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For: Katz-Boon H, Rossouw CJ, Dwyer C, Etheridge J. Rapid Measurement of Nanoparticle Thickness Profiles. Ultramicroscopy 2013;124:61-70. [DOI: 10.1016/j.ultramic.2012.08.009] [Citation(s) in RCA: 23] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/21/2010] [Revised: 08/14/2012] [Accepted: 08/18/2012] [Indexed: 11/30/2022]
Number Cited by Other Article(s)
1
Esser BD, Etheridge J. Complementary ADF-STEM: a Flexible Approach to Quantitative 4D-STEM. Ultramicroscopy 2023;243:113627. [DOI: 10.1016/j.ultramic.2022.113627] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/03/2022] [Revised: 09/26/2022] [Accepted: 10/02/2022] [Indexed: 11/06/2022]
2
MacArthur KE, Clement A, Heggen M, Dunin-Borkowski RE. Combining quantitative ADF STEM with SiNx membrane-based MEMS devices: A simulation study with Pt nanoparticles. Ultramicroscopy 2021;231:113270. [PMID: 33888359 DOI: 10.1016/j.ultramic.2021.113270] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/08/2020] [Revised: 03/24/2021] [Accepted: 04/05/2021] [Indexed: 11/26/2022]
3
Liu P, Chen Q, Ito Y, Han J, Chu S, Wang X, Reddy KM, Song S, Hirata A, Chen M. Dealloying Kinetics of AgAu Nanoparticles by In Situ Liquid-Cell Scanning Transmission Electron Microscopy. NANO LETTERS 2020;20:1944-1951. [PMID: 32069418 DOI: 10.1021/acs.nanolett.9b05216] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
4
Pennycook SJ, Li C, Li M, Tang C, Okunishi E, Varela M, Kim YM, Jang JH. Material structure, properties, and dynamics through scanning transmission electron microscopy. J Anal Sci Technol 2018;9:11. [PMID: 31258949 PMCID: PMC6560782 DOI: 10.1186/s40543-018-0142-4] [Citation(s) in RCA: 17] [Impact Index Per Article: 2.4] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/14/2017] [Accepted: 03/14/2018] [Indexed: 12/03/2022]  Open
5
Tong W, Katz-Boon H, Walsh MJ, Weyland M, Etheridge J, Funston AM. The evolution of size, shape, and surface morphology of gold nanorods. Chem Commun (Camb) 2018;54:3022-3025. [PMID: 29511759 DOI: 10.1039/c7cc08336j] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/12/2023]
6
Jones L, Varambhia A, Sawada H, Nellist PD. An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-field. J Microsc 2018;270:176-187. [PMID: 29315554 DOI: 10.1111/jmi.12672] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/19/2017] [Revised: 11/21/2017] [Accepted: 11/28/2017] [Indexed: 12/01/2022]
7
The impact of STEM aberration correction on materials science. Ultramicroscopy 2017;180:22-33. [DOI: 10.1016/j.ultramic.2017.03.020] [Citation(s) in RCA: 45] [Impact Index Per Article: 5.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/12/2016] [Revised: 03/04/2017] [Accepted: 03/16/2017] [Indexed: 11/22/2022]
8
House SD, Chen Y, Jin R, Yang JC. High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM. Ultramicroscopy 2017;182:145-155. [PMID: 28689081 DOI: 10.1016/j.ultramic.2017.07.004] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/06/2017] [Revised: 06/30/2017] [Accepted: 07/02/2017] [Indexed: 11/15/2022]
9
Oxley MP, Lupini AR, Pennycook SJ. Ultra-high resolution electron microscopy. REPORTS ON PROGRESS IN PHYSICS. PHYSICAL SOCIETY (GREAT BRITAIN) 2017;80:026101. [PMID: 28008874 DOI: 10.1088/1361-6633/80/2/026101] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
10
Jones L. Quantitative ADF STEM: acquisition, analysis and interpretation. ACTA ACUST UNITED AC 2016. [DOI: 10.1088/1757-899x/109/1/012008] [Citation(s) in RCA: 30] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
11
Badada BH, Shi T, Jackson HE, Smith LM, Zheng C, Etheridge J, Gao Q, Tan HH, Jagadish C. Quantum Confined Stark Effect in a GaAs/AlGaAs Nanowire Quantum Well Tube Device: Probing Exciton Localization. NANO LETTERS 2015;15:7847-7852. [PMID: 26562619 DOI: 10.1021/acs.nanolett.5b04039] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
12
MacArthur K, D’Alfonso A, Ozkaya D, Allen L, Nellist P. Optimal ADF STEM imaging parameters for tilt-robust image quantification. Ultramicroscopy 2015;156:1-8. [DOI: 10.1016/j.ultramic.2015.04.010] [Citation(s) in RCA: 20] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/03/2015] [Revised: 04/15/2015] [Accepted: 04/23/2015] [Indexed: 10/23/2022]
13
He D, Li Z, Yuan J. Kinematic HAADF-STEM image simulation of small nanoparticles. Micron 2015;74:47-53. [DOI: 10.1016/j.micron.2015.04.005] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/02/2015] [Revised: 04/13/2015] [Accepted: 04/13/2015] [Indexed: 11/28/2022]
14
Katz-Boon H, Walsh M, Dwyer C, Mulvaney P, Funston AM, Etheridge J. Stability of crystal facets in gold nanorods. NANO LETTERS 2015;15:1635-41. [PMID: 25658226 DOI: 10.1021/acs.nanolett.5b00124] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/22/2023]
15
Walsh MJ, Barrow SJ, Tong W, Funston AM, Etheridge J. Symmetry breaking and silver in gold nanorod growth. ACS NANO 2015;9:715-724. [PMID: 25572634 DOI: 10.1021/nn506155r] [Citation(s) in RCA: 55] [Impact Index Per Article: 5.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
16
Low-energy electron holographic imaging of gold nanorods supported by ultraclean graphene. Ultramicroscopy 2014;145:80-4. [DOI: 10.1016/j.ultramic.2013.10.018] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/25/2013] [Revised: 09/27/2013] [Accepted: 10/09/2013] [Indexed: 11/17/2022]
17
He DS, Li ZY. A practical approach to quantify the ADF detector in STEM. ACTA ACUST UNITED AC 2014. [DOI: 10.1088/1742-6596/522/1/012017] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
18
Rossouw CJ, Dwyer C, Katz-Boon H, Etheridge J. Channelling contrast analysis of lattice images: Conditions for probe-insensitive STEM. Ultramicroscopy 2014;136:216-23. [DOI: 10.1016/j.ultramic.2013.10.005] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/04/2013] [Revised: 10/02/2013] [Accepted: 10/08/2013] [Indexed: 10/26/2022]
19
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images. Ultramicroscopy 2013;133:109-19. [DOI: 10.1016/j.ultramic.2013.07.002] [Citation(s) in RCA: 113] [Impact Index Per Article: 9.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/11/2013] [Revised: 06/18/2013] [Accepted: 07/02/2013] [Indexed: 11/18/2022]
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