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For: Essers E, Benner G, Mandler T, Meyer S, Mittmann D, Schnell M, Höschen R. Energy resolution of an Omega-type monochromator and imaging properties of the MANDOLINE filter. Ultramicroscopy 2010. [DOI: 10.1016/j.ultramic.2010.02.009] [Citation(s) in RCA: 30] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/19/2022]
Number Cited by Other Article(s)
1
Börrnert F, Uhlemann S, Müller H, Gerheim V, Haider M. A novel ground-potential monochromator design. Ultramicroscopy 2023;253:113805. [PMID: 37459656 DOI: 10.1016/j.ultramic.2023.113805] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/08/2023] [Revised: 06/15/2023] [Accepted: 06/30/2023] [Indexed: 08/27/2023]
2
Ogawa T, Yamazawa Y, Kawai S, Mouri A, Katane J, Park IY, Takai Y, Agemura T. A Novel Monochromator with Offset Cylindrical Lenses and Its Application to a Low-Voltage Scanning Electron Microscope. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2022;28:1-13. [PMID: 35164889 DOI: 10.1017/s1431927622000150] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
3
OUP accepted manuscript. Microscopy (Oxf) 2022;71:i174-i199. [DOI: 10.1093/jmicro/dfab050] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/30/2021] [Revised: 11/20/2021] [Accepted: 01/28/2022] [Indexed: 11/14/2022]  Open
4
Naydenova K, McMullan G, Peet MJ, Lee Y, Edwards PC, Chen S, Leahy E, Scotcher S, Henderson R, Russo CJ. CryoEM at 100 keV: a demonstration and prospects. IUCRJ 2019;6:1086-1098. [PMID: 31709064 PMCID: PMC6830209 DOI: 10.1107/s2052252519012612] [Citation(s) in RCA: 68] [Impact Index Per Article: 13.6] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/01/2019] [Accepted: 09/10/2019] [Indexed: 05/23/2023]
5
Zachman MJ, Hachtel JA, Idrobo JC, Chi M. Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials. Angew Chem Int Ed Engl 2019. [DOI: 10.1002/ange.201902993] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
6
Zachman MJ, Hachtel JA, Idrobo JC, Chi M. Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials. Angew Chem Int Ed Engl 2019;59:1384-1396. [PMID: 31081976 DOI: 10.1002/anie.201902993] [Citation(s) in RCA: 10] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/10/2019] [Revised: 05/01/2019] [Indexed: 11/10/2022]
7
Mankos M, Shadman K, Hahn R, Picard YJ, Comparat D, Fedchenko O, Schönhense G, Amiaud L, Lafosse A, Barrett N. Design for a high resolution electron energy loss microscope. Ultramicroscopy 2019;207:112848. [PMID: 31606484 DOI: 10.1016/j.ultramic.2019.112848] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/15/2019] [Revised: 09/14/2019] [Accepted: 09/24/2019] [Indexed: 11/27/2022]
8
Krivanek O, Dellby N, Hachtel J, Idrobo JC, Hotz M, Plotkin-Swing B, Bacon N, Bleloch A, Corbin G, Hoffman M, Meyer C, Lovejoy T. Progress in ultrahigh energy resolution EELS. Ultramicroscopy 2019;203:60-67. [DOI: 10.1016/j.ultramic.2018.12.006] [Citation(s) in RCA: 79] [Impact Index Per Article: 15.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/01/2018] [Revised: 12/08/2018] [Accepted: 12/09/2018] [Indexed: 11/28/2022]
9
Imaging properties of hemispherical electrostatic energy analyzers for high resolution momentum microscopy. Ultramicroscopy 2019;206:112815. [PMID: 31325896 DOI: 10.1016/j.ultramic.2019.112815] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/15/2018] [Accepted: 07/07/2019] [Indexed: 11/20/2022]
10
Wu Y, Li G, Camden JP. Probing Nanoparticle Plasmons with Electron Energy Loss Spectroscopy. Chem Rev 2017;118:2994-3031. [DOI: 10.1021/acs.chemrev.7b00354] [Citation(s) in RCA: 83] [Impact Index Per Article: 11.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/22/2023]
11
Diaz-Egea C, Abargues R, Martínez-Pastor JP, Sigle W, van Aken PA, Molina SI. High spatial resolution mapping of individual and collective localized surface plasmon resonance modes of silver nanoparticle aggregates: correlation to optical measurements. NANOSCALE RESEARCH LETTERS 2015;10:1024. [PMID: 26239880 PMCID: PMC4523500 DOI: 10.1186/s11671-015-1024-y] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/18/2015] [Accepted: 07/27/2015] [Indexed: 05/31/2023]
12
Mukai M, Okunishi E, Ashino M, Omoto K, Fukuda T, Ikeda A, Somehara K, Kaneyama T, Saitoh T, Hirayama T, Ikuhara Y. Development of a monochromator for aberration-corrected scanning transmission electron microscopy. Microscopy (Oxf) 2015;64:151-8. [DOI: 10.1093/jmicro/dfv001] [Citation(s) in RCA: 21] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/02/2014] [Accepted: 01/06/2015] [Indexed: 11/12/2022]  Open
13
WALTHER T. Electron microscopy of quantum dots. J Microsc 2014;257:171-8. [PMID: 25406030 DOI: 10.1111/jmi.12196] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/02/2014] [Accepted: 10/16/2014] [Indexed: 11/30/2022]
