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Wagner T, Antczak G, Györök M, Sabik A, Volokitina A, Gołek F, Zeppenfeld P. Attenuation of Photoelectron Emission by a Single Organic Layer. ACS APPLIED MATERIALS & INTERFACES 2022; 14:23983-23989. [PMID: 35537096 PMCID: PMC9136842 DOI: 10.1021/acsami.2c02996] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/17/2022] [Accepted: 04/20/2022] [Indexed: 06/14/2023]
Abstract
We report an in situ study of the thin-film growth of cobalt-phthalocyanine on Ag(100) surfaces using photoelectron emission microscopy (PEEM) and the Anderson method. Based on the Fowler-DuBridge theory, we were able to correlate the evolution of the mean electron yield acquired with PEEM for coverages up to two molecular layers of cobalt-phthalocyanine to the global work function changes measured with the Anderson method. For coverages above two monolayers, the transients measured with the Anderson method and those obtained with PEEM show different trends. We exploit this discrepancy to determine the inelastic mean free path of the low-energy electrons while passing through the third layer of CoPc.
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Affiliation(s)
- Thorsten Wagner
- Johannes
Kepler University, Institute of Experimental Physics, Surface Science
Division, Altenberger Strasse 69, 4040 Linz, Austria
| | - Grażyna Antczak
- University
of Wroclaw, Institute of Experimental Physics, Pl. M. Borna 9, 50-204 Wroclaw, Poland
| | - Michael Györök
- Johannes
Kepler University, Institute of Experimental Physics, Surface Science
Division, Altenberger Strasse 69, 4040 Linz, Austria
| | - Agata Sabik
- University
of Wroclaw, Institute of Experimental Physics, Pl. M. Borna 9, 50-204 Wroclaw, Poland
| | - Anna Volokitina
- Johannes
Kepler University, Institute of Experimental Physics, Surface Science
Division, Altenberger Strasse 69, 4040 Linz, Austria
| | - Franciszek Gołek
- University
of Wroclaw, Institute of Experimental Physics, Pl. M. Borna 9, 50-204 Wroclaw, Poland
| | - Peter Zeppenfeld
- Johannes
Kepler University, Institute of Experimental Physics, Surface Science
Division, Altenberger Strasse 69, 4040 Linz, Austria
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Wagner T, Antczak G, Ghanbari E, Navarro-Quezada A, Györök M, Volokitina A, Marschner F, Zeppenfeld P. Standard deviation of microscopy images used as indicator for growth stages. Ultramicroscopy 2022; 233:113427. [PMID: 34990906 DOI: 10.1016/j.ultramic.2021.113427] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/06/2021] [Revised: 10/18/2021] [Accepted: 11/12/2021] [Indexed: 11/29/2022]
Abstract
Photoelectron emission microscopy (PEEM) and low energy electron microscopy (LEEM) can easily distinguish between organic molecules adsorbed in crystallites or in the wetting layers as well as the bare metal substrate due to their different electronic properties. Already before (and during) the condensation of such solid phases (2D islands or 3D crystallites), there is a dilute 2D gas phase. Such a 2D gas phase consists of molecules, which are highly mobile and diffuse across the surface. The individual molecules are too small to be resolved in PEEM/LEEM images. Here, we discuss, how image features below and above the resolution limit of a PEEM/LEEM affect the mean electron yield and its (normalized) standard deviation. We support our findings with two experimental examples: the deposition of cobalt phthalocyanine (CoPc) on Ag(100) and of perfluoro-pentacene on Ag(110). Our results demonstrate, how a spatial and temporal analysis of image series can be used to obtain information about molecular phases, which cannot be directly resolved in microscopy images.
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Affiliation(s)
- Thorsten Wagner
- Johannes Kepler University, Institute of Experimental Physics, Surface Science Division, Altenberger Str. 69, 4040 Linz, Austria.
| | - Grażyna Antczak
- University of Wrocław, Institute of Experimental Physics, Pl. M. Borna 9, 50-204 Wrocław, Poland.
| | - Ebrahim Ghanbari
- Johannes Kepler University, Institute of Experimental Physics, Surface Science Division, Altenberger Str. 69, 4040 Linz, Austria
| | - Andrea Navarro-Quezada
- Johannes Kepler University, Institute of Experimental Physics, Surface Science Division, Altenberger Str. 69, 4040 Linz, Austria; Johannes Kepler University, Institute of Semiconductor and Solid State Physics, Quantum Materials Group, Altenberger Str. 69, 4040 Linz, Austria.
| | - Michael Györök
- Johannes Kepler University, Institute of Experimental Physics, Surface Science Division, Altenberger Str. 69, 4040 Linz, Austria.
| | - Anna Volokitina
- Johannes Kepler University, Institute of Experimental Physics, Surface Science Division, Altenberger Str. 69, 4040 Linz, Austria
| | - Felix Marschner
- Johannes Kepler University, Institute of Experimental Physics, Surface Science Division, Altenberger Str. 69, 4040 Linz, Austria
| | - Peter Zeppenfeld
- Johannes Kepler University, Institute of Experimental Physics, Surface Science Division, Altenberger Str. 69, 4040 Linz, Austria.
