Measurement of chromatic aberration in STEM and SCEM by coherent convergent beam electron diffraction

Seeing structural evolution of organic molecular nano-crystallites using 4D scanning confocal electron diffraction (4D-SCED)

Direct observation of organic molecular nanocrystals and their evolution using electron microscopy is extremely challenging, due to their radiation sensitivity and complex structure. Here, we introduce 4D-scanning confocal electron diffraction (4D-SCED), which enables direct in situ observation of bulk heterojunction (BHJ) thin films. 4D-SCED combines confocal electron optic setup with a pixelated detector to record focused spot-like diffraction patterns with high angular resolution, using an order of magnitude lower dose than previous methods. We apply it to study an active layer in organic solar cells, namely DRCN5T:PC₇₁BM BHJ thin films. Structural details of DRCN5T nano-crystallites oriented both in- and out-of-plane are imaged at ~5 nm resolution and dose budget of ~5 e⁻/Ų. We use in situ annealing to observe the growth of the donor crystals, evolution of the crystal orientation, and progressive enrichment of PC₇₁BM at interfaces. This highly dose-efficient method opens more possibilities for studying beam sensitive soft materials.

Studying organic molecular nanocrystals with electron microscopy has been challenging due to complex structures and radiation sensitivity. Here, the authors present 4D-scanning confocal electron diffraction, and demonstrate direct in situ observation of structural evolution of bulk heterojunction thin films.

Atomic-Resolution Topographic Imaging of Crystal Surfaces

The surface of metal oxides is of technological importance and is extensively used as a substrate for various electronic and chemical applications. A real surface, however, is not a perfectly well-defined and clean surface, but rather contains a diverse class of atomistic defects. Here, we show the direct determination of the 3D surface atomic structure of SrTiO₃ (001) including termination layers and atomistic defects such as vacancies, adatoms, ledges, kinks, and their complex combinations, by using depth sectioning of atomic-resolution annular dark-field scanning transmission electron microscopy (ADF STEM). To overcome the poor depth resolution in STEM, we statistically analyze the column by column depth profiles of ADF STEM images with a Bayesian framework fitting algorithm, and we achieve depth resolution at the entrance surface of ±0.9 Å for 1518 individual atomic columns. The present atomic-resolution 3D electron microscopy at the surface will provide fertile ground especially in surface science.

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction, and spectroscopy of materials down to atomic resolution. Recent advances in detector technology and computational methods have enabled many experiments that record a full image of the STEM probe for many probe positions, either in diffraction space or real space. In this paper, we review the use of these four-dimensional STEM experiments for virtual diffraction imaging, phase, orientation and strain mapping, measurements of medium-range order, thickness and tilt of samples, and phase contrast imaging methods, including differential phase contrast, ptychography, and others.

Quantum Confined Stark Effect in a GaAs/AlGaAs Nanowire Quantum Well Tube Device: Probing Exciton Localization

In this Letter, we explore the nature of exciton localization in single GaAs/AlGaAs nanowire quantum well tube (QWT) devices using photocurrent (PC) spectroscopy combined with simultaneous photoluminescence (PL) and photoluminescence excitation (PLE) measurements. Excitons confined to GaAs quantum well tubes of 8 and 4 nm widths embedded into an AlGaAs barrier are seen to ionize at high bias levels. Spectroscopic signatures of the ground and excited states confined to the QWT seen in PL, PLE, and PC data are consistent with simple numerical calculations. The demonstration of good electrical contact with the QWTs enables the study of Stark effect shifts in the sharp emission lines of excitons localized to quantum dot-like states within the QWT. Atomic resolution cross-sectional TEM measurements and an analysis of the quantum confined Stark effect of these dots provide insights into the nature of the exciton localization in these nanostructures.

Stability of crystal facets in gold nanorods

Metal nanocrystals can be grown in a variety of shapes through the modification of surface facet energies via surfactants. However, the surface facets are only a few atoms wide, making it extremely challenging to measure their geometries and energies. Here, we locate and count atoms in Au nanorods at successive time intervals using quantitative scanning transmission electron microscopy. This enables us to determine the atomic-level geometry and the relative stability of the facets and to expound their relationship to the overall three-dimensional nanocrystal shape and size. We reveal coexisting high- and low-index facets with comparable stability and dimensions and find the geometry of the nanorods is remarkably stable, despite significant atom movements. This information provides unique insights into the mechanisms that govern growth kinetics and nanocrystal morphology.

Fast imaging with inelastically scattered electrons by off-axis chromatic confocal electron microscopy

We introduce off-axis chromatic scanning confocal electron microscopy, a technique for fast mapping of inelastically scattered electrons in a scanning transmission electron microscope without a spectrometer. The off-axis confocal mode enables the inelastically scattered electrons to be chromatically dispersed both parallel and perpendicular to the optic axis. This enables electrons with different energy losses to be separated and detected in the image plane, enabling efficient energy filtering in a confocal mode with an integrating detector. We describe the experimental configuration and demonstrate the method with nanoscale core-loss chemical mapping of silver (M4,5) in an aluminium-silver alloy and atomic scale imaging of the low intensity core-loss La (M4,5@840  eV) signal in LaB6. Scan rates up to 2 orders of magnitude faster than conventional methods were used, enabling a corresponding reduction in radiation dose and increase in the field of view. If coupled with the enhanced depth and lateral resolution of the incoherent confocal configuration, this offers an approach for nanoscale three-dimensional chemical mapping.