1
|
Börrnert F, Uhlemann S, Müller H, Gerheim V, Haider M. A novel ground-potential monochromator design. Ultramicroscopy 2023; 253:113805. [PMID: 37459656 DOI: 10.1016/j.ultramic.2023.113805] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/08/2023] [Revised: 06/15/2023] [Accepted: 06/30/2023] [Indexed: 08/27/2023]
Abstract
An electron monochromator design is presented as an instrumental development for electron energy loss spectroscopy (EELS) and imaging in (scanning) transmission electron microscopy ((S)TEM). The main purpose of this development is enhancing the energy resolving power in spectroscopy and filtering. In addition, it helps reducing the effect of the objective lens' chromatic aberration Cc in imaging and therefore, enhancing the spatial resolving power of electron microscopes. General estimates for the performance of a monochromator in energy distribution and the resulting usable beam currents are given. The special monochromator design presented is a ground-potential monochromator based on magnetic sector fields. The monochromator generates a spatially and angular un-dispersed spot and has no mechanically actuated parts in the filter sections. The optics can be operated at electron acceleration voltages from 30kV to 300kV and shows an energy resolving power of better than 2⋅10-7 relative to the primary electron energy. The actual device is designed to be retro-fittable to microscopes from various manufacturers.
Collapse
Affiliation(s)
| | | | - Heiko Müller
- CEOS GmbH, Englerstraße 28, 69126 Heidelberg, Germany
| | | | | |
Collapse
|
2
|
Ogawa T, Yamazawa Y, Kawai S, Mouri A, Katane J, Park IY, Takai Y, Agemura T. A Novel Monochromator with Offset Cylindrical Lenses and Its Application to a Low-Voltage Scanning Electron Microscope. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2022; 28:1-13. [PMID: 35164889 DOI: 10.1017/s1431927622000150] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
Low-voltage scanning electron microscopes (LV-SEMs) are widely used in nanoscience. However, image resolution for SEMs is restricted by chromatic aberration due to energy spread of the electron beam at low acceleration voltage. This study introduces a new monochromator (MC) with offset cylindrical lenses (CLs) as one solution for LV-SEMs. The MC optics, with highly excited CLs in offset layouts, has advantageous high performance and simple experimental setup, making it suitable for field emission LV-SEMs. In a preliminary evaluation, our MC reduced the energy spread from 770 to 67 meV. The MC was integrated into a commercial SEM equipped with an out-lens (a conventional objective lens without immersion magnetic or retarding electric fields) and an Everhart–Thornley detector. Comparing SEM images under two conditions with the MC turned on or off, the spatial resolution was improved by 58% at 0.5 and 1 keV. The filtering effect of the MC decreased the probe current with a ratio (i.e., transmittance) of 5.7%, which was consistent with estimations based on measured energy spreads. To the best of our knowledge, this is the first report on an effective MC with higher-energy resolution than 100 meV and the results offer encouraging prospects for LV-SEM technology.
