Optimization of Q-factor of AFM cantilevers using genetic algorithms

Exploring the Challenges of Characterising Surface Topography of Polymer-Nanoparticle Composites

Nanomechanical testing plays a crucial role in evaluating surfaces containing nanoparticles. Testing verifies surface performance concerning their intended function and detects any potential shortcomings in operational standards. Recognising that nanostructured surfaces are not always straightforward or uniform is essential. The chemical composition and morphology of these surfaces determine the end-point functionality. This can entail a layered surface using materials in contrast to each other that may require further modification after nanomechanical testing to pass performance and quality standards. Nanomechanical analysis of a structured surface consisting of a poly-methyl oxazoline film base functionalised with colloidal gold nanoparticles was demonstrated using an atomic force microscope (AFM). AFM nanomechanical testing investigated the overall substrate architecture's topographical, friction, adhesion, and wear parameters. Limitations towards its potential operation as a biomaterial were also addressed. This was demonstrated by using the AFM cantilever to apply various forces and break the bonds between the polymer film and gold nanoparticles. The AFM instrument offers an insight to the behaviour of low-modulus surface against a higher-modulus nanoparticle. This paper details the bonding and reaction limitations between these materials on the application of an externally applied force. The application of this interaction is highly scrutinised to highlight the potential limitations of a functionalised surface. These findings highlight the importance of conducting comprehensive nanomechanical testing to address concerns related to fabricating intricate biomaterial surfaces featuring nanostructures.

Simulation of reversible molecular mechanical logic gates and circuits

Landauer's principle places a fundamental lower limit on the work required to perform a logically irreversible operation. Logically reversible gates provide a way to avoid these work costs and also simplify the task of making the computation as a whole thermodynamically reversible. The inherent reversibility of mechanical logic gates would make them good candidates for the design of practical logically reversible computing systems if not for the relatively large size and mass of such systems. In this paper we outline the design and simulation of reversible molecular mechanical logic gates that come close to the limits of thermodynamic reversibility even under the effects of thermal noise, and outline associated circuit components from which arbitrary combinatorial reversible circuits can be constructed and simulated. We demonstrate that isolated components can be operated in a thermodynamically reversible manner, and explore the complexities of combining components to implement more complex computations. Finally, we demonstrate a method to construct arbitrarily large reversible combinatorial circuits using multiple external controls and signal boosters with a working half-adder circuit.

Stress effect on the resonance properties of single-crystal diamond cantilever resonators for microscopy applications

Micro-cantilever beams have been widely used for surface sensing applications as well as atomic force microscope. However, surface stress appears in cantilever beams due to a variety of factors such as the absorption of molecules, temperature variations, materials imperfectness, and the fabrication process. Single-crystal diamond (SCD) has been regarded as an ideal material for cantilever sensors through the surface effect due to the outstanding mechanical rigidity and chemical inertness. In this paper, the authors report on the SCD cantilever beams fabricated by a smart-cut method with high quality factors up to 14 000 and stress characterization by surface geometry curvature observation and Raman microscopy. Although both surface geometry profile and Raman shift show the existence of surface stress in the SCD cantilever beams, the resonance properties are little influenced and maintain excellent rigidity and high quality. Therefore, the SCD-on-SCD resonator provides a promising platform for high-reliability microscopy applications.

In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation

Atomic force microscopy (AFM) is a well-known tool for studying surface roughness and to collect depth information about features on the top atomic layers of samples. By combining secondary ion mass spectroscopy (SIMS) with focused ion beam (FIB) milling in a scanning electron microscope (SEM), chemical information of sputtered structures can be visualized and located with high lateral and depth resolution. In this paper, a high vacuum (HV) compatible AFM was installed in a TESCAN FIB-SEM instrument that was equipped with a time-of-flight SIMS (ToF-SIMS) detector. To calibrate the sputtering rate and measure the induced roughness caused by the ToF-SIMS analysis, subsequent AFM measurements were performed on an inorganic multilayer vertical cavity surface-emitting laser sample. Normalized sputtering rates were used to aid the accurate three-dimensional reconstruction of the sputtered volume's chemical composition. Achievable resolution, surface roughness during sputtering, and surface oxidation issues were analyzed. The integration of complementary detectors opens up the ability to determine the sample properties as well as to understand the influence of the Ga+ ion sputtering method on the sample surface during the analysis.

Effect of cantilevers' dimensions on phase contrast in multifrequency atomic force microscopy

During the past years, different theoretical and experimental works are done to enhance the observables (mostly higher eigenmode's phase contrast) in multifrequency atomic force microscopy methods. In this study, the geometry of rectangular cantilevers is studied and an optimum dimension that can provide maximum phase contrast for a given set of samples is found. The analysis is done both numerically and experimentally. A sensitivity analysis is provided to demonstrate which dimension (length, width, thickness, tip-radius, and cantilever and sample angle) of the cantilever has a higher effect on the results. The effects of geometrical dimensions are categorized into to: (a) effect on dynamics of the cantilever (b) effects on cantilever's specifications (i.e., spring constant and quality factor). Length and width of the cantilever dominates the static behavior of the cantilever. While thickness (for lower values), tip radius, and approach angle mostly affect the dynamic behavior of the cantilever. Theoretically, it is found as the length increases the phase contrast increase. This relationship is opposite for width. It was also observed that the effect of thickness for a specific range on the phase contrast depends on the 1st eigenmode amplitude setpoint. This study shows for having higher contrast, lower tip-radius is needed. The optimum angle between cantilever and sample to enhance bimodal atomic force microscopy imaging is also found. Based on the commercially available cantilevers, the optimum cantilever dimension is provided. Three different cantilevers with similar dimensions are experimentally tested and theoretical results are verified.

Dynamic modeling of trolling-mode AFM: Considering effects of cantilever torsion, nanoneedle flexibility and liquid-nanoneedle interactions

Trolling mode atomic force microscope (TR-Mode AFM) significantly reduces the hydrodynamic drag generated during operation in liquid environments. This is achieved by utilizing a long nanoneedle and keeping the cantilever out of liquid. In this research, a continuous mathematical model is developed to study TR-Mode AFM dynamics near a sample submerged in the liquid. Effects of cantilever torsion, nanoneedle flexibility, and liquid-nanoneedle interactions are considered in the model. In order to derive the equations of motion, Hamilton's principle and assumed mode method are used. System operation in dynamic mode is numerically simulated and the accuracy of the results is verified by comparison with the results of the finite element method. Displacements of different components of the system are also compared with each other and the dominant displacements are determined.