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For: Barrett N, Winkler K, Krömker B, Conrad EH. Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(0001¯) using photoelectron emission microscopy. Ultramicroscopy 2013;130:94-100. [PMID: 23541462 DOI: 10.1016/j.ultramic.2013.02.010] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/28/2012] [Revised: 02/03/2013] [Accepted: 02/05/2013] [Indexed: 11/24/2022]

For:	Barrett N, Winkler K, Krömker B, Conrad EH. Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(0001¯) using photoelectron emission microscopy. Ultramicroscopy 2013;130:94-100. [PMID: 23541462 DOI: 10.1016/j.ultramic.2013.02.010] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/28/2012] [Revised: 02/03/2013] [Accepted: 02/05/2013] [Indexed: 11/24/2022]

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