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For: Arnoldi L, Silaeva EP, Vurpillot F, Deconihout B, Cadel E, Blum I, Vella A. Role of the resistivity of insulating field emitters on the energy of field-ionised and field-evaporated atoms. Ultramicroscopy 2014;159 Pt 2:139-46. [PMID: 25484362 DOI: 10.1016/j.ultramic.2014.11.018] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/20/2014] [Revised: 11/03/2014] [Accepted: 11/23/2014] [Indexed: 11/29/2022]
Number Cited by Other Article(s)
1
Di Russo E, Blum I, Rivalta I, Houard J, Da Costa G, Vurpillot F, Blavette D, Rigutti L. Detecting Dissociation Dynamics of Phosphorus Molecular Ions by Atom Probe Tomography. J Phys Chem A 2020;124:10977-10988. [PMID: 33348984 DOI: 10.1021/acs.jpca.0c09259] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022]
2
Caplins BW, Blanchard PT, Chiaramonti AN, Diercks DR, Miaja-Avila L, Sanford NA. An algorithm for correcting systematic energy deficits in the atom probe mass spectra of insulating samples. Ultramicroscopy 2020;213:112995. [PMID: 32408251 DOI: 10.1016/j.ultramic.2020.112995] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/30/2019] [Revised: 03/02/2020] [Accepted: 04/04/2020] [Indexed: 10/24/2022]
3
Zhao L, Normand A, Houard J, Blum I, Delaroche F, Latry O, Ravelo B, Vurpillot F. Optimizing Atom Probe Analysis with Synchronous Laser Pulsing and Voltage Pulsing. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2017;23:221-226. [PMID: 28173892 DOI: 10.1017/s1431927616012666] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
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