Collapse
Affiliation(s)
- Takashi Ogawa
- Advanced Instrumentation Institute, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong, Daejeon34113, Republic of Korea
- Major in Nano Science, University of Science and Technology, 217 Gajeong-ro, Yuseong, Daejeon34113, Republic of Korea
| | - Yu Yamazawa
- Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki312-8504, Japan
| | - Satoshi Kawai
- Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki312-8504, Japan
| | - Atsushi Mouri
- Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki312-8504, Japan
| | - Junichi Katane
- Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki312-8504, Japan
| | - In-Yong Park
- Advanced Instrumentation Institute, Korea Research Institute of Standards and Science, 267 Gajeong-ro, Yuseong, Daejeon34113, Republic of Korea
- Major in Nano Science, University of Science and Technology, 217 Gajeong-ro, Yuseong, Daejeon34113, Republic of Korea
| | - Yoshizo Takai
- Department of Material and Life Science, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka, Japan
| | - Toshihide Agemura
- Hitachi High-Tech Corporation, 882 Ichige, Hitachinaka, Ibaraki312-8504, Japan
| |
Collapse
|
3
|
OUP accepted manuscript. Microscopy (Oxf) 2022; 71:i174-i199. [DOI: 10.1093/jmicro/dfab050] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/30/2021] [Revised: 11/20/2021] [Accepted: 01/28/2022] [Indexed: 11/14/2022] Open
|
4
|
Naydenova K, McMullan G, Peet MJ, Lee Y, Edwards PC, Chen S, Leahy E, Scotcher S, Henderson R, Russo CJ. CryoEM at 100 keV: a demonstration and prospects. IUCRJ 2019; 6:1086-1098. [PMID: 31709064 PMCID: PMC6830209 DOI: 10.1107/s2052252519012612] [Citation(s) in RCA: 68] [Impact Index Per Article: 13.6] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/01/2019] [Accepted: 09/10/2019] [Indexed: 05/23/2023]
Abstract
100 kV is investigated as the operating voltage for single-particle electron cryomicroscopy (cryoEM). Reducing the electron energy from the current standard of 300 or 200 keV offers both cost savings and potentially improved imaging. The latter follows from recent measurements of radiation damage to biological specimens by high-energy electrons, which show that at lower energies there is an increased amount of information available per unit damage. For frozen hydrated specimens around 300 Å in thickness, the predicted optimal electron energy for imaging is 100 keV. Currently available electron cryomicroscopes in the 100-120 keV range are not optimized for cryoEM as they lack both the spatially coherent illumination needed for the high defocus used in cryoEM and imaging detectors optimized for 100 keV electrons. To demonstrate the potential of imaging at 100 kV, the voltage of a standard, commercial 200 kV field-emission gun (FEG) microscope was reduced to 100 kV and a side-entry cryoholder was used. As high-efficiency, large-area cameras are not currently available for 100 keV electrons, a commercial hybrid pixel camera designed for X-ray detection was attached to the camera chamber and was used for low-dose data collection. Using this configuration, five single-particle specimens were imaged: hepatitis B virus capsid, bacterial 70S ribosome, catalase, DNA protection during starvation protein and haemoglobin, ranging in size from 4.5 MDa to 64 kDa with corresponding diameters from 320 to 72 Å. These five data sets were used to reconstruct 3D structures with resolutions between 8.4 and 3.4 Å. Based on this work, the practical advantages and current technological limitations to single-particle cryoEM at 100 keV are considered. These results are also discussed in the context of future microscope development towards the goal of rapid, simple and widely available structure determination of any purified biological specimen.
Collapse
Affiliation(s)
- K. Naydenova
- MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England
| | - G. McMullan
- MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England
| | - M. J. Peet
- MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England
| | - Y. Lee
- MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England
| | - P. C. Edwards
- MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England
| | - S. Chen
- MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England
| | - E. Leahy
- MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England
| | - S. Scotcher
- MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England
| | - R. Henderson
- MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England
| | - C. J. Russo
- MRC Laboratory of Molecular Biology, Cambridge CB2 0QH, England
| |
Collapse
|
5
|
Zachman MJ, Hachtel JA, Idrobo JC, Chi M. Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials. Angew Chem Int Ed Engl 2019. [DOI: 10.1002/ange.201902993] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
Affiliation(s)
- Michael J. Zachman
- Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| | - Jordan A. Hachtel
- Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| | - Juan Carlos Idrobo
- Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| | - Miaofang Chi
- Center for Nanophase Materials Sciences Oak Ridge National Laboratory Oak Ridge TN 37831 USA
| |
Collapse
|
6
|
Zachman MJ, Hachtel JA, Idrobo JC, Chi M. Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials. Angew Chem Int Ed Engl 2019; 59:1384-1396. [PMID: 31081976 DOI: 10.1002/anie.201902993] [Citation(s) in RCA: 10] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/10/2019] [Revised: 05/01/2019] [Indexed: 11/10/2022]
Abstract
Interfaces play a fundamental role in many areas of chemistry. However, their localized nature requires characterization techniques with high spatial resolution in order to fully understand their structure and properties. State-of-the-art atomic resolution or in situ scanning transmission electron microscopy and electron energy-loss spectroscopy are indispensable tools for characterizing the local structure and chemistry of materials with single-atom resolution, but they are not able to measure many properties that dictate function, such as vibrational modes or charge transfer, and are limited to room-temperature samples containing no liquids. Here, we outline emerging electron microscopy techniques that are allowing these limitations to be overcome and highlight several recent studies that were enabled by these techniques. We then provide a vision for how these techniques can be paired with each other and with in situ methods to deliver new insights into the static and dynamic behavior of functional interfaces.
