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For: Zhang Y, Kong C, Scardera G, Abbott M, Payne DNR, Hoex B. Large volume tomography using plasma FIB-SEM: A comprehensive case study on black silicon. Ultramicroscopy 2022;233:113458. [PMID: 34929560 DOI: 10.1016/j.ultramic.2021.113458] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/24/2021] [Revised: 11/14/2021] [Accepted: 12/11/2021] [Indexed: 10/19/2022]

For:	Zhang Y, Kong C, Scardera G, Abbott M, Payne DNR, Hoex B. Large volume tomography using plasma FIB-SEM: A comprehensive case study on black silicon. Ultramicroscopy 2022;233:113458. [PMID: 34929560 DOI: 10.1016/j.ultramic.2021.113458] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/24/2021] [Revised: 11/14/2021] [Accepted: 12/11/2021] [Indexed: 10/19/2022]

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