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For: Feldman LC, Mayer JW, Adams F. Fundamentals of surface and thin film analysis. Anal Chim Acta 1989. [DOI: 10.1016/s0003-2670(00)81920-0] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
Number Cited by Other Article(s)
1
Panda BK, Beling CD, Fung S. Temperature dependence of the positronium work function in aluminum. PHYSICAL REVIEW. B, CONDENSED MATTER 1994;50:5695-5698. [PMID: 9976916 DOI: 10.1103/physrevb.50.5695] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
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