Collapse
Affiliation(s)
- Michael J Zachman
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Jordan A Hachtel
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Juan Carlos Idrobo
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| | - Miaofang Chi
- Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA
| |
Collapse
|
7
|
Mankos M, Shadman K, Hahn R, Picard YJ, Comparat D, Fedchenko O, Schönhense G, Amiaud L, Lafosse A, Barrett N. Design for a high resolution electron energy loss microscope. Ultramicroscopy 2019; 207:112848. [PMID: 31606484 DOI: 10.1016/j.ultramic.2019.112848] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/15/2019] [Revised: 09/14/2019] [Accepted: 09/24/2019] [Indexed: 11/27/2022]
Abstract
An electron optical column has been designed for High Resolution Electron Energy Loss Microscopy (HREELM). The column is composed of electron lenses and a beam separator that are placed between an electron source based on a laser excited cesium atom beam and a time-of-flight (ToF) spectrometer or a hemispherical analyzer (HSA). The instrument will be able to perform full field low energy electron imaging of surfaces with sub-micron spatial resolution and meV energy resolution necessary for the analysis of local vibrational spectra. Thus, non-contact, real space mapping of microscopic variations in vibrational levels will be made possible. A second imaging mode will allow for the mapping of the phonon dispersion relations from microscopic regions defined by an appropriate field aperture.
Collapse
Affiliation(s)
- Marian Mankos
- Electron Optica Inc., 1000 Elwell Court Ste.110, Palo Alto, CA 94303, USA
| | - Khashayar Shadman
- Electron Optica Inc., 1000 Elwell Court Ste.110, Palo Alto, CA 94303, USA
| | - Raphaël Hahn
- Laboratoire Aimé Cotton, CNRS, Univ. Paris-Sud, ENS Paris Saclay, Université Paris-Saclay, Bât. 505, Orsay 91405, France
| | - Yan J Picard
- Laboratoire Aimé Cotton, CNRS, Univ. Paris-Sud, ENS Paris Saclay, Université Paris-Saclay, Bât. 505, Orsay 91405, France
| | - Daniel Comparat
- Laboratoire Aimé Cotton, CNRS, Univ. Paris-Sud, ENS Paris Saclay, Université Paris-Saclay, Bât. 505, Orsay 91405, France
| | - Olena Fedchenko
- Johannes Gutenberg Universität Mainz, Inst. für Physik, Mainz 55128, Germany
| | - Gerd Schönhense
- Johannes Gutenberg Universität Mainz, Inst. für Physik, Mainz 55128, Germany
| | - Lionel Amiaud
- Institut des Sciences Moléculaires d'Orsay (ISMO), CNRS, Univ Paris-Sud, Université Paris-Saclay, Orsay F-91405, France
| | - Anne Lafosse
- Institut des Sciences Moléculaires d'Orsay (ISMO), CNRS, Univ Paris-Sud, Université Paris-Saclay, Orsay F-91405, France
| | - Nick Barrett
- SPEC, CEA, CNRS, Université Paris-Saclay, CEA Saclay, Gif-sur-Yvette Cedex 91191, France.
