Analytical model of an isolated single-atom electron source

Subpicosecond Ultracold Electron Source

We present the first observation of subpicosecond electron bunches from an ultracold electron source. This source is based on near-threshold, two-step, femtosecond photoionization of laser-cooled rubidium gas in a grating magneto-optical trap. Bunch lengths as short as 735±7  fs (rms) have been measured in the self-compression point of the source by means of ponderomotive scattering of the electrons by a 25 fs, 800 nm laser pulse. The observed temporal structure of the electron bunch depends on the central wavelength of the ionization laser pulse, in agreement with detailed simulations of the atomic photoionization process. This shows that the bunch length limit imposed by the atomic photoionization process has been reached.

Pulse length of ultracold electron bunches extracted from a laser cooled gas

We present measurements of the pulse length of ultracold electron bunches generated by near-threshold two-photon photoionization of a laser-cooled gas. The pulse length has been measured using a resonant 3 GHz deflecting cavity in TM110 mode. We have measured the pulse length in three ionization regimes. The first is direct two-photon photoionization using only a 480 nm femtosecond laser pulse, which results in short (∼15 ps) but hot (∼104 K) electron bunches. The second regime is just-above-threshold femtosecond photoionization employing the combination of a continuous-wave 780 nm excitation laser and a tunable 480 nm femtosecond ionization laser which results in both ultracold (∼10 K) and ultrafast (∼25 ps) electron bunches. These pulses typically contain ∼103 electrons and have a root-mean-square normalized transverse beam emittance of 1.5 ± 0.1 nm rad. The measured pulse lengths are limited by the energy spread associated with the longitudinal size of the ionization volume, as expected. The third regime is just-below-threshold ionization which produces Rydberg states which slowly ionize on microsecond time scales.