1
|
Meng Z, Ming W, He Y, Shen R, Chen J. Exit wave function reconstruction from two defocus images using neural network. Micron 2024; 177:103564. [PMID: 37977014 DOI: 10.1016/j.micron.2023.103564] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/26/2023] [Revised: 11/06/2023] [Accepted: 11/07/2023] [Indexed: 11/19/2023]
Abstract
Wave function reconstruction from one or two defocus images is promising for live atomic resolution imaging in transmission electron microscopy. However, a robust and accurate reconstruction method we still need more attention. Here, we present a neural-network-based wave function reconstruction method, EWR-NN, that enables accurate wave function reconstruction from only two defocus images. Results from both simulated and two different experimental defocus series show that the EWR-NN method has better performance than the widely-used iterative wave function reconstruction (IWFR) method. Influence of image number, defocus deviation, residual image shifts and noise level were considered to validate the performance of EWR-NN under practical conditions. It is seen that these factors will not influence the arrangement of atom columns in the reconstructed phase images, while they can alter the absolute values of all-atom columns and degrade the contrast of the phase images.
Collapse
Affiliation(s)
- Ziyi Meng
- College of Materials Science and Engineering, Centre for High Resolution Electron Microscopy, Hunan University, Changsha 410082, Hunan Province, China
| | - Wenquan Ming
- Pico Electron Microscopy Center, Innovation Institute for Ocean Materials Characterization Technology, Center for Advanced Studies in Precision Instruments, Hainan University, Haikou 570228, Hainan Province, China; Key Laboratory of Pico Electron Microscopy of Hainan Province, Hainan University, Haikou 570228, Hainan Province, China; School of Materials Science and Engineering, Hainan University, Haikou 570228, Hainan Province, China.
| | - Yutao He
- Pico Electron Microscopy Center, Innovation Institute for Ocean Materials Characterization Technology, Center for Advanced Studies in Precision Instruments, Hainan University, Haikou 570228, Hainan Province, China; Key Laboratory of Pico Electron Microscopy of Hainan Province, Hainan University, Haikou 570228, Hainan Province, China; School of Physics and Optoelectronic Engineering, Hainan University, Haikou 570228, Hainan Province, China.
| | - Ruohan Shen
- School of Intelligent Manufacturing, Huzhou College, Huzhou 313000, China
| | - Jianghua Chen
- College of Materials Science and Engineering, Centre for High Resolution Electron Microscopy, Hunan University, Changsha 410082, Hunan Province, China; Pico Electron Microscopy Center, Innovation Institute for Ocean Materials Characterization Technology, Center for Advanced Studies in Precision Instruments, Hainan University, Haikou 570228, Hainan Province, China; Key Laboratory of Pico Electron Microscopy of Hainan Province, Hainan University, Haikou 570228, Hainan Province, China; School of Materials Science and Engineering, Hainan University, Haikou 570228, Hainan Province, China
| |
Collapse
|
2
|
Direct estimation and correction of residual aberrations in the reconstructed exit-wavefunction of a crystalline specimen. Micron 2022; 157:103247. [DOI: 10.1016/j.micron.2022.103247] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/16/2022] [Revised: 03/08/2022] [Accepted: 03/11/2022] [Indexed: 11/18/2022]
|
3
|
Morawiec A. A remark on ab initio indexing of electron backscatter diffraction patterns. J Appl Crystallogr 2021. [DOI: 10.1107/s1600576721009304] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022] Open
Abstract
There is a growing interest in ab initio indexing of electron backscatter diffraction (EBSD) patterns. The methods of solving the problem are presented as innovative. The purpose of this note is to point out that ab initio EBSD indexing belongs to the field of indexing single-crystal diffraction data, and it is solved on the same principles as indexing of patterns of other types. It is shown that reasonably accurate EBSD-based data can be indexed by programs designed for X-ray data.
Collapse
|