1
|
Huang HH, Miyata T, Sato YK, Mizoguchi T, Jinnai H, Yoshida K. Microscopic chemical characterization of epoxy resin with scanning transmission electron microscopy - electron energy-loss spectroscopy. Micron 2024; 180:103623. [PMID: 38461563 DOI: 10.1016/j.micron.2024.103623] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/25/2023] [Revised: 02/25/2024] [Accepted: 03/03/2024] [Indexed: 03/12/2024]
Abstract
The structural characterization of epoxy resins is essential to improve the understanding on their structure-property relationship for promising high-performance applications. Among all analytical techniques, scanning transmission electron microscopy-electron energy-loss spectroscopy (STEM-EELS) is a powerful tool for probing the chemical and structural information of various materials at a high spatial resolution. However, for sensitive materials, such as epoxy resins, the structural damage induced by electron-beam irradiation limits the spatial resolution in the STEM-EELS analysis. In this study, we demonstrated the extraction of the intrinsic features and structural characteristics of epoxy resins by STEM-EELS under electron doses below 1 e-/Å2 at room temperature. The reliability of the STEM-EELS analysis was confirmed by X-ray absorption spectroscopy and spectrum simulation as low- or non-damaged reference data. The investigation of the dependence of the epoxy resin on the electron dose and exposure time revealed the structural degradation associated with electron-beam irradiation, exploring the prospect of EELS for examining epoxy resin at low doses. Furthermore, the degradation mechanisms in the epoxy resin owing to electron-beam irradiation were revealed. These findings can promote the structural characterization of epoxy-resin-based composites and other soft materials.
Collapse
Affiliation(s)
- Hsin-Hui Huang
- Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya 456-8587, Japan.
| | - Tomohiro Miyata
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
| | - Yohei K Sato
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
| | - Teruyasu Mizoguchi
- Institute of Industrials Science, The University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8505, Japan
| | - Hiroshi Jinnai
- Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
| | - Kaname Yoshida
- Japan Fine Ceramics Center, 2-4-1 Mutsuno, Atsuta-ku, Nagoya 456-8587, Japan.
| |
Collapse
|
2
|
Kikkawa J, Nii A, Sakaniwa Y, Kon N, Sakamaki M, Ohashi T, Nita N, Harano K, Kimoto K. Fast electron damage mechanism of epoxy resin studied by electron energy loss spectroscopy and electron diffraction. J Chem Phys 2023; 159:174708. [PMID: 37933784 DOI: 10.1063/5.0177019] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/19/2023] [Accepted: 10/12/2023] [Indexed: 11/08/2023] Open
Abstract
The damage mechanism and exposure tolerance of epoxy resins to fast electrons remain unclear. We quantitatively investigated the effects of electron irradiation on a common epoxy resin by dose-dependent electron energy loss spectroscopy. The results show that sp3 states of nitrogen, oxygen, and their adjacent carbon atoms were converted to sp2 states, forming imine (C=N) and carbonyl (C=O) as the total electron dose increased. The sp3 to sp2 conversion mechanism was proposed. The epoxy resin was very sensitive to fast electrons and the original electronic states were maintained up to a total dose of ∼103e- nm-2 at a low temperature of 103 K. Dose-dependent electron diffraction revealed that the intra- and intermolecular geometries changed below and around the total dose of ∼103e- nm-2.
Collapse
Affiliation(s)
- Jun Kikkawa
- Center for Basic Research on Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Aoi Nii
- Innovation Center, Mitsubishi Materials Corporation, 1002-14 Mukohyama, Naka 311-0102, Japan
| | - Yoshiaki Sakaniwa
- Innovation Center, Mitsubishi Materials Corporation, 1-600 Kitabukuro, Omiya, Saitama 330-8508, Japan
| | - Naochika Kon
- Innovation Center, Mitsubishi Materials Corporation, 1002-14 Mukohyama, Naka 311-0102, Japan
| | - Marina Sakamaki
- Innovation Center, Mitsubishi Materials Corporation, 1-600 Kitabukuro, Omiya, Saitama 330-8508, Japan
| | - Touyou Ohashi
- Innovation Center, Mitsubishi Materials Corporation, 1-600 Kitabukuro, Omiya, Saitama 330-8508, Japan
| | - Nobuyasu Nita
- Innovation Center, Mitsubishi Materials Corporation, 1002-14 Mukohyama, Naka 311-0102, Japan
| | - Koji Harano
- Center for Basic Research on Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| | - Koji Kimoto
- Center for Basic Research on Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan
| |
Collapse
|
3
|
Williams REA. Observing Carbon-(k) Near Edge Structure for Various Polymers at High Spatial Resolution with Modern Scanning Transmission Electron Microscopy and Electron Energy Loss Spectroscopy Instrumentation. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2023; 29:412. [PMID: 37613137 DOI: 10.1093/micmic/ozad067.194] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/25/2023]
Affiliation(s)
- Robert E A Williams
- Center for Electron Microscopy and Analysis (CEMAS), Columbus, OH, United States
| |
Collapse
|