High-throughput, semi-automated quantitative STEM mass measurement of supported metal nanoparticles using a conventional TEM/STEM

A simple circularity-based approach for nanoparticle size histograms beyond the spherical approximation

Conventional Transmission Electron Microscopy (TEM) is widely used for routine characterization of the size and shape of an assembly of (nano)particles. While the most basic approach only uses the projected area of each particle to infer its size (the "circular equivalent diameter" corresponding to the so-called "spherical approximation"), other shape descriptors can be determined and used for more elaborate analyses. In this article we present a generic model of particles, considered to be made of a few individual grains, and show how the equivalent size (i.e. a particle volume information) can be reliably deduced using only two basic parameters: the projected area and the perimeter of a particle. We compare this simple model to the spherical and ellipsoidal approximations and discuss its benefits. Then, partial coalescence of grains in a particle is also considered and we show how a simple analytical approximation, based on the circularity parameter of each particle, can improve the experimental determination of a particle size histogram. The analysis of experimental observations on nanoparticles assemblies obtained by mass-selected cluster deposition is presented, to illustrate the efficiency of the proposed approach for the determination of particle size just from conventional TEM images. We show how the presence of multimers offers an excellent opportunity to validate our improved and simple procedure. In addition, since the circularity plays a central role in this approach, attention is attracted on the perimeter determination in a pixelated image.

An Automated Scanning Transmission Electron Microscope Guided by Sparse Data Analytics

Artificial intelligence (AI) promises to reshape scientific inquiry and enable breakthrough discoveries in areas such as energy storage, quantum computing, and biomedicine. Scanning transmission electron microscopy (STEM), a cornerstone of the study of chemical and materials systems, stands to benefit greatly from AI-driven automation. However, present barriers to low-level instrument control, as well as generalizable and interpretable feature detection, make truly automated microscopy impractical. Here, we discuss the design of a closed-loop instrument control platform guided by emerging sparse data analytics. We hypothesize that a centralized controller, informed by machine learning combining limited a priori knowledge and task-based discrimination, could drive on-the-fly experimental decision-making. This platform may unlock practical, automated analysis of a variety of material features, enabling new high-throughput and statistical studies.

Deep learning detection of nanoparticles and multiple object tracking of their dynamic evolution during in situ ETEM studies

In situ transmission electron microscopy (TEM) studies of dynamic events produce large quantities of data especially under the form of images. In the important case of heterogeneous catalysis, environmental TEM (ETEM) under gas and temperature allows to follow a large population of supported nanoparticles (NPs) evolving under reactive conditions. Interpreting properly large image sequences gives precious information on the catalytic properties of the active phase by identifying causes for its deactivation. To perform a quantitative, objective and robust treatment, we propose an automatic procedure to track nanoparticles observed in Scanning ETEM (STEM in ETEM). Our approach involves deep learning and computer vision developments in multiple object tracking. At first, a registration step corrects the image displacements and misalignment inherent to the in situ acquisition. Then, a deep learning approach detects the nanoparticles on all frames of video sequences. Finally, an iterative tracking algorithm reconstructs their trajectories. This treatment allows to deduce quantitative and statistical features about their evolution or motion, such as a Brownian behavior and merging or crossing events. We treat the case of in situ calcination of palladium (oxide) / delta-alumina, where the present approach allows a discussion of operating processes such as Ostwald ripening or NP aggregative coalescence.

AutoDetect-mNP: An Unsupervised Machine Learning Algorithm for Automated Analysis of Transmission Electron Microscope Images of Metal Nanoparticles

The synthesis quality of artificial inorganic nanocrystals is most often assessed by transmission electron microscopy (TEM) for which high-throughput advances have dramatically increased both the quantity and information richness of metal nanoparticle (mNP) characterization. Existing automated data analysis algorithms of TEM mNP images generally adopt a supervised approach, requiring a significant effort in human preparation of labeled data that reduces objectivity, efficiency, and generalizability. We have developed an unsupervised algorithm AutoDetect-mNP for automated analysis of TEM images that objectively extracts morphological information on convex mNPs from TEM images based on their shape attributes, requiring little to no human input in the process. The performance of AutoDetect-mNP is tested on two data sets of bright field TEM images of Au nanoparticles with different shapes and further extended to palladium nanocubes and cadmium selenide quantum dots, demonstrating that the algorithm is quantitatively reliable and can thus serve as a generalizable measure of the morphology distributions of any mNP synthesis. The AutoDetect-mNP algorithm will aid in future developments of high-throughput characterization of mNPs and the future advent of time-resolved TEM studies that can investigate reaction mechanisms of mNP synthesis and reactivity.

An optical configuration for fastidious STEM detector calibration and the effect of the objective-lens pre-field

In the scanning transmission electron microscope, an accurate knowledge of detector collection angles is paramount in order to quantify signals on an absolute scale. Here we present an optical configuration designed for the accurate measurement of collection angles for both image-detectors and energy-loss spectrometers. By deflecting a parallel electron beam, carefully calibrated using a diffraction pattern from a known material, we can directly observe the projection-distortion in the post-specimen lenses of probe-corrected instruments, the 3-fold caustic when an image-corrector is fitted, and any misalignment of imaging detectors or spectrometer apertures. We also discuss for the first time, the effect that higher-order aberrations in the objective-lens pre-field has on such an angle-based detector mapping procedure.