| |
Collapse
|
8
|
Krivanek O, Dellby N, Hachtel J, Idrobo JC, Hotz M, Plotkin-Swing B, Bacon N, Bleloch A, Corbin G, Hoffman M, Meyer C, Lovejoy T. Progress in ultrahigh energy resolution EELS. Ultramicroscopy 2019; 203:60-67. [DOI: 10.1016/j.ultramic.2018.12.006] [Citation(s) in RCA: 79] [Impact Index Per Article: 15.8] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/01/2018] [Revised: 12/08/2018] [Accepted: 12/09/2018] [Indexed: 11/28/2022]
|
9
|
Imaging properties of hemispherical electrostatic energy analyzers for high resolution momentum microscopy. Ultramicroscopy 2019; 206:112815. [PMID: 31325896 DOI: 10.1016/j.ultramic.2019.112815] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/15/2018] [Accepted: 07/07/2019] [Indexed: 11/20/2022]
Abstract
Hemispherical deflection analyzers are the most widely used energy filters for state-of-the-art electron spectroscopy. Due to the high spherical symmetry, they are also well suited as imaging energy filters for electron microscopy. Here, we review the imaging properties of hemispherical deflection analyzers with emphasis on the application for cathode lens microscopy. In particular, it turns out that aberrations, in general limiting the image resolution, cancel out at the entrance and exit of the analyzer. This finding allows more compact imaging energy filters for momentum microscopy or photoelectron emission microscopy. For instance, high resolution imaging is possible, using only a single hemisphere. Conversely, a double pass hemispherical analyzer can double the energy dispersion, which means it can double the energy resolution at certain transmission, or can multiply the transmission at certain energy resolution.
Collapse
|
10
|
Wu Y, Li G, Camden JP. Probing Nanoparticle Plasmons with Electron Energy Loss Spectroscopy. Chem Rev 2017; 118:2994-3031. [DOI: 10.1021/acs.chemrev.7b00354] [Citation(s) in RCA: 83] [Impact Index Per Article: 11.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/22/2023]
Affiliation(s)
- Yueying Wu
- Department of Chemistry and Biochemistry, University of Notre Dame, Notre Dame, Indiana 46556, United States
| | - Guoliang Li
- Center for Electron Microscopy, Institute for New Energy Materials and Low-Carbon Technologies, School of Materials Science and Engineering, Tianjin University of Technology, Tianjin 300384, China
| | - Jon P. Camden
- Department of Chemistry and Biochemistry, University of Notre Dame, Notre Dame, Indiana 46556, United States
| |
Collapse
|
11
|
Diaz-Egea C, Abargues R, Martínez-Pastor JP, Sigle W, van Aken PA, Molina SI. High spatial resolution mapping of individual and collective localized surface plasmon resonance modes of silver nanoparticle aggregates: correlation to optical measurements. NANOSCALE RESEARCH LETTERS 2015; 10:1024. [PMID: 26239880 PMCID: PMC4523500 DOI: 10.1186/s11671-015-1024-y] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/18/2015] [Accepted: 07/27/2015] [Indexed: 05/31/2023]
Abstract
Non-isolated nanoparticles show a plasmonic response that is governed by the localized surface plasmon resonance (LSPR) collective modes created by the nanoparticle aggregates. The individual and collective LSPR modes of silver nanoparticle aggregated by covalent binding by means of bifunctional molecular linkers are described in this study. Individual contributions to the collective modes are investigated at nanometer scale by means of energy-filtering transmission electron microscopy and compared to ultraviolet-visible spectroscopy. It is found that the aspect ratio and the shape of the clusters are the two main contributors to the low-energy collective modes.
