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For: Craven AJ, Bobynko J, Sala B, MacLaren I. Accurate measurement of absolute experimental inelastic mean free paths and EELS differential cross-sections. Ultramicroscopy 2016;170:113-127. [DOI: 10.1016/j.ultramic.2016.08.012] [Citation(s) in RCA: 20] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/05/2016] [Revised: 08/12/2016] [Accepted: 08/18/2016] [Indexed: 11/15/2022]
Number Cited by Other Article(s)
1
Venkatraman K, Crozier PA. Role of Convergence and Collection Angles in the Excitation of Long- and Short-Wavelength Phonons with Vibrational Electron Energy-Loss Spectroscopy. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2021;27:1-9. [PMID: 34172104 DOI: 10.1017/s1431927621012034] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/13/2023]
2
Ellaby T, Varambhia A, Luo X, Briquet L, Sarwar M, Ozkaya D, Thompsett D, Nellist PD, Skylaris CK. Strain effects in core-shell PtCo nanoparticles: a comparison of experimental observations and computational modelling. Phys Chem Chem Phys 2020;22:24784-24795. [PMID: 33107513 DOI: 10.1039/d0cp04318d] [Citation(s) in RCA: 12] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
3
Yesibolati MN, Laganá S, Kadkhodazadeh S, Mikkelsen EK, Sun H, Kasama T, Hansen O, Zaluzec NJ, Mølhave K. Electron inelastic mean free path in water. NANOSCALE 2020;12:20649-20657. [PMID: 32614016 DOI: 10.1039/d0nr04352d] [Citation(s) in RCA: 23] [Impact Index Per Article: 5.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
4
Oh-Ishi K, Ohsuna T. Inelastic mean free path measurement by STEM-EELS technique using needle-shaped specimen. Ultramicroscopy 2020;212:112955. [PMID: 32086184 DOI: 10.1016/j.ultramic.2020.112955] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/19/2019] [Revised: 12/17/2019] [Accepted: 02/02/2020] [Indexed: 11/30/2022]
5
Performing EELS at higher energy losses at both 80 and 200 kV. ADVANCES IN IMAGING AND ELECTRON PHYSICS 2019. [DOI: 10.1016/bs.aiep.2019.02.001] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 12/24/2022]
6
Varambhia A, Jones L, London A, Ozkaya D, Nellist PD, Lozano-Perez S. Determining EDS and EELS partial cross-sections from multiple calibration standards to accurately quantify bi-metallic nanoparticles using STEM. Micron 2018;113:69-82. [DOI: 10.1016/j.micron.2018.06.015] [Citation(s) in RCA: 16] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/19/2018] [Revised: 06/22/2018] [Accepted: 06/22/2018] [Indexed: 11/15/2022]
7
MacLaren I, Annand KJ, Black C, Craven AJ. EELS at very high energy losses. Microscopy (Oxf) 2018;67:i78-i85. [PMID: 29036593 PMCID: PMC6025225 DOI: 10.1093/jmicro/dfx036] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/07/2017] [Accepted: 08/31/2017] [Indexed: 11/12/2022]  Open
8
Craven AJ, Sala B, Bobynko J, MacLaren I. Spectrum imaging of complex nanostructures using DualEELS: II. Absolute quantification using standards. Ultramicroscopy 2017;186:66-81. [PMID: 29274506 DOI: 10.1016/j.ultramic.2017.12.011] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/05/2017] [Revised: 11/29/2017] [Accepted: 12/06/2017] [Indexed: 11/29/2022]
9
Getting the most out of a post-column EELS spectrometer on a TEM/STEM by optimising the optical coupling. Ultramicroscopy 2017;180:66-80. [DOI: 10.1016/j.ultramic.2017.03.017] [Citation(s) in RCA: 15] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/16/2016] [Revised: 03/01/2017] [Accepted: 03/14/2017] [Indexed: 11/23/2022]
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