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For: Yoon Y, Noh S, Jeong J, Park K. An accuracy improvement method for the topology measurement of an atomic force microscope using a 2D wavelet transform. Ultramicroscopy 2018;188:70-76. [PMID: 29554488 DOI: 10.1016/j.ultramic.2018.02.009] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/01/2017] [Revised: 11/14/2017] [Accepted: 02/18/2018] [Indexed: 11/29/2022]
Number Cited by Other Article(s)
1
Uesugi F. Novel image processing method inspired by wavelet transform. Micron 2023;168:103442. [PMID: 36921436 DOI: 10.1016/j.micron.2023.103442] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/29/2022] [Revised: 03/05/2023] [Accepted: 03/06/2023] [Indexed: 03/13/2023]
2
Guan S, Cai Z, Liu J, Pang R, Wu D, Ulstrup J, Tian Z. Adsorption, Stretching, and Breaking Processes in Single‐Molecule Conductance of para ‐Benzenedimethanethiol in Gold Nanogaps: A DFT‐NEGF Theoretical Study**. ChemElectroChem 2021. [DOI: 10.1002/celc.202100184] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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