Collapse
Affiliation(s)
- Carlos Diaz-Egea
- />Instituto de Microscopía Electrónica y Materiales, Departamento de Ciencia de los Materiales e I. M. y Q. I., Facultad de Ciencias, Universidad de Cádiz, Campus Río San Pedro, s/n, 11510 Puerto Real, Cádiz Spain
| | - Rafael Abargues
- />UMDO (Unidad Asociada al CSIC-IMM), Instituto de Ciencia de los Materiales, Universidad de Valencia, PO Box 22085, 46071 Valencia, Spain
| | - Juan P. Martínez-Pastor
- />UMDO (Unidad Asociada al CSIC-IMM), Instituto de Ciencia de los Materiales, Universidad de Valencia, PO Box 22085, 46071 Valencia, Spain
| | - Wilfried Sigle
- />Max Planck Institute for Intelligent Systems, Stuttgart Centre for Electron Microscopy, Heisenbergstraße 3, 70569 Stuttgart, Germany
| | - Peter A. van Aken
- />Max Planck Institute for Intelligent Systems, Stuttgart Centre for Electron Microscopy, Heisenbergstraße 3, 70569 Stuttgart, Germany
| | - Sergio I. Molina
- />Instituto de Microscopía Electrónica y Materiales, Departamento de Ciencia de los Materiales e I. M. y Q. I., Facultad de Ciencias, Universidad de Cádiz, Campus Río San Pedro, s/n, 11510 Puerto Real, Cádiz Spain
| |
Collapse
|
12
|
Mukai M, Okunishi E, Ashino M, Omoto K, Fukuda T, Ikeda A, Somehara K, Kaneyama T, Saitoh T, Hirayama T, Ikuhara Y. Development of a monochromator for aberration-corrected scanning transmission electron microscopy. Microscopy (Oxf) 2015; 64:151-8. [DOI: 10.1093/jmicro/dfv001] [Citation(s) in RCA: 21] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/02/2014] [Accepted: 01/06/2015] [Indexed: 11/12/2022] Open
|
13
|
WALTHER T. Electron microscopy of quantum dots. J Microsc 2014; 257:171-8. [PMID: 25406030 DOI: 10.1111/jmi.12196] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/02/2014] [Accepted: 10/16/2014] [Indexed: 11/30/2022]
Affiliation(s)
- T. WALTHER
- Department of Electronic & Electrical Engineering; University of Sheffield; Sheffield S1 3JD U.K
| |
Collapse
|
14
|
Walther T, Krysa AB. Twinning in GaAs nanowires on patterned GaAs(111)B. CRYSTAL RESEARCH AND TECHNOLOGY 2014. [DOI: 10.1002/crat.201400166] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
Affiliation(s)
- Thomas Walther
- Kroto Centre for High-Resolution Imaging & Analysis; Department of Electronic & Electrical Engineering; University of Sheffield; Mappin Street Sheffield S1 3JD UK
- Semiconductor Materials & Devices Group; Department of Electronic & Electrical Engineering; University of Sheffield; Mappin Street Sheffield S1 3JD UK
| | - Andrey B. Krysa
- Semiconductor Materials & Devices Group; Department of Electronic & Electrical Engineering; University of Sheffield; Mappin Street Sheffield S1 3JD UK
- National Centre for III/V Technologies; Nanoscience and Technology Building; University of Sheffield; North Campus, Broad Lane Sheffield S3 7HQ UK
| |
Collapse
|
15
|
Abstract
A few practical aspects of monochromators recently developed for transmission electron microscopy are briefly reviewed. The basic structures and properties of four monochromators, a single Wien filter monochromator, a double Wien filter monochromator, an omega-shaped electrostatic monochromator and an alpha-shaped magnetic monochromator, are outlined. The advantages and side effects of these monochromators in spectroscopy and imaging are pointed out. A few properties of the monochromators in imaging, such as spatial or angular chromaticity, are also discussed.
Collapse
Affiliation(s)
- Koji Kimoto
- Electron Microscopy Group, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
| |
Collapse
|
16
|
Egerton RF. Prospects for vibrational-mode EELS with high spatial resolution. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2014; 20:658-663. [PMID: 24548332 DOI: 10.1017/s1431927613014013] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
Taking advantage of previous measurements by Geiger and co-workers, we discuss the possibilities and problems of measuring vibrational modes of energy loss in a transmission electron microscope fitted with a monochromator and a high-resolution energy-loss spectrometer. The tail of the zero-loss peak is seen to be a major limitation, rather than its full-width at half-maximum. Because of the low oscillator strengths and small cross-sections involved, radiation damage will limit the spatial resolution if this technique is applied to organic specimens. Delocalization of the inelastic scattering may also be a limitation, if a dipole description of the scattering process is valid.
