopy 2006;106:603-13. [DOI: 10.1016/j.ultramic.2006.03.005] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/19/2022]
Number Cited by Other Article(s)
1
Rosi P, Clausen A, Weber D, Tavabi AH, Frabboni S, Tiemeijer P, Dunin-Borkowski RE, Rotunno E, Grillo V. Automatic Alignment of an Orbital Angular Momentum Sorter in a Transmission Electron Microscope Using a Convolutional Neural Network. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2022;29:1-9. [PMID: 36082682 DOI: 10.1017/s143192762201248x] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
2
Grillo V, Tavabi AH, Yucelen E, Lu PH, Venturi F, Larocque H, Jin L, Savenko A, Gazzadi GC, Balboni R, Frabboni S, Tiemeijer P, Dunin-Borkowski RE, Karimi E. Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopy. OPTICS EXPRESS 2017;25:21851-21860. [PMID: 29041477 DOI: 10.1364/oe.25.021851] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/15/2017] [Accepted: 08/11/2017] [Indexed: 06/07/2023]
3
Rotunno E, Lazzarini L, Longo M, Grillo V. Crystal structure assessment of Ge-Sb-Te phase change nanowires. NANOSCALE 2013;5:1557-1563. [PMID: 23322217 DOI: 10.1039/c2nr32907g] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
4
STEM_CELL: A software tool for electron microscopy. Part 2 analysis of crystalline materials. Ultramicroscopy 2013;125:112-29. [DOI: 10.1016/j.ultramic.2012.10.009] [Citation(s) in RCA: 63] [Impact Index Per Article: 5.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/27/2012] [Revised: 10/24/2012] [Accepted: 10/27/2012] [Indexed: 11/15/2022]
5
Verbeeck J, Béché A, Van den Broek W. A holographic method to measure the source size broadening in STEM. Ultramicroscopy 2012;120:35-40. [DOI: 10.1016/j.ultramic.2012.05.007] [Citation(s) in RCA: 27] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/21/2012] [Revised: 05/14/2012] [Accepted: 05/23/2012] [Indexed: 10/28/2022]
6
Carlino E. Quantitative Z-contrast atomic resolution studies of semiconductor nanostructured materials. ACTA ACUST UNITED AC 2010. [DOI: 10.1088/1742-6596/209/1/012005] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
7
Grillo V. The effect of surface strain relaxation on HAADF imaging. Ultramicroscopy 2009;109:1453-64. [DOI: 10.1016/j.ultramic.2009.07.010] [Citation(s) in RCA: 66] [Impact Index Per Article: 4.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/12/2009] [Revised: 07/14/2009] [Accepted: 07/17/2009] [Indexed: 11/30/2022]
8
Measurement of specimen thickness and composition in AlxGa1-xN/GaN using high-angle annular dark field images. Ultramicroscopy 2009;109:1171-82. [DOI: 10.1016/j.ultramic.2009.05.003] [Citation(s) in RCA: 147] [Impact Index Per Article: 9.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/28/2008] [Revised: 02/06/2009] [Accepted: 05/01/2009] [Indexed: 11/17/2022]
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