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For: Zhong C, Lin L, Qi R, Cheng Y, Gao X, Huang R. Plan-view sample preparation of a buried nanodots array by FIB with accurate EDS positioning in thickness direction. Ultramicroscopy 2019;207:112840. [PMID: 31505397 DOI: 10.1016/j.ultramic.2019.112840] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/14/2019] [Revised: 07/23/2019] [Accepted: 09/02/2019] [Indexed: 11/18/2022]
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Rajput NS, Sloyan K, Anjum DH, Chiesa M, Ghaferi AA. A User-Friendly FIB lift-out Technique to Prepare plan-view TEM Sample of Thin Layered Materials. Ultramicroscopy 2022;235:113496. [DOI: 10.1016/j.ultramic.2022.113496] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/16/2021] [Revised: 01/12/2022] [Accepted: 02/15/2022] [Indexed: 10/19/2022]
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