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For: Aert SV, Chang L, Bals S, Kirkland A, Tendeloo GV. Effect of amorphous layers on the interpretation of restored exit waves. Ultramicroscopy 2009;109:237-46. [DOI: 10.1016/j.ultramic.2008.10.024] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/26/2008] [Revised: 10/20/2008] [Accepted: 10/29/2008] [Indexed: 11/27/2022]
Number Cited by Other Article(s)
1
GaAs1-xBix growth on Ge: anti-phase domains, ordering, and exciton localization. Sci Rep 2020;10:2002. [PMID: 32029827 PMCID: PMC7005183 DOI: 10.1038/s41598-020-58812-y] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/18/2019] [Accepted: 01/20/2020] [Indexed: 11/17/2022]  Open
2
De Backer A, van den Bos K, Van den Broek W, Sijbers J, Van Aert S. StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images. Ultramicroscopy 2016;171:104-116. [DOI: 10.1016/j.ultramic.2016.08.018] [Citation(s) in RCA: 94] [Impact Index Per Article: 11.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/29/2016] [Revised: 08/22/2016] [Accepted: 08/29/2016] [Indexed: 10/21/2022]
3
Chen YZ, Trier F, Wijnands T, Green RJ, Gauquelin N, Egoavil R, Christensen DV, Koster G, Huijben M, Bovet N, Macke S, He F, Sutarto R, Andersen NH, Sulpizio JA, Honig M, Prawiroatmodjo GEDK, Jespersen TS, Linderoth S, Ilani S, Verbeeck J, Van Tendeloo G, Rijnders G, Sawatzky GA, Pryds N. Extreme mobility enhancement of two-dimensional electron gases at oxide interfaces by charge-transfer-induced modulation doping. NATURE MATERIALS 2015;14:801-806. [PMID: 26030303 DOI: 10.1038/nmat4303] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/05/2014] [Accepted: 04/22/2015] [Indexed: 06/04/2023]
4
De Backer A, Martinez G, Rosenauer A, Van Aert S. Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations. Ultramicroscopy 2013;134:23-33. [DOI: 10.1016/j.ultramic.2013.05.003] [Citation(s) in RCA: 59] [Impact Index Per Article: 5.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/21/2013] [Revised: 05/07/2013] [Accepted: 05/09/2013] [Indexed: 10/26/2022]
5
Wang A, Chen F, Van Aert S, Van Dyck D. Direct structure inversion from exit waves. Part II: A practical example. Ultramicroscopy 2012. [DOI: 10.1016/j.ultramic.2012.03.011] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
6
Wang A, Van Aert S, Goos P, Van Dyck D. Precision of three-dimensional atomic scale measurements from HRTEM images: What are the limits? Ultramicroscopy 2012;114:20-30. [DOI: 10.1016/j.ultramic.2011.12.002] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/12/2011] [Revised: 12/14/2011] [Accepted: 12/22/2011] [Indexed: 11/25/2022]
7
Van Aert S, Van den Broek W, Goos P, Van Dyck D. Model-based electron microscopy: From images toward precise numbers for unknown structure parameters. Micron 2012. [DOI: 10.1016/j.micron.2011.10.019] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/15/2022]
8
De Backer A, Van Aert S, Van Dyck D. High precision measurements of atom column positions using model-based exit wave reconstruction. Ultramicroscopy 2011;111:1475-82. [PMID: 21930019 DOI: 10.1016/j.ultramic.2011.07.002] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/18/2011] [Revised: 07/06/2011] [Accepted: 07/14/2011] [Indexed: 11/29/2022]
9
Linear versus non-linear structural information limit in high-resolution transmission electron microscopy. Ultramicroscopy 2010;110:1404-10. [DOI: 10.1016/j.ultramic.2010.07.001] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/17/2009] [Revised: 04/23/2010] [Accepted: 07/08/2010] [Indexed: 11/18/2022]
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