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For: Scholl A, Marcus MA, Doran A, Nasiatka JR, Young AT, MacDowell AA, Streubel R, Kent N, Feng J, Wan W, Padmore HA. Hartmann characterization of the PEEM-3 aberration-corrected X-ray photoemission electron microscope. Ultramicroscopy 2018;188:77-84. [PMID: 29554489 DOI: 10.1016/j.ultramic.2018.03.010] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/06/2017] [Revised: 03/06/2018] [Accepted: 03/09/2018] [Indexed: 11/24/2022]
Number Cited by Other Article(s)
1
Tromp RM. Measuring chromatic aberration in LEEM/PEEM. Ultramicroscopy 2019;199:46-49. [PMID: 30772717 DOI: 10.1016/j.ultramic.2019.01.009] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/04/2018] [Accepted: 01/21/2019] [Indexed: 11/30/2022]
2
Streubel R, Kent N, Dhuey S, Scholl A, Kevan S, Fischer P. Spatial and Temporal Correlations of XY Macro Spins. NANO LETTERS 2018;18:7428-7434. [PMID: 30248262 DOI: 10.1021/acs.nanolett.8b01789] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
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