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Abd El-Khalek H, Abd- El Salam M, Amin FM. Fabrication and characterization of dual-band organic/inorganic photodetector for optoelectronic applications. CURRENT APPLIED PHYSICS 2019; 19:629-638. [DOI: 10.1016/j.cap.2019.02.017] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 09/01/2023]
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Navarro-Quezada A, Ghanbari E, Wagner T, Zeppenfeld P. Molecular Reorientation during the Initial Growth of Perfluoropentacene on Ag(110). THE JOURNAL OF PHYSICAL CHEMISTRY. C, NANOMATERIALS AND INTERFACES 2018; 122:12704-12711. [PMID: 29963216 PMCID: PMC6018566 DOI: 10.1021/acs.jpcc.8b00869] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/25/2018] [Revised: 05/28/2018] [Indexed: 05/09/2023]
Abstract
Perfluoropentacene (PFP) is an organic material that has been widely studied over the last years and has already found applications in organic electronics. However, fundamental physical questions, such as the structural formation and the preferential orientation of the molecules during deposition on metal surfaces, are still not fully understood. In this work, we report on a unique in-plane molecular reorientation during the completion of the first monolayer of PFP on the Ag(110) surface. To characterize the molecular alignment, we have monitored the deposition process in real time using polarization-dependent differential reflectance spectroscopy and reflectance anisotropy spectroscopy. Abrupt changes in the optical signals reveal an intricate sequence of reorientation transitions of the PFP molecules upon monolayer completion and during the formation of the second monolayer, eventually leading to a full alignment of the long molecular axis along the [001] direction of the substrate and an enhanced structural ordering. Scanning tunneling microscopy and low-energy electron diffraction confirm the observed molecular reorientation upon monolayer compression and provide further details on the structural and orientational ordering of the PFP monolayer before and after compression.
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Affiliation(s)
- Andrea Navarro-Quezada
- Institute of Experimental Physics and Institute of Semiconductor and
Solid State Physics, Johannes Kepler University, Altenberger Street 69, 4040 Linz, Austria
- E-mail: (A.N.-Q)
| | - Ebrahim Ghanbari
- Institute of Experimental Physics and Institute of Semiconductor and
Solid State Physics, Johannes Kepler University, Altenberger Street 69, 4040 Linz, Austria
| | - Thorsten Wagner
- Institute of Experimental Physics and Institute of Semiconductor and
Solid State Physics, Johannes Kepler University, Altenberger Street 69, 4040 Linz, Austria
- E-mail: (T.W.)
| | - Peter Zeppenfeld
- Institute of Experimental Physics and Institute of Semiconductor and
Solid State Physics, Johannes Kepler University, Altenberger Street 69, 4040 Linz, Austria
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Ghanbari E, Wagner T, Zeppenfeld P. Layer-Resolved Evolution of Organic Thin Films Monitored by Photoelectron Emission Microscopy and Optical Reflectance Spectroscopy. THE JOURNAL OF PHYSICAL CHEMISTRY. C, NANOMATERIALS AND INTERFACES 2015; 119:24174-24181. [PMID: 26523159 PMCID: PMC4620530 DOI: 10.1021/acs.jpcc.5b08083] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/19/2015] [Revised: 09/29/2015] [Indexed: 05/13/2023]
Abstract
Photoelectron emission microscopy (PEEM) and differential (optical) reflectance spectroscopy (DRS) have proven independently to be versatile analytical tools for monitoring the evolution of organic thin films during growth. In this paper, we present the first experiment in which both techniques have been applied simultaneously and synchronously. We illustrate how the combined PEEM and DRS results can be correlated to obtain an extended perspective on the electronic and optical properties of a molecular film dependent on the film thickness and morphology. As an example, we studied the deposition of the organic molecule α-sexithiophene on Ag(111) in the thickness range from submonolayers up to several monolayers.
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Affiliation(s)
- Ebrahim Ghanbari
- Institute of Experimental Physics, Johannes Kepler University , Altenberger Str. 69, 4040 Linz, Austria
| | - Thorsten Wagner
- Institute of Experimental Physics, Johannes Kepler University , Altenberger Str. 69, 4040 Linz, Austria
| | - Peter Zeppenfeld
- Institute of Experimental Physics, Johannes Kepler University , Altenberger Str. 69, 4040 Linz, Austria
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