14
Walther T, Krysa AB. Twinning in GaAs nanowires on patterned GaAs(111)B. CRYSTAL RESEARCH AND TECHNOLOGY 2014. [DOI: 10.1002/crat.201400166] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
15
Kimoto K. Practical aspects of monochromators developed for transmission electron microscopy. Microscopy (Oxf) 2014;63:337-44. [PMID: 25125333 PMCID: PMC4710459 DOI: 10.1093/jmicro/dfu027] [Citation(s) in RCA: 29] [Impact Index Per Article: 2.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
16
Egerton RF. Prospects for vibrational-mode EELS with high spatial resolution. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2014;20:658-663. [PMID: 24548332 DOI: 10.1017/s1431927613014013] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
17
Ootsuki S, Ikeno H, Umeda Y, Yonezawa Y, Moriwake H, Kuwabara A, Kido O, Ueda S, Tanaka I, Fujikawa Y, Mizoguchi T. Impact of local strain on Ti-L2,3electron energy-loss near-edge structures of BaTiO3: a first-principles multiplet study. Microscopy (Oxf) 2014;63:249-54. [PMID: 24737830 DOI: 10.1093/jmicro/dfu011] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
18
Mukai M, Kim JS, Omoto K, Sawada H, Kimura A, Ikeda A, Zhou J, Kaneyama T, Young NP, Warner JH, Nellist PD, Kirkland AI. The development of a 200 kV monochromated field emission electron source. Ultramicroscopy 2014;140:37-43. [PMID: 24657419 DOI: 10.1016/j.ultramic.2014.02.004] [Citation(s) in RCA: 41] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/21/2013] [Revised: 02/24/2014] [Accepted: 02/25/2014] [Indexed: 11/26/2022]
19
Krivanek OL, Lovejoy TC, Dellby N, Carpenter R. Monochromated STEM with a 30 meV-wide, atom-sized electron probe. Microscopy (Oxf) 2013;62:3-21. [DOI: 10.1093/jmicro/dfs089] [Citation(s) in RCA: 87] [Impact Index Per Article: 7.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
20
Pennycook S. Seeing the atoms more clearly: STEM imaging from the Crewe era to today. Ultramicroscopy 2012;123:28-37. [DOI: 10.1016/j.ultramic.2012.05.005] [Citation(s) in RCA: 41] [Impact Index Per Article: 3.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/20/2011] [Revised: 05/07/2012] [Accepted: 05/12/2012] [Indexed: 10/28/2022]
21
Ögüt B, Talebi N, Vogelgesang R, Sigle W, van Aken PA. Toroidal plasmonic eigenmodes in oligomer nanocavities for the visible. NANO LETTERS 2012;12:5239-44. [PMID: 22935079 DOI: 10.1021/nl302418n] [Citation(s) in RCA: 23] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/12/2023]
22
Kimoto K, Kurashima K, Nagai T, Ohwada M, Ishizuka K. Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus series. Ultramicroscopy 2012;121:31-7. [PMID: 22922529 DOI: 10.1016/j.ultramic.2012.06.012] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/26/2011] [Revised: 06/02/2012] [Accepted: 06/09/2012] [Indexed: 10/28/2022]
23
Prospects for electron microscopy characterisation of solar cells: opportunities and challenges. Ultramicroscopy 2012;119:82-96. [PMID: 22209471 DOI: 10.1016/j.ultramic.2011.09.010] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/24/2011] [Accepted: 09/08/2011] [Indexed: 11/22/2022]
24
Ögüt B, Vogelgesang R, Sigle W, Talebi N, Koch CT, van Aken PA. Hybridized metal slit eigenmodes as an illustration of Babinet's principle. ACS NANO 2011;5:6701-6706. [PMID: 21761856 DOI: 10.1021/nn2022414] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
25
Nicoletti O, Wubs M, Mortensen NA, Sigle W, van Aken PA, Midgley PA. Surface plasmon modes of a single silver nanorod: an electron energy loss study. OPTICS EXPRESS 2011;19:15371-9. [PMID: 21934899 DOI: 10.1364/oe.19.015371] [Citation(s) in RCA: 25] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/08/2023]
26
Benner G, Niebel H, Pavia G. Nano beam diffraction and precession in an energy filtered CS corrected transmission electron microscope. CRYSTAL RESEARCH AND TECHNOLOGY 2011. [DOI: 10.1002/crat.201000582] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
27
Leary R, Brydson R. Chromatic Aberration Correction. ADVANCES IN IMAGING AND ELECTRON PHYSICS 2011. [DOI: 10.1016/b978-0-12-385861-0.00003-8] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/23/2022]
28
Bell DC, Russo CJ, Benner G. Sub-angstrom low-voltage performance of a monochromated, aberration-corrected transmission electron microscope. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2010;16:386-392. [PMID: 20598206 PMCID: PMC3113635 DOI: 10.1017/s1431927610093670] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
29
EFTEM study of surface plasmon resonances in silver nanoholes. Ultramicroscopy 2010. [DOI: 10.1016/j.ultramic.2010.03.009] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
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