Collapse
Affiliation(s)
- R F Egerton
- Physics Department,University of Alberta,Edmonton,Canada T6G 2E1
| |
Collapse
|
17
|
Ootsuki S, Ikeno H, Umeda Y, Yonezawa Y, Moriwake H, Kuwabara A, Kido O, Ueda S, Tanaka I, Fujikawa Y, Mizoguchi T. Impact of local strain on Ti-L2,3electron energy-loss near-edge structures of BaTiO3: a first-principles multiplet study. Microscopy (Oxf) 2014; 63:249-54. [PMID: 24737830 DOI: 10.1093/jmicro/dfu011] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
Affiliation(s)
- Shirou Ootsuki
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan Institute of Industrial Science, The University of Tokyo 4-6-1, Komaba, Meguro, Tokyo 153-8505, Japan
| | - Hidekazu Ikeno
- Nanoscience and Nanotechnology Research Center, Research Organization for 21st Century, Osaka Prefecture University, 1-2 Gakuen-cho, Naka-ku, Sakai, Osaka 599-8570, Japan
| | - Yuji Umeda
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan
| | - Yu Yonezawa
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan
| | - Hiroki Moriwake
- Nanostructure Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan
| | - Akihide Kuwabara
- Nanostructure Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan
| | - Osamu Kido
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan
| | - Satoko Ueda
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan
| | - Isao Tanaka
- Nanostructure Research Laboratory, Japan Fine Ceramics Center, Nagoya 456-8587, Japan Department of Materials Science and Engineering, Kyoto University, Yoshida, Sakyo, Kyoto 606-8501, Japan
| | - Yoshinori Fujikawa
- Advanced Technology Development Center, TDK Corporation, 2-15-7 Higashi-Ohwada, Ichikawa-shi, Chiba 272-8558, Japan
| | - Teruyasu Mizoguchi
- Institute of Industrial Science, The University of Tokyo 4-6-1, Komaba, Meguro, Tokyo 153-8505, Japan
| |
Collapse
|
18
|
Mukai M, Kim JS, Omoto K, Sawada H, Kimura A, Ikeda A, Zhou J, Kaneyama T, Young NP, Warner JH, Nellist PD, Kirkland AI. The development of a 200 kV monochromated field emission electron source. Ultramicroscopy 2014; 140:37-43. [PMID: 24657419 DOI: 10.1016/j.ultramic.2014.02.004] [Citation(s) in RCA: 41] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/21/2013] [Revised: 02/24/2014] [Accepted: 02/25/2014] [Indexed: 11/26/2022]
Abstract
We report the development of a monochromator for an intermediate-voltage aberration-corrected electron microscope suitable for operation in both STEM and TEM imaging modes. The monochromator consists of two Wien filters with a variable energy selecting slit located between them and is located prior to the accelerator. The second filter cancels the energy dispersion produced by the first filter and after energy selection forms a round monochromated, achromatic probe at the specimen plane. The ultimate achievable energy resolution has been measured as 36 meV at 200 kV and 26 meV at 80 kV. High-resolution Annular Dark Field STEM images recorded using a monochromated probe resolve Si-Si spacings of 135.8 pm using energy spreads of 218 meV at 200 kV and 217 meV at 80 kV respectively. In TEM mode an improvement in non-linear spatial resolution to 64 pm due to the reduction in the effects of partial temporal coherence has been demonstrated using broad beam illumination with an energy spread of 134 meV at 200 kV.
