A High Accuracy Ion Conductance Imaging Method Based on the Approach Curve Spectrum

Mechanical properties of soft hydrogels: assessment by scanning ion-conductance microscopy and atomic force microscopy

The growing interest in biomimetic hydrogels is due to their successful applications in tissue engineering, 3D cell culturing and drug delivery. The major characteristics of hydrogels include swelling, porosity, degradation rate, biocompatibility, and mechanical properties. Poor mechanical properties can be regarded as the main limitation for the use of hydrogels in tissue engineering, and advanced techniques for its precise evaluation are of interest. The current research aims to demonstrate the suitability of scanning ion conductance microscopy (SICM) for assessing the stiffness of various hydrogels - Fmoc-FF peptide hydrogel, polyacrylamide and gelatin, - which differ by two orders of magnitude in Young's modulus (E). We provide a direct comparison between SICM measurements and atomic force microscopy (AFM) data, the latter being a widely used method for assessing the mechanical properties of scaffolds. The results of these methods showed good agreement, however, for materials with various stiffness two SICM-based approaches - application of hydrostatic pressure and application of intrinsic force - should be used. For hydrogels with Young's modulus of more than 2.5 kPa the application of SICM using hydrostatic pressure is recommended, whereas for soft materials with E ∼ 200-400 Pa the technique using intrinsic force can also be applied. We have shown that SICM and AFM methods can be used for the evaluation of the mechanical properties of soft hydrogels with nanometer resolution, while SICM is a completely non-invasive method, which requires a minimum influence on the sample structure.

Scanning Ion Conductance Microscopy

Scanning ion conductance microscopy (SICM) has emerged as a versatile tool for studies of interfaces in biology and materials science with notable utility in biophysical and electrochemical measurements. The heart of the SICM is a nanometer-scale electrolyte filled glass pipette that serves as a scanning probe. In the initial conception, manipulations of ion currents through the tip of the pipette and appropriate positioning hardware provided a route to recording micro- and nanoscopic mapping of the topography of surfaces. Subsequent advances in instrumentation, probe design, and methods significantly increased opportunities for SICM beyond recording topography. Hybridization of SICM with coincident characterization techniques such as optical microscopy and faradaic electrodes have brought SICM to the forefront as a tool for nanoscale chemical measurement for a wide range of applications. Modern approaches to SICM realize an important tool in analytical, bioanalytical, biophysical, and materials measurements, where significant opportunities remain for further exploration. In this review, we chronicle the development of SICM from the perspective of both the development of instrumentation and methods and the breadth of measurements performed.

Research on the Adaptive Sensitivity Scanning Method for Ion Conductance Microscopy with High Efficiency and Reliability

Scanning ion conductance microscopy (SICM) is a type of in situ measurement technology for noncontact detection of samples in electrolytes with nanoscale resolution and has been used increasingly in biomedical and electrochemical fields in recent years. However, there is an inherent contradiction in the technique that makes SICM's sensitivity and accuracy difficult to balance. Higher sensitivity allows for faster probe speeds and higher scanning reliability but leads to lower accuracy, and vice versa. To resolve this problem, an adaptive sensitivity scanning method is proposed here that is designed to increase SICM's imaging efficiency without reducing its scanning reliability and accuracy. In the proposed scanning method, the sensitivity is automatically switched via the bias voltage based on the probe-sample distance. When the probe is located far away from the sample, the probe then predetects the sample position rapidly with high sensitivity. When the sample has been sensed in the high-sensitivity phase, the probe then detects the sample with low sensitivity. The basic theory and the feasibility of the alterable sensitivity detection strategy is also studied using the finite element method (FEM) and by performing experiments in this work. Finally, through testing of the standard silicon and polydimethylsiloxane (PDMS) samples, the proposed method is shown to increase SICM imaging efficiency significantly by up to 5 times relative to the conventional hopping mode without sacrificing the scanning accuracy and reliability.