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For: Han MG, Garlow JA, Marshall MSJ, Tiano AL, Wong SS, Cheong SW, Walker FJ, Ahn CH, Zhu Y. Electron-beam-induced-current and active secondary-electron voltage-contrast with aberration-corrected electron probes. Ultramicroscopy 2017;177:14-19. [PMID: 28193560 DOI: 10.1016/j.ultramic.2017.01.016] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/25/2016] [Revised: 01/03/2017] [Accepted: 01/22/2017] [Indexed: 11/25/2022]

For:	Han MG, Garlow JA, Marshall MSJ, Tiano AL, Wong SS, Cheong SW, Walker FJ, Ahn CH, Zhu Y. Electron-beam-induced-current and active secondary-electron voltage-contrast with aberration-corrected electron probes. Ultramicroscopy 2017;177:14-19. [PMID: 28193560 DOI: 10.1016/j.ultramic.2017.01.016] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/25/2016] [Revised: 01/03/2017] [Accepted: 01/22/2017] [Indexed: 11/25/2022]

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(The first 100,000 artilces are displayed in RCA.)