Collapse
Affiliation(s)
- Masaki Mukai
- JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan.
| | - Judy S Kim
- University of Oxford, Department of Materials, Parks Road, Oxford, OX1 3PH, UK
| | - Kazuya Omoto
- JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
| | | | - Atsushi Kimura
- JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
| | - Akihiro Ikeda
- JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
| | - Jun Zhou
- JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
| | | | - Neil P Young
- University of Oxford, Department of Materials, Parks Road, Oxford, OX1 3PH, UK
| | - Jamie H Warner
- University of Oxford, Department of Materials, Parks Road, Oxford, OX1 3PH, UK
| | - Peter D Nellist
- University of Oxford, Department of Materials, Parks Road, Oxford, OX1 3PH, UK
| | - Angus I Kirkland
- University of Oxford, Department of Materials, Parks Road, Oxford, OX1 3PH, UK
| |
Collapse
|
19
|
Krivanek OL, Lovejoy TC, Dellby N, Carpenter R. Monochromated STEM with a 30 meV-wide, atom-sized electron probe. Microscopy (Oxf) 2013; 62:3-21. [DOI: 10.1093/jmicro/dfs089] [Citation(s) in RCA: 87] [Impact Index Per Article: 7.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022] Open
|
20
|
Pennycook S. Seeing the atoms more clearly: STEM imaging from the Crewe era to today. Ultramicroscopy 2012; 123:28-37. [DOI: 10.1016/j.ultramic.2012.05.005] [Citation(s) in RCA: 41] [Impact Index Per Article: 3.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/20/2011] [Revised: 05/07/2012] [Accepted: 05/12/2012] [Indexed: 10/28/2022]
|
21
|
Ögüt B, Talebi N, Vogelgesang R, Sigle W, van Aken PA. Toroidal plasmonic eigenmodes in oligomer nanocavities for the visible. NANO LETTERS 2012; 12:5239-44. [PMID: 22935079 DOI: 10.1021/nl302418n] [Citation(s) in RCA: 23] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/12/2023]
Abstract
Plasmonics has become one of the most vibrant areas in research with technological innovations impacting fields from telecommunications to medicine. Many fascinating applications of plasmonic nanostructures employ electric dipole and higher-order multipole resonances. Also magnetic multipole resonances are recognized for their unique properties. Besides these multipolar modes that easily radiate into free space, other types of electromagnetic resonances exist, so-called toroidal eigenmodes, which have been largely overlooked historically. They are strongly bound to material structures and their peculiar spatial structure renders them practically invisible to conventional optical microscopy techniques. In this Letter, we demonstrate toroidal modes in a metal ring formed by an oligomer of holes. Combined energy-filtering transmission electron microscopy and three-dimensional finite difference time domain analysis reveal their distinct features. For the study of these modes that cannot be excited by optical far-field spectroscopy, energy-filtering transmission electron microscopy emerges as the method of choice. Toroidal moments bear great potential for novel applications, for example, in the engineering of Purcell factors of quantum-optical emitters inside toroidal cavities.
Collapse
Affiliation(s)
- Burcu Ögüt
- Max Planck Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart, Germany.
| | | | | | | | | |
Collapse
|
22
|
Kimoto K, Kurashima K, Nagai T, Ohwada M, Ishizuka K. Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus series. Ultramicroscopy 2012; 121:31-7. [PMID: 22922529 DOI: 10.1016/j.ultramic.2012.06.012] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/26/2011] [Revised: 06/02/2012] [Accepted: 06/09/2012] [Indexed: 10/28/2022]
|
23
|
Prospects for electron microscopy characterisation of solar cells: opportunities and challenges. Ultramicroscopy 2012; 119:82-96. [PMID: 22209471 DOI: 10.1016/j.ultramic.2011.09.010] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/24/2011] [Accepted: 09/08/2011] [Indexed: 11/22/2022]
Abstract
Several electron microscopy techniques available for characterising thin-film solar cells are described, including recent advances in instrumentation, such as aberration-correction, monochromators, time-resolved cathodoluminescence and focused ion-beam microscopy. Two generic problems in thin-film solar cell characterisation, namely electrical activity of grain boundaries and 3D morphology of excitionic solar cells, are also discussed from the standpoint of electron microscopy. The opportunities as well as challenges facing application of these techniques to thin-film and excitonic solar cells are highlighted.
Collapse
|
24
|
Ögüt B, Vogelgesang R, Sigle W, Talebi N, Koch CT, van Aken PA. Hybridized metal slit eigenmodes as an illustration of Babinet's principle. ACS NANO 2011; 5:6701-6706. [PMID: 21761856 DOI: 10.1021/nn2022414] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
By energy-filtering transmission electron microscopy (EFTEM), we observe Fabry-Pérot-like surface plasmon resonances (SPRs) along the length of rectangular single and double slits drilled into free-standing thin silver films. These eigenmodes hybridize in closely situated slits. The nature of their lateral coupling is uncovered from finite-element simulations, which show that the symmetry and energy sequence of hybrid modes is governed by Babinet complementarity principles. Interestingly, the modes of a double slit system, being proto-self-complementary, may alternatively be explained by magnetic interactions between slit fields or by electrostatic interactions across the metallic bridge separating the slits.
Collapse
Affiliation(s)
- Burcu Ögüt
- Max Planck Institute for Intelligent Systems, Heisenbergstrasse 3, 70569 Stuttgart, Germany.
| | | | | | | | | | | |
Collapse
|
25
|
Nicoletti O, Wubs M, Mortensen NA, Sigle W, van Aken PA, Midgley PA. Surface plasmon modes of a single silver nanorod: an electron energy loss study. OPTICS EXPRESS 2011; 19:15371-9. [PMID: 21934899 DOI: 10.1364/oe.19.015371] [Citation(s) in RCA: 25] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/08/2023]
Abstract
We present an electron energy loss study using energy filtered TEM of spatially resolved surface plasmon excitations on a silver nanorod of aspect ratio 14.2 resting on a 30 nm thick silicon nitride membrane. Our results show that the excitation is quantized as resonant modes whose intensity maxima vary along the nanorod's length and whose wavelength becomes compressed towards the ends of the nanorod. Theoretical calculations modelling the surface plasmon response of the silver nanorod-silicon nitride system show the importance of including retardation and substrate effects in order to describe accurately the energy dispersion of the resonant modes.
Collapse
Affiliation(s)
- Olivia Nicoletti
- Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, CB2 3QZ Cambridge, UK.
| | | | | | | | | | | |
Collapse
|
26
|
Benner G, Niebel H, Pavia G. Nano beam diffraction and precession in an energy filtered CS corrected transmission electron microscope. CRYSTAL RESEARCH AND TECHNOLOGY 2011. [DOI: 10.1002/crat.201000582] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
|
27
|
|
28
|
Bell DC, Russo CJ, Benner G. Sub-angstrom low-voltage performance of a monochromated, aberration-corrected transmission electron microscope. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2010; 16:386-392. [PMID: 20598206 PMCID: PMC3113635 DOI: 10.1017/s1431927610093670] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/29/2023]
Abstract
Lowering the electron energy in the transmission electron microscope allows for a significant improvement in contrast of light elements and reduces knock-on damage for most materials. If low-voltage electron microscopes are defined as those with accelerating voltages below 100 kV, the introduction of aberration correctors and monochromators to the electron microscope column enables Angstrom-level resolution, which was previously reserved for higher voltage instruments. Decreasing electron energy has three important advantages: (1) knock-on damage is lower, which is critically important for sensitive materials such as graphene and carbon nanotubes; (2) cross sections for electron-energy-loss spectroscopy increase, improving signal-to-noise for chemical analysis; (3) elastic scattering cross sections increase, improving contrast in high-resolution, zero-loss images. The results presented indicate that decreasing the acceleration voltage from 200 kV to 80 kV in a monochromated, aberration-corrected microscope enhances the contrast while retaining sub-Angstrom resolution. These improvements in low-voltage performance are expected to produce many new results and enable a wealth of new experiments in materials science.
Collapse
Affiliation(s)
- David C Bell
- School of Engineering and Applied Sciences, Harvard University, Cambridge, MA 02138, USA.
| | | | | |
Collapse